Radar cross section (RCS) statistical characterization using weibull distribution
Radar target's backscatter varies rapidly because of change in the relative position of each scatterer, body vibration while moving and so on. Weibull distribution is adopted as an inclusive description of the envelope of various targets' backscattering in this paper. Weibull distribution...
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| Veröffentlicht in: | Microwave and optical technology letters 2013-06, Vol.55 (6), p.1355-1358 |
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| creator | Shi, Weiqiang Shi, Xiao-Wei Xu, Le |
| description | Radar target's backscatter varies rapidly because of change in the relative position of each scatterer, body vibration while moving and so on. Weibull distribution is adopted as an inclusive description of the envelope of various targets' backscattering in this paper. Weibull distribution is expressed as a function of two parameters, shape parameter and scale parameter. The parametric meanings are discussed with the distribution curves of different parameter values plotted. The authors find that Weibull distribution with a proper shape parameter can be an impressively good approximation of some existing RCS distribution models. A parameter estimation method is provided. Two examples are shown to illustrate the application of Weibull distribution. © 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:1355–1358, 2013; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.27557 |
| doi_str_mv | 10.1002/mop.27557 |
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Weibull distribution is adopted as an inclusive description of the envelope of various targets' backscattering in this paper. Weibull distribution is expressed as a function of two parameters, shape parameter and scale parameter. The parametric meanings are discussed with the distribution curves of different parameter values plotted. The authors find that Weibull distribution with a proper shape parameter can be an impressively good approximation of some existing RCS distribution models. A parameter estimation method is provided. Two examples are shown to illustrate the application of Weibull distribution. © 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:1355–1358, 2013; View this article online at wileyonlinelibrary.com. 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DOI 10.1002/mop.27557</description><subject>Approximation</subject><subject>Backscattering</subject><subject>fitting goodness test</subject><subject>Mathematical models</subject><subject>Microwaves</subject><subject>On-line systems</subject><subject>parametric meaning</subject><subject>Radar cross sections</subject><subject>RCS characterization</subject><subject>Vibration</subject><subject>Weibull distribution</subject><issn>0895-2477</issn><issn>1098-2760</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNp1kMtOwzAQRS0EEuWx4A8isSmLwPiRTLyECgqotDzF0nISB1zSptiJSvl60hZYILGakebcq9Eh5IDCMQVgJ5NqdswwinCDdCjIJGQYwybpQCKjkAnEbbLj_RgAOCLrkLt7nWsXZK7yPvAmq201Dbr3vYejwNe6tr62mS6D7FU7ndXG2U-9Qhpvpy_B3Ni0KcsgbznXrsvTHtkqdOnN_vfcJU8X54-9y3Aw6l_1TgdhxuMEQ825hgIwlanIhQSQKE0SUSOESFLJtBAy5zEveKFRCGQ8YsIIMBzTONcx3yXdde_MVe-N8bWaWJ-ZstRTUzVe0RhpJIBB0qKHf9Bx1bhp-52inFHJJOPLwqM1tZLhTKFmzk60WygKailXtXLVSm7LnqzZuS3N4n9Q3YxufxLhOtGqMh-_Ce3eVIwcI_U87Cs8gwFeJ0N1xr8A1iSJKg</recordid><startdate>201306</startdate><enddate>201306</enddate><creator>Shi, Weiqiang</creator><creator>Shi, Xiao-Wei</creator><creator>Xu, Le</creator><general>Wiley Subscription Services, Inc., A Wiley Company</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><scope>H8D</scope></search><sort><creationdate>201306</creationdate><title>Radar cross section (RCS) statistical characterization using weibull distribution</title><author>Shi, Weiqiang ; Shi, Xiao-Wei ; Xu, Le</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3687-a33a0f07b9b4d4900979e851e4448b92a449d363f3fa744723524e40e37b6da63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Approximation</topic><topic>Backscattering</topic><topic>fitting goodness test</topic><topic>Mathematical models</topic><topic>Microwaves</topic><topic>On-line systems</topic><topic>parametric meaning</topic><topic>Radar cross sections</topic><topic>RCS characterization</topic><topic>Vibration</topic><topic>Weibull distribution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shi, Weiqiang</creatorcontrib><creatorcontrib>Shi, Xiao-Wei</creatorcontrib><creatorcontrib>Xu, Le</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><jtitle>Microwave and optical technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shi, Weiqiang</au><au>Shi, Xiao-Wei</au><au>Xu, Le</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Radar cross section (RCS) statistical characterization using weibull distribution</atitle><jtitle>Microwave and optical technology letters</jtitle><addtitle>Microw. 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Two examples are shown to illustrate the application of Weibull distribution. © 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:1355–1358, 2013; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.27557</abstract><cop>Hoboken</cop><pub>Wiley Subscription Services, Inc., A Wiley Company</pub><doi>10.1002/mop.27557</doi><tpages>4</tpages></addata></record> |
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| source | Wiley Online Library Journals Frontfile Complete |
| subjects | Approximation Backscattering fitting goodness test Mathematical models Microwaves On-line systems parametric meaning Radar cross sections RCS characterization Vibration Weibull distribution |
| title | Radar cross section (RCS) statistical characterization using weibull distribution |
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