Effect of molar concentration on structural, morphological and optical properties of CdS thin films obtained by SILAR method

Thin films of cadmium sulphide (CdS) were deposited on a glass plate by the SILAR method for 0.05, 0.10 and 0.15 M concentrations. The structural, optical and morphological properties of the films were characterized by X-ray diffraction (XRD), energy dispersive spectrum (EDS), UV-Vis spectrometry an...

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Veröffentlicht in:	Indian journal of pure & applied physics 2014-05, Vol.52 (5), p.354-359
Hauptverfasser:	K, Manikandan, Mani, P, Inbaraj, P Fermi Hilbert, Joseph, T Dominic, Thangaraj, V, Dilip, C Surendra, Prince, J Joseph
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopy Cadmium Cadmium sulfides Diffraction Optical properties Sulfur Thin films X-ray diffraction
Online-Zugang:	Volltext
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