Optimum eddy current excitation frequency for subsurface defect detection in SQUID based non-destructive evaluation
Detailed experimental studies have been carried out for the determination of optimum eddy current excitation frequencies for the defects located at different depths below the top surface of an aluminum plate. These subsurface defects were detected by using a highly sensitive superconducting quantum...
Gespeichert in:
| Veröffentlicht in: | NDT & E international : independent nondestructive testing and evaluation 2010-11, Vol.43 (8), p.713-717 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 717 |
|---|---|
| container_issue | 8 |
| container_start_page | 713 |
| container_title | NDT & E international : independent nondestructive testing and evaluation |
| container_volume | 43 |
| creator | Nagendran, R. Thirumurugan, N. Chinnasamy, N. Janawadkar, M.P. Baskaran, R. Vaidhyanathan, L.S. Sundar, C.S. |
| description | Detailed experimental studies have been carried out for the determination of optimum eddy current excitation frequencies for the defects located at different depths below the top surface of an aluminum plate. These subsurface defects were detected by using a highly sensitive superconducting quantum interference device (SQUID) based eddy current non-destructive evaluation (NDE) system. The signal to noise ratio was found to be significantly higher at the optimum excitation frequency, which depended on the depth of the defect. The optimum excitation frequencies have been evaluated for defects located at different depths from 2 to 14
mm below the top surface of the plate. The defect depth was varied in steps of 2
mm, while the overall total thickness of the stack of plates was kept constant at 15
mm. Each defect represented a localized loss of conductor volume, which was 60
mm in length, 0.75
mm in width and 1
mm in height. The experimental results show that the square root of the optimum excitation frequency is inversely proportional to the depth of defect. |
| doi_str_mv | 10.1016/j.ndteint.2010.08.003 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1692300798</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0963869510001040</els_id><sourcerecordid>1692300798</sourcerecordid><originalsourceid>FETCH-LOGICAL-c438t-c15b595c61d99371eba809522b358a6c7976db25815daedd374b3183e2a465303</originalsourceid><addsrcrecordid>eNqFkEtrGzEURkVpoW6anxDQJtDNuHqMXqtS8mogEEqbtdBId0BmrHEljYn_feXYdNvVB9K5r4PQFSVrSqj8ulmnUCGmumakvRG9JoS_QyuqlekoVf17tCJG8k5LIz6iT6VsCCGs52qFyvOuxu2yxRDCAfslZ0gVw6uP1dU4Jzxm-LNA8gc8zhmXZShLHp0HHGAEX1vUFkcyJvzr58vjLR5cgYDTnLoApealfe8Bw95Ny1vPz-jD6KYCl-e8QC_3d79vfnRPzw-PN9-fOt9zXTtPxSCM8JIGY7iiMDhNjGBs4EI76ZVRMgxMaCqCa-tz1Q-cag7M9VJwwi_Ql1PfXZ7bDaXabSwepsklmJdiqTSME6KMbqg4oT7PpWQY7S7HrcsHS4k9SrYbe5Zsj5It0bZJbnXX5xGueDeN2SUfy79ixjmXTInGfTtx0O7dR8i2-NisQoi56bNhjv-Z9Bc8GJbg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1692300798</pqid></control><display><type>article</type><title>Optimum eddy current excitation frequency for subsurface defect detection in SQUID based non-destructive evaluation</title><source>Elsevier ScienceDirect Journals</source><creator>Nagendran, R. ; Thirumurugan, N. ; Chinnasamy, N. ; Janawadkar, M.P. ; Baskaran, R. ; Vaidhyanathan, L.S. ; Sundar, C.S.</creator><creatorcontrib>Nagendran, R. ; Thirumurugan, N. ; Chinnasamy, N. ; Janawadkar, M.P. ; Baskaran, R. ; Vaidhyanathan, L.S. ; Sundar, C.S.</creatorcontrib><description>Detailed experimental studies have been carried out for the determination of optimum eddy current excitation frequencies for the defects located at different depths below the top surface of an aluminum plate. These subsurface defects were detected by using a highly sensitive superconducting quantum interference device (SQUID) based eddy current non-destructive evaluation (NDE) system. The signal to noise ratio was found to be significantly higher at the optimum excitation frequency, which depended on the depth of the defect. The optimum excitation frequencies have been evaluated for defects located at different depths from 2 to 14
mm below the top surface of the plate. The defect depth was varied in steps of 2
mm, while the overall total thickness of the stack of plates was kept constant at 15
mm. Each defect represented a localized loss of conductor volume, which was 60
mm in length, 0.75
mm in width and 1
