Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation
•We determined the complexity of 3D surface roughness of SWCNT thin films.•We used atomic force microscopy and multifractal geometry.•We determined the generalized dimension Dq.•We determined the singularity spectrum f(α) of the multifractal structure.•We determined the statistical parameters of the...
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| Veröffentlicht in: | Applied surface science 2014-01, Vol.289, p.97-106 |
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| creator | Ţălu, Ştefan Marković, Zoran Stach, Sebastian Todorović Marković, B. Ţălu, Mihai |
| description | •We determined the complexity of 3D surface roughness of SWCNT thin films.•We used atomic force microscopy and multifractal geometry.•We determined the generalized dimension Dq.•We determined the singularity spectrum f(α) of the multifractal structure.•We determined the statistical parameters of the real surface.
This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure to optical parametric oscillator laser irradiation at wavelength of 430nm. Microstructure and morphological changes of carbon nanotube films deposited on different substrates (mica and TGX grating) were recorded by atomic force microscope. A detailed methodology for surface multifractal characterization, which may be applied for atomic force microscopy data, was presented. Multifractal analysis of surface roughness revealed that carbon nanotube films surface has a multifractal geometry at various magnifications. The generalized dimension Dq and the singularity spectrum f(α) provided quantitative values that characterize the local scale properties of carbon nanotube films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters. |
| doi_str_mv | 10.1016/j.apsusc.2013.10.114 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1685763607</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0169433213019739</els_id><sourcerecordid>1685763607</sourcerecordid><originalsourceid>FETCH-LOGICAL-c369t-f699f4c2b67f0d398e6fb30c286fe854abd915421efff2685cc3ff8e3d43f2ea3</originalsourceid><addsrcrecordid>eNp9kc9O3DAQxi1UJLaUN-jBl0q9ZPG_eJNLpQqVggTiAmfLccbFK2-c2k5LeYo-cmdZ1CMnW9_8vvnsGUI-crbmjOvz7drOZSluLRiX673K1RFZ8W4jm7bt1DuyQqxvlJTihLwvZcsYF1hdkb-3S6zBZ-uqjdQ92v0Ncni2NaSJJk9LmH5EoL9txLrNA6qTnVJdBqD1MUzUh7grtCzZWwd0mRGApzmhgECiaa7BYe8ZW--g5uBoKi7EaGvKNNoCmYac7RheIj-QY29jgbPX85Q8XH67v7hqbu6-X198vWmc1H1tvO57r5wY9MazUfYdaD9I5kSnPXStssPY81YJDt57obvWOel9B3JU0guw8pR8PvSdc_q5QKlmF4oDfNYEaSmGo2ejpWYbRNUBdTmVksGbOYedzX8MZ2a_ALM1hwWY_QJeVK7Q9uk1wRYcAM54cqH894qu7bVoW-S-HDjA7_4KkA2OByYHY8jgqhlTeDvoHzxIoyU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1685763607</pqid></control><display><type>article</type><title>Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation</title><source>Access via ScienceDirect (Elsevier)</source><creator>Ţălu, Ştefan ; Marković, Zoran ; Stach, Sebastian ; Todorović Marković, B. ; Ţălu, Mihai</creator><creatorcontrib>Ţălu, Ştefan ; Marković, Zoran ; Stach, Sebastian ; Todorović Marković, B. ; Ţălu, Mihai</creatorcontrib><description>•We determined the complexity of 3D surface roughness of SWCNT thin films.•We used atomic force microscopy and multifractal geometry.•We determined the generalized dimension Dq.•We determined the singularity spectrum f(α) of the multifractal structure.•We determined the statistical parameters of the real surface.
This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure to optical parametric oscillator laser irradiation at wavelength of 430nm. Microstructure and morphological changes of carbon nanotube films deposited on different substrates (mica and TGX grating) were recorded by atomic force microscope. A detailed methodology for surface multifractal characterization, which may be applied for atomic force microscopy data, was presented. Multifractal analysis of surface roughness revealed that carbon nanotube films surface has a multifractal geometry at various magnifications. The generalized dimension Dq and the singularity spectrum f(α) provided quantitative values that characterize the local scale properties of carbon nanotube films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2013.10.114</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Atomic force microscopy ; Carbon nanotubes ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Exposure ; Fractal analysis ; Irradiation ; Lasers ; Multifractal analysis ; OPO laser ; Optical Parametric Oscillators ; Physics ; Single wall carbon nanotubes ; Surface roughness ; SWCNTs ; Thin films</subject><ispartof>Applied surface science, 2014-01, Vol.289, p.97-106</ispartof><rights>2013 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-f699f4c2b67f0d398e6fb30c286fe854abd915421efff2685cc3ff8e3d43f2ea3</citedby><cites>FETCH-LOGICAL-c369t-f699f4c2b67f0d398e6fb30c286fe854abd915421efff2685cc3ff8e3d43f2ea3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.apsusc.2013.10.114$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,781,785,3551,27929,27930,46000</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28596255$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Ţălu, Ştefan</creatorcontrib><creatorcontrib>Marković, Zoran</creatorcontrib><creatorcontrib>Stach, Sebastian</creatorcontrib><creatorcontrib>Todorović Marković, B.</creatorcontrib><creatorcontrib>Ţălu, Mihai</creatorcontrib><title>Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation</title><title>Applied surface science</title><description>•We determined the complexity of 3D surface roughness of SWCNT thin films.•We used atomic force microscopy and multifractal geometry.•We determined the generalized dimension Dq.•We determined the singularity spectrum f(α) of the multifractal structure.•We determined the statistical parameters of the real surface.
