Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry
Buried interfaces between a polystyrene (PS) or polar poly(methyl methacrylate) (PMMA) thin film and the gold surface patterned with CH3- and COOH-terminated alkanethiols self-assembled monolayers (SAM) were examined via Kelvin probe force microscopy. Chemical composition of the interface was probed...
Gespeichert in:
| Veröffentlicht in: | Electrochimica acta 2013-08, Vol.104, p.462-467 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 467 |
|---|---|
| container_issue | |
| container_start_page | 462 |
| container_title | Electrochimica acta |
| container_volume | 104 |
| creator | Marzec, M.M. Bernasik, A. Rysz, J. Łużny, W. Budkowski, A. |
| description | Buried interfaces between a polystyrene (PS) or polar poly(methyl methacrylate) (PMMA) thin film and the gold surface patterned with CH3- and COOH-terminated alkanethiols self-assembled monolayers (SAM) were examined via Kelvin probe force microscopy. Chemical composition of the interface was probed by secondary ion mass spectrometry. The contact potential difference maps measured on the PS and the PMMA films show inverted contrast. This observation is discussed in terms of reorientations of the COOH-SAM net dipole moments induced by interactions with PMMA. |
| doi_str_mv | 10.1016/j.electacta.2013.02.128 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1671502936</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0013468613003733</els_id><sourcerecordid>1531010947</sourcerecordid><originalsourceid>FETCH-LOGICAL-c381t-f724aa8eedc04d13bd58eb8ddadd9ca1bdc7a4bbd669c130f728671a50fff6cb3</originalsourceid><addsrcrecordid>eNqFkc1q3TAUhEVpobdpn6FadmNHsmxZXoaQNqWBbpK10M8R6KIfV3JC_RZ95Mrc0m1AIND5Zo6GQegzJT0llF-fewhgNtVOPxDKejL0dBBv0ImKmXVMTMtbdCJt0o1c8PfoQ61nQsjMZ3JCf-5-q-iT2nxOODu85rBHKNcRNhWwTxsUpwzgmK13HizWO64QXKdqhahDe4k55aB2KMfsB4QXn_Basgbscjmk3pRcTV53rJJtapOTVWXHx8rYfHBdW4CS286yf0TvnAoVPv27r9DT17vH2_vu4ee377c3D51hgm6dm4dRKQFgDRktZdpOArSwVlm7GEW1NbMatbacL4Yy0njBZ6om4pzjRrMr9OXi27766xnqJqOvBkJQCfJzlbTRExkWxl9HJ9aaIMs4N3S-oEfkWsDJtfjYwkpK5FGXPMv_dcmjLkkG2epqypuLElroFw9FVuMhGbC-NF7a7F_1-AtzOqe_</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1531010947</pqid></control><display><type>article</type><title>Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>Marzec, M.M. ; Bernasik, A. ; Rysz, J. ; Łużny, W. ; Budkowski, A.</creator><creatorcontrib>Marzec, M.M. ; Bernasik, A. ; Rysz, J. ; Łużny, W. ; Budkowski, A.</creatorcontrib><description>Buried interfaces between a polystyrene (PS) or polar poly(methyl methacrylate) (PMMA) thin film and the gold surface patterned with CH3- and COOH-terminated alkanethiols self-assembled monolayers (SAM) were examined via Kelvin probe force microscopy. Chemical composition of the interface was probed by secondary ion mass spectrometry. The contact potential difference maps measured on the PS and the PMMA films show inverted contrast. This observation is discussed in terms of reorientations of the COOH-SAM net dipole moments induced by interactions with PMMA.