mm in height. The experimental results show that the square root of the optimum excitation frequency is inversely proportional to the depth of defect.</description><identifier>ISSN: 0963-8695</identifier><identifier>EISSN: 1879-1174</identifier><identifier>DOI: 10.1016/j.ndteint.2010.08.003</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Aluminum ; Analysing. Testing. Standards ; Applied sciences ; Cross-disciplinary physics: materials science; rheology ; Defects ; Eddy current testing ; Eddy currents ; Exact sciences and technology ; Excitation ; Materials science ; Materials testing ; Metals. Metallurgy ; Nondestructive testing ; Optimization ; Optimun excitation frequency ; Physics ; SQUID ; SQUIDs ; Superconducting quantum interference devices ; Testing for defects</subject><ispartof>NDT & E international : independent nondestructive testing and evaluation, 2010-11, Vol.43 (8), p.713-717</ispartof><rights>2010 Elsevier Ltd</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c438t-c15b595c61d99371eba809522b358a6c7976db25815daedd374b3183e2a465303</citedby><cites>FETCH-LOGICAL-c438t-c15b595c61d99371eba809522b358a6c7976db25815daedd374b3183e2a465303</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0963869510001040$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23336275$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Nagendran, R.</creatorcontrib><creatorcontrib>Thirumurugan, N.</creatorcontrib><creatorcontrib>Chinnasamy, N.</creatorcontrib><creatorcontrib>Janawadkar, M.P.</creatorcontrib><creatorcontrib>Baskaran, R.</creatorcontrib><creatorcontrib>Vaidhyanathan, L.S.</creatorcontrib><creatorcontrib>Sundar, C.S.</creatorcontrib><title>Optimum eddy current excitation frequency for subsurface defect detection in SQUID based non-destructive evaluation</title><title>NDT & E international : independent nondestructive testing and evaluation</title><description>Detailed experimental studies have been carried out for the determination of optimum eddy current excitation frequencies for the defects located at different depths below the top surface of an aluminum plate. These subsurface defects were detected by using a highly sensitive superconducting quantum interference device (SQUID) based eddy current non-destructive evaluation (NDE) system. The signal to noise ratio was found to be significantly higher at the optimum excitation frequency, which depended on the depth of the defect. The optimum excitation frequencies have been evaluated for defects located at different depths from 2 to 14
mm below the top surface of the plate. The defect depth was varied in steps of 2
mm, while the overall total thickness of the stack of plates was kept constant at 15
mm. Each defect represented a localized loss of conductor volume, which was 60
mm in length, 0.75
mm in width and 1
mm in height. The experimental results show that the square root of the optimum excitation frequency is inversely proportional to the depth of defect.</description><subject>Aluminum</subject><subject>Analysing. Testing. Standards</subject><subject>Applied sciences</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Defects</subject><subject>Eddy current testing</subject><subject>Eddy currents</subject><subject>Exact sciences and technology</subject><subject>Excitation</subject><subject>Materials science</subject><subject>Materials testing</subject><subject>Metals. Metallurgy</subject><subject>Nondestructive testing</subject><subject>Optimization</subject><subject>Optimun excitation frequency</subject><subject>Physics</subject><subject>SQUID</subject><subject>SQUIDs</subject><subject>Superconducting quantum interference devices</subject><subject>Testing for defects</subject><issn>0963-8695</issn><issn>1879-1174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFkEtrGzEURkVpoW6anxDQJtDNuHqMXqtS8mogEEqbtdBId0BmrHEljYn_feXYdNvVB9K5r4PQFSVrSqj8ulmnUCGmumakvRG9JoS_QyuqlekoVf17tCJG8k5LIz6iT6VsCCGs52qFyvOuxu2yxRDCAfslZ0gVw6uP1dU4Jzxm-LNA8gc8zhmXZShLHp0HHGAEX1vUFkcyJvzr58vjLR5cgYDTnLoApealfe8Bw95Ny1vPz-jD6KYCl-e8QC_3d79vfnRPzw-PN9-fOt9zXTtPxSCM8JIGY7iiMDhNjGBs4EI76ZVRMgxMaCqCa-tz1Q-cag7M9VJwwi_Ql1PfXZ7bDaXabSwepsklmJdiqTSME6KMbqg4oT7PpWQY7S7HrcsHS4k9SrYbe5Zsj5It0bZJbnXX5xGueDeN2SUfy79ixjmXTInGfTtx0O7dR8i2-NisQoi56bNhjv-Z9Bc8GJbg</recordid><startdate>20101101</startdate><enddate>20101101</enddate><creator>Nagendran, R.</creator><creator>Thirumurugan, N.</creator><creator>Chinnasamy, N.</creator><creator>Janawadkar, M.P.</creator><creator>Baskaran, R.</creator><creator>Vaidhyanathan, L.S.</creator><creator>Sundar, C.S.