Effect of molar concentration on structural, morphological and optical properties of CdS thin films obtained by SILAR method
Thin films of cadmium sulphide (CdS) were deposited on a glass plate by the SILAR method for 0.05, 0.10 and 0.15 M concentrations. The structural, optical and morphological properties of the films were characterized by X-ray diffraction (XRD), energy dispersive spectrum (EDS), UV-Vis spectrometry an...
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| Veröffentlicht in: | Indian journal of pure & applied physics 2014-05, Vol.52 (5), p.354-359 |
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| container_title | Indian journal of pure & applied physics |
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| creator | K, Manikandan Mani, P Inbaraj, P Fermi Hilbert Joseph, T Dominic Thangaraj, V Dilip, C Surendra Prince, J Joseph |
| description | Thin films of cadmium sulphide (CdS) were deposited on a glass plate by the SILAR method for 0.05, 0.10 and 0.15 M concentrations. The structural, optical and morphological properties of the films were characterized by X-ray diffraction (XRD), energy dispersive spectrum (EDS), UV-Vis spectrometry and atomic force microscopy (AFM) techniques. The XRD patterns of the films indicated that the crystalline natured films have hexagonal phases. The energy-dispersive spectrum (EDS) analysis confirms the compositions of cadmium and sulphur in CdS films. The direct band gap values in the range 2.32-2.24 eV were observed from the transmittance studies, the results infer that the band gap energy decreases with increasing molar concentration. The AFM studies show that the film is evenly coated and has uniform grain sizes. |
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The structural, optical and morphological properties of the films were characterized by X-ray diffraction (XRD), energy dispersive spectrum (EDS), UV-Vis spectrometry and atomic force microscopy (AFM) techniques. The XRD patterns of the films indicated that the crystalline natured films have hexagonal phases. The energy-dispersive spectrum (EDS) analysis confirms the compositions of cadmium and sulphur in CdS films. The direct band gap values in the range 2.32-2.24 eV were observed from the transmittance studies, the results infer that the band gap energy decreases with increasing molar concentration. 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The structural, optical and morphological properties of the films were characterized by X-ray diffraction (XRD), energy dispersive spectrum (EDS), UV-Vis spectrometry and atomic force microscopy (AFM) techniques. The XRD patterns of the films indicated that the crystalline natured films have hexagonal phases. The energy-dispersive spectrum (EDS) analysis confirms the compositions of cadmium and sulphur in CdS films. The direct band gap values in the range 2.32-2.24 eV were observed from the transmittance studies, the results infer that the band gap energy decreases with increasing molar concentration. The AFM studies show that the film is evenly coated and has uniform grain sizes.</description><subject>Atomic force microscopy</subject><subject>Cadmium</subject><subject>Cadmium sulfides</subject><subject>Diffraction</subject><subject>Optical properties</subject><subject>Sulfur</subject><subject>Thin films</subject><subject>X-ray diffraction</subject><issn>0019-5596</issn><issn>0975-1041</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqFjk1LAzEYhBdRsFb_Q44eXEg2m83mWErVQkGwei75eGMj2WRNsgfBH-9qvQsDMwzDw5xVCyw4qwluyfmcMRE1Y6K7rK5yfse4Y0LQRfW1sRZ0QdGiIXqZkI5BQyhJFhcDmpVLmnSZkvR38ySNx-jjm9PSIxkMimP5zWOKI6TiIP-g1maPytEFZJ0f5kYV6QIYpD7RfrtbPaMByjGa6-rCSp_h5s-X1ev95mX9WO-eHrbr1a4em4aUuhWU496CwUYqRazsBCeN6jkmREkCjPGO4Z5Sa6kSPcieG9W0WGirpQBCl9XtiTu__Jggl8PgsgbvZYA45QPpOBeCc8r-n7KOY95ijuk3JkNsQQ</recordid><startdate>20140501</startdate><enddate>20140501</enddate><creator>K, Manikandan</creator><creator>Mani, P</creator><creator>Inbaraj, P Fermi Hilbert</creator><creator>Joseph, T Dominic</creator><creator>Thangaraj, V</creator><creator>Dilip, C Surendra</creator><creator>Prince, J Joseph</creator><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20140501</creationdate><title>Effect of molar concentration on structural, morphological and optical properties of CdS thin films obtained by SILAR method</title><author>K, Manikandan ; Mani, P ; Inbaraj, P Fermi Hilbert ; Joseph, T Dominic ; Thangaraj, V ; Dilip, C Surendra ; Prince, J Joseph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p221t-493708fed0dabb1fa69712b87011ba1e557650833ff3b98ea87db2409cfca9e13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Atomic force microscopy</topic><topic>Cadmium</topic><topic>Cadmium sulfides</topic><topic>Diffraction</topic><topic>Optical properties</topic><topic>Sulfur</topic><topic>Thin films</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>K, Manikandan</creatorcontrib><creatorcontrib>Mani, P</creatorcontrib><creatorcontrib>Inbaraj, P Fermi Hilbert</creatorcontrib><creatorcontrib>Joseph, T Dominic</creatorcontrib><creatorcontrib>Thangaraj, V</creatorcontrib><creatorcontrib>Dilip, C Surendra</creatorcontrib><creatorcontrib>Prince, J Joseph</creatorcontrib><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Indian journal of pure & applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>K, Manikandan</au><au>Mani, P</au><au>Inbaraj, P Fermi Hilbert</au><au>Joseph, T Dominic</au><au>Thangaraj, V</au><au>Dilip, C Surendra</au><au>Prince, J Joseph</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of molar concentration on structural, morphological and optical properties of CdS thin films obtained by SILAR method</atitle><jtitle>Indian journal of pure & applied physics</jtitle><date>2014-05-01</date><risdate>2014</risdate><volume>52</volume><issue>5</issue><spage>354</spage><epage>359</epage><pages>354-359</pages><issn>0019-5596</issn><eissn>0975-1041</eissn><abstract>Thin films of cadmium sulphide (CdS) were deposited on a glass plate by the SILAR method for 0.05, 0.10 and 0.15 M concentrations. The structural, optical and morphological properties of the films were characterized by X-ray diffraction (XRD), energy dispersive spectrum (EDS), UV-Vis spectrometry and atomic force microscopy (AFM) techniques. The XRD patterns of the films indicated that the crystalline natured films have hexagonal phases. The energy-dispersive spectrum (EDS) analysis confirms the compositions of cadmium and sulphur in CdS films. The direct band gap values in the range 2.32-2.24 eV were observed from the transmittance studies, the results infer that the band gap energy decreases with increasing molar concentration. The AFM studies show that the film is evenly coated and has uniform grain sizes.</abstract><tpages>6</tpages></addata></record> |
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| source | DOAJ Directory of Open Access Journals; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Free Full-Text Journals in Chemistry |
| subjects | Atomic force microscopy Cadmium Cadmium sulfides Diffraction Optical properties Sulfur Thin films X-ray diffraction |
| title | Effect of molar concentration on structural, morphological and optical properties of CdS thin films obtained by SILAR method |
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