Scanning laser THz imaging system
The laser terahertz (THz) emission microscope (LTEM) is a unique inspection tool which can directly two-dimensionally map the THz pulse emission from a variety of electric materials and devices. Thus, two-dimensional mapping directly yields various physical information by visualizing the distributio...
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| Veröffentlicht in: | Journal of physics. D, Applied physics Applied physics, 2014-09, Vol.47 (37), p.1-10 |
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| container_title | Journal of physics. D, Applied physics |
| container_volume | 47 |
| creator | Murakami, Hironaru Serita, Kazunori Maekawa, Yuki Fujiwara, Shogo Matsuda, Eiki Kim, Sunmi Kawayama, Iwao Tonouchi, Masayoshi |
| description | The laser terahertz (THz) emission microscope (LTEM) is a unique inspection tool which can directly two-dimensionally map the THz pulse emission from a variety of electric materials and devices. Thus, two-dimensional mapping directly yields various physical information by visualizing the distributions of electric field, supercurrent, ferroelectric domain structures, magnetic fluxes, etc. Based on techniques created for conventional LTEM, we have developed a more highly functional laser THz imaging system, including a scanning laser THz (near-field) imaging system having the performance of high-speed and high-resolution, a scanning probe LTEM coupled with an atomic force microscope for high-resolution imaging, and a dynamic THz emission microscope to investigate the ultrafast carrier dynamics two-dimensionally in the sample. These systems offer diverse characteristics, making them suitable for various applications. We take a look at these systems and some typical applications. |
| doi_str_mv | 10.1088/0022-3727/47/37/374007 |
| format | Article |
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Thus, two-dimensional mapping directly yields various physical information by visualizing the distributions of electric field, supercurrent, ferroelectric domain structures, magnetic fluxes, etc. Based on techniques created for conventional LTEM, we have developed a more highly functional laser THz imaging system, including a scanning laser THz (near-field) imaging system having the performance of high-speed and high-resolution, a scanning probe LTEM coupled with an atomic force microscope for high-resolution imaging, and a dynamic THz emission microscope to investigate the ultrafast carrier dynamics two-dimensionally in the sample. These systems offer diverse characteristics, making them suitable for various applications. 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D, Applied physics</title><addtitle>JPhysD</addtitle><addtitle>J. Phys. D: Appl. Phys</addtitle><description>The laser terahertz (THz) emission microscope (LTEM) is a unique inspection tool which can directly two-dimensionally map the THz pulse emission from a variety of electric materials and devices. Thus, two-dimensional mapping directly yields various physical information by visualizing the distributions of electric field, supercurrent, ferroelectric domain structures, magnetic fluxes, etc. Based on techniques created for conventional LTEM, we have developed a more highly functional laser THz imaging system, including a scanning laser THz (near-field) imaging system having the performance of high-speed and high-resolution, a scanning probe LTEM coupled with an atomic force microscope for high-resolution imaging, and a dynamic THz emission microscope to investigate the ultrafast carrier dynamics two-dimensionally in the sample. These systems offer diverse characteristics, making them suitable for various applications. We take a look at these systems and some typical applications.