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope></search><sort><creationdate>20101101</creationdate><title>Optimum eddy current excitation frequency for subsurface defect detection in SQUID based non-destructive evaluation</title><author>Nagendran, R. ; Thirumurugan, N. ; Chinnasamy, N. ; Janawadkar, M.P. ; Baskaran, R. ; Vaidhyanathan, L.S. ; Sundar, C.S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c438t-c15b595c61d99371eba809522b358a6c7976db25815daedd374b3183e2a465303</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Aluminum</topic><topic>Analysing. Testing. Standards</topic><topic>Applied sciences</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Defects</topic><topic>Eddy current testing</topic><topic>Eddy currents</topic><topic>Exact sciences and technology</topic><topic>Excitation</topic><topic>Materials science</topic><topic>Materials testing</topic><topic>Metals. Metallurgy</topic><topic>Nondestructive testing</topic><topic>Optimization</topic><topic>Optimun excitation frequency</topic><topic>Physics</topic><topic>SQUID</topic><topic>SQUIDs</topic><topic>Superconducting quantum interference devices</topic><topic>Testing for defects</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nagendran, R.</creatorcontrib><creatorcontrib>Thirumurugan, N.</creatorcontrib><creatorcontrib>Chinnasamy, N.</creatorcontrib><creatorcontrib>Janawadkar, M.P.</creatorcontrib><creatorcontrib>Baskaran, R.</creatorcontrib><creatorcontrib>Vaidhyanathan, L.S.</creatorcontrib><creatorcontrib>Sundar, C.S.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><jtitle>NDT & E international : independent nondestructive testing and evaluation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nagendran, R.</au><au>Thirumurugan, N.</au><au>Chinnasamy, N.</au><au>Janawadkar, M.P.</au><au>Baskaran, R.</au><au>Vaidhyanathan, L.S.</au><au>Sundar, C.S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optimum eddy current excitation frequency for subsurface defect detection in SQUID based non-destructive evaluation</atitle><jtitle>NDT & E international : independent nondestructive testing and evaluation</jtitle><date>2010-11-01</date><risdate>2010</risdate><volume>43</volume><issue>8</issue><spage>713</spage><epage>717</epage><pages>713-717</pages><issn>0963-8695</issn><eissn>1879-1174</eissn><abstract>Detailed experimental studies have been carried out for the determination of optimum eddy current excitation frequencies for the defects located at different depths below the top surface of an aluminum plate. These subsurface defects were detected by using a highly sensitive superconducting quantum interference device (SQUID) based eddy current non-destructive evaluation (NDE) system. The signal to noise ratio was found to be significantly higher at the optimum excitation frequency, which depended on the depth of the defect. The optimum excitation frequencies have been evaluated for defects located at different depths from 2 to 14
mm below the top surface of the plate. The defect depth was varied in steps of 2
mm, while the overall total thickness of the stack of plates was kept constant at 15
mm. Each defect represented a localized loss of conductor volume, which was 60
mm in length, 0.75
mm in width and 1
mm in height. The experimental results show that the square root of the optimum excitation frequency is inversely proportional to the depth of defect.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.ndteint.2010.08.003</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0963-8695 |
| ispartof | NDT & E international : independent nondestructive testing and evaluation, 2010-11, Vol.43 (8), p.713-717 |
| issn | 0963-8695 1879-1174 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1692300798 |
| source | Elsevier ScienceDirect Journals |
| subjects | Aluminum Analysing. Testing. Standards Applied sciences Cross-disciplinary physics: materials science rheology Defects Eddy current testing Eddy currents Exact sciences and technology Excitation Materials science Materials testing Metals. Metallurgy Nondestructive testing Optimization Optimun excitation frequency Physics SQUID SQUIDs Superconducting quantum interference devices Testing for defects |
| title | Optimum eddy current excitation frequency for subsurface defect detection in SQUID based non-destructive evaluation |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T15%3A19%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Optimum%20eddy%20current%20excitation%20frequency%20for%20subsurface%20defect%20detection%20in%20SQUID%20based%20non-destructive%20evaluation&rft.jtitle=NDT%20&%20E%20international%20:%20independent%20nondestructive%20testing%20and%20evaluation&rft.au=Nagendran,%20R.&rft.date=2010-11-01&rft.volume=43&rft.issue=8&rft.spage=713&rft.epage=717&rft.pages=713-717&rft.issn=0963-8695&rft.eissn=1879-1174&rft_id=info:doi/10.1016/j.ndteint.2010.08.003&rft_dat=%3Cproquest_cross%3E1692300798%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1692300798&rft_id=info:pmid/&rft_els_id=S0963869510001040&rfr_iscdi=true |