Finite element modelling of coverage effects during shot peening of IN718
Current 3D shot peening simulation models proposed in literature do not take into account coverage as a process parameter influencing the residual state after shot peening. In this study a classic approach, using an ordered dimple pattern, and a new approach, using a stochastic dimple pattern were t...
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Veröffentlicht in: | International journal of materials research 2010-08, Vol.101 (8), p.951-962 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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