This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure to optical parametric oscillator laser irradiation at wavelength of 430nm. Microstructure and morphological changes of carbon nanotube films deposited on different substrates (mica and TGX grating) were recorded by atomic force microscope. A detailed methodology for surface multifractal characterization, which may be applied for atomic force microscopy data, was presented. Multifractal analysis of surface roughness revealed that carbon nanotube films surface has a multifractal geometry at various magnifications. The generalized dimension Dq and the singularity spectrum f(α) provided quantitative values that characterize the local scale properties of carbon nanotube films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters.</description><subject>Atomic force microscopy</subject><subject>Carbon nanotubes</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Exposure</subject><subject>Fractal analysis</subject><subject>Irradiation</subject><subject>Lasers</subject><subject>Multifractal analysis</subject><subject>OPO laser</subject><subject>Optical Parametric Oscillators</subject><subject>Physics</subject><subject>Single wall carbon nanotubes</subject><subject>Surface roughness</subject><subject>SWCNTs</subject><subject>Thin films</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kc9O3DAQxi1UJLaUN-jBl0q9ZPG_eJNLpQqVggTiAmfLccbFK2-c2k5LeYo-cmdZ1CMnW9_8vvnsGUI-crbmjOvz7drOZSluLRiX673K1RFZ8W4jm7bt1DuyQqxvlJTihLwvZcsYF1hdkb-3S6zBZ-uqjdQ92v0Ncni2NaSJJk9LmH5EoL9txLrNA6qTnVJdBqD1MUzUh7grtCzZWwd0mRGApzmhgECiaa7BYe8ZW--g5uBoKi7EaGvKNNoCmYac7RheIj-QY29jgbPX85Q8XH67v7hqbu6-X198vWmc1H1tvO57r5wY9MazUfYdaD9I5kSnPXStssPY81YJDt57obvWOel9B3JU0guw8pR8PvSdc_q5QKlmF4oDfNYEaSmGo2ejpWYbRNUBdTmVksGbOYedzX8MZ2a_ALM1hwWY_QJeVK7Q9uk1wRYcAM54cqH894qu7bVoW-S-HDjA7_4KkA2OByYHY8jgqhlTeDvoHzxIoyU</recordid><startdate>20140115</startdate><enddate>20140115</enddate><creator>Ţălu, Ştefan</creator><creator>Marković, Zoran</creator><creator>Stach, Sebastian</creator><creator>Todorović Marković, B.</creator><creator>Ţălu, Mihai</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20140115</creationdate><title>Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation</title><author>Ţălu, Ştefan ; Marković, Zoran ; Stach, Sebastian ; Todorović Marković, B. ; Ţălu, Mihai</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-f699f4c2b67f0d398e6fb30c286fe854abd915421efff2685cc3ff8e3d43f2ea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Atomic force microscopy</topic><topic>Carbon nanotubes</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Exposure</topic><topic>Fractal analysis</topic><topic>Irradiation</topic><topic>Lasers</topic><topic>Multifractal analysis</topic><topic>OPO laser</topic><topic>Optical Parametric Oscillators</topic><topic>Physics</topic><topic>Single wall carbon nanotubes</topic><topic>Surface roughness</topic><topic>SWCNTs</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ţălu, Ştefan</creatorcontrib><creatorcontrib>Marković, Zoran</creatorcontrib><creatorcontrib>Stach, Sebastian</creatorcontrib><creatorcontrib>Todorović Marković, B.</creatorcontrib><creatorcontrib>Ţălu, Mihai</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ţălu, Ştefan</au><au>Marković, Zoran</au><au>Stach, Sebastian</au><au>Todorović Marković, B.</au><au>Ţălu, Mihai</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation</atitle><jtitle>Applied surface science</jtitle><date>2014-01-15</date><risdate>2014</risdate><volume>289</volume><spage>97</spage><epage>106</epage><pages>97-106</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>•We determined the complexity of 3D surface roughness of SWCNT thin films.•We used atomic force microscopy and multifractal geometry.•We determined the generalized dimension Dq.•We determined the singularity spectrum f(α) of the multifractal structure.•We determined the statistical parameters of the real surface.
This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure to optical parametric oscillator laser irradiation at wavelength of 430nm. Microstructure and morphological changes of carbon nanotube films deposited on different substrates (mica and TGX grating) were recorded by atomic force microscope. A detailed methodology for surface multifractal characterization, which may be applied for atomic force microscopy data, was presented. Multifractal analysis of surface roughness revealed that carbon nanotube films surface has a multifractal geometry at various magnifications. The generalized dimension Dq and the singularity spectrum f(α) provided quantitative values that characterize the local scale properties of carbon nanotube films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2013.10.114</doi><tpages>10</tpages></addata></record> |
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| subjects | Atomic force microscopy Carbon nanotubes Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Exposure Fractal analysis Irradiation Lasers Multifractal analysis OPO laser Optical Parametric Oscillators Physics Single wall carbon nanotubes Surface roughness SWCNTs Thin films |
| title | Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-12T17%3A36%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Multifractal%20characterization%20of%20single%20wall%20carbon%20nanotube%20thin%20films%20surface%20upon%20exposure%20to%20optical%20parametric%20oscillator%20laser%20irradiation&rft.jtitle=Applied%20surface%20science&rft.au=%C5%A2%C4%83lu,%20%C5%9Etefan&rft.date=2014-01-15&rft.volume=289&rft.spage=97&rft.epage=106&rft.pages=97-106&rft.issn=0169-4332&rft.eissn=1873-5584&rft_id=info:doi/10.1016/j.apsusc.2013.10.114&rft_dat=%3Cproquest_cross%3E1685763607%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1685763607&rft_id=info:pmid/&rft_els_id=S0169433213019739&rfr_iscdi=true |