</description><subject>Dynamic tests</subject><subject>Dynamical systems</subject><subject>Dynamics</subject><subject>Emission</subject><subject>Imaging</subject><subject>Lasers</subject><subject>Scanning</subject><subject>scanning laser</subject><subject>terahertz</subject><subject>Two dimensional</subject><issn>0022-3727</issn><issn>1361-6463</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqNkEtLxDAUhYMoOI7-Bak7N7U3j-axlEEdYcCF4zqkaTp06MukXYy_3pSKW4ULBy7nXO75ELrF8IBBygyAkJQKIjImMjoPAxBnaIUpxylnnJ6j1a_pEl2FcASAnEu8Qnfv1nRd3R2SxgTnk_32K6lbc5g34RRG116ji8o0wd386Bp9PD_tN9t09_byunncpZZyNqY5scpwSymTlbSmMAUDoXhuhJRgsSqZLXNHXMk4L5wTthJUKWNLVXLsSEnX6H65O_j-c3Jh1G0drGsa07l-ChpzIYHEv8U_rETRXFIqo5UvVuv7ELyr9OBjP3_SGPSMT89k9ExGMxFVL_hikCzBuh_0sZ98F8v_FfoGdVhvyQ</recordid><startdate>20140917</startdate><enddate>20140917</enddate><creator>Murakami, Hironaru</creator><creator>Serita, Kazunori</creator><creator>Maekawa, Yuki</creator><creator>Fujiwara, Shogo</creator><creator>Matsuda, Eiki</creator><creator>Kim, Sunmi</creator><creator>Kawayama, Iwao</creator><creator>Tonouchi, Masayoshi</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20140917</creationdate><title>Scanning laser THz imaging system</title><author>Murakami, Hironaru ; Serita, Kazunori ; Maekawa, Yuki ; Fujiwara, Shogo ; Matsuda, Eiki ; Kim, Sunmi ; Kawayama, Iwao ; Tonouchi, Masayoshi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-52c9a6c3348f8cabab407965a7880c19d4cd5e2ed466bee7cf7399acd9d61e2d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Dynamic tests</topic><topic>Dynamical systems</topic><topic>Dynamics</topic><topic>Emission</topic><topic>Imaging</topic><topic>Lasers</topic><topic>Scanning</topic><topic>scanning laser</topic><topic>terahertz</topic><topic>Two dimensional</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Murakami, Hironaru</creatorcontrib><creatorcontrib>Serita, Kazunori</creatorcontrib><creatorcontrib>Maekawa, Yuki</creatorcontrib><creatorcontrib>Fujiwara, Shogo</creatorcontrib><creatorcontrib>Matsuda, Eiki</creatorcontrib><creatorcontrib>Kim, Sunmi</creatorcontrib><creatorcontrib>Kawayama, Iwao</creatorcontrib><creatorcontrib>Tonouchi, Masayoshi</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of physics. D, Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Murakami, Hironaru</au><au>Serita, Kazunori</au><au>Maekawa, Yuki</au><au>Fujiwara, Shogo</au><au>Matsuda, Eiki</au><au>Kim, Sunmi</au><au>Kawayama, Iwao</au><au>Tonouchi, Masayoshi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Scanning laser THz imaging system</atitle><jtitle>Journal of physics. D, Applied physics</jtitle><stitle>JPhysD</stitle><addtitle>J. Phys. D: Appl. Phys</addtitle><date>2014-09-17</date><risdate>2014</risdate><volume>47</volume><issue>37</issue><spage>1</spage><epage>10</epage><pages>1-10</pages><issn>0022-3727</issn><eissn>1361-6463</eissn><coden>JPAPBE</coden><abstract>The laser terahertz (THz) emission microscope (LTEM) is a unique inspection tool which can directly two-dimensionally map the THz pulse emission from a variety of electric materials and devices. Thus, two-dimensional mapping directly yields various physical information by visualizing the distributions of electric field, supercurrent, ferroelectric domain structures, magnetic fluxes, etc. Based on techniques created for conventional LTEM, we have developed a more highly functional laser THz imaging system, including a scanning laser THz (near-field) imaging system having the performance of high-speed and high-resolution, a scanning probe LTEM coupled with an atomic force microscope for high-resolution imaging, and a dynamic THz emission microscope to investigate the ultrafast carrier dynamics two-dimensionally in the sample. These systems offer diverse characteristics, making them suitable for various applications. We take a look at these systems and some typical applications.</abstract><pub>IOP Publishing</pub><doi>10.1088/0022-3727/47/37/374007</doi><tpages>10</tpages></addata></record> |
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| ispartof | Journal of physics. D, Applied physics, 2014-09, Vol.47 (37), p.1-10 |
| issn | 0022-3727 1361-6463 |
| language | eng |
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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Dynamic tests Dynamical systems Dynamics Emission Imaging Lasers Scanning scanning laser terahertz Two dimensional |
| title | Scanning laser THz imaging system |
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