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/j.electacta.2013.02.128</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Acoustic microscopes ; Buried interface ; Dipole moment ; Kelvin probe force microscopy ; Microscopy ; Polymethyl methacrylates ; Polystyrene resins ; Secondary ion mass spectrometry ; Self-assembled monolayers ; Thin polymer film</subject><ispartof>Electrochimica acta, 2013-08, Vol.104, p.462-467</ispartof><rights>2013 Elsevier Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c381t-f724aa8eedc04d13bd58eb8ddadd9ca1bdc7a4bbd669c130f728671a50fff6cb3</citedby><cites>FETCH-LOGICAL-c381t-f724aa8eedc04d13bd58eb8ddadd9ca1bdc7a4bbd669c130f728671a50fff6cb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.electacta.2013.02.128$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Marzec, M.M.</creatorcontrib><creatorcontrib>Bernasik, A.</creatorcontrib><creatorcontrib>Rysz, J.</creatorcontrib><creatorcontrib>Łużny, W.</creatorcontrib><creatorcontrib>Budkowski, A.</creatorcontrib><title>Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry</title><title>Electrochimica acta</title><description>Buried interfaces between a polystyrene (PS) or polar poly(methyl methacrylate) (PMMA) thin film and the gold surface patterned with CH3- and COOH-terminated alkanethiols self-assembled monolayers (SAM) were examined via Kelvin probe force microscopy. Chemical composition of the interface was probed by secondary ion mass spectrometry. The contact potential difference maps measured on the PS and the PMMA films show inverted contrast. This observation is discussed in terms of reorientations of the COOH-SAM net dipole moments induced by interactions with PMMA.</description><subject>Acoustic microscopes</subject><subject>Buried interface</subject><subject>Dipole moment</subject><subject>Kelvin probe force microscopy</subject><subject>Microscopy</subject><subject>Polymethyl methacrylates</subject><subject>Polystyrene resins</subject><subject>Secondary ion mass spectrometry</subject><subject>Self-assembled monolayers</subject><subject>Thin polymer film</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkc1q3TAUhEVpobdpn6FadmNHsmxZXoaQNqWBbpK10M8R6KIfV3JC_RZ95Mrc0m1AIND5Zo6GQegzJT0llF-fewhgNtVOPxDKejL0dBBv0ImKmXVMTMtbdCJt0o1c8PfoQ61nQsjMZ3JCf-5-q-iT2nxOODu85rBHKNcRNhWwTxsUpwzgmK13HizWO64QXKdqhahDe4k55aB2KMfsB4QXn_Basgbscjmk3pRcTV53rJJtapOTVWXHx8rYfHBdW4CS286yf0TvnAoVPv27r9DT17vH2_vu4ee377c3D51hgm6dm4dRKQFgDRktZdpOArSwVlm7GEW1NbMatbacL4Yy0njBZ6om4pzjRrMr9OXi27766xnqJqOvBkJQCfJzlbTRExkWxl9HJ9aaIMs4N3S-oEfkWsDJtfjYwkpK5FGXPMv_dcmjLkkG2epqypuLElroFw9FVuMhGbC-NF7a7F_1-AtzOqe_</recordid><startdate>20130801</startdate><enddate>20130801</enddate><creator>Marzec, M.M.</creator><creator>Bernasik, A.</creator><creator>Rysz, J.</creator><creator>Łużny, W.</creator><creator>Budkowski, A.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20130801</creationdate><title>Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry</title><author>Marzec, M.M. ; Bernasik, A. ; Rysz, J. ; Łużny, W. ; Budkowski, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c381t-f724aa8eedc04d13bd58eb8ddadd9ca1bdc7a4bbd669c130f728671a50fff6cb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Acoustic microscopes</topic><topic>Buried interface</topic><topic>Dipole moment</topic><topic>Kelvin probe force microscopy</topic><topic>Microscopy</topic><topic>Polymethyl methacrylates</topic><topic>Polystyrene resins</topic><topic>Secondary ion mass spectrometry</topic><topic>Self-assembled monolayers</topic><topic>Thin polymer film</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Marzec, M.M.</creatorcontrib><creatorcontrib>Bernasik, A.</creatorcontrib><creatorcontrib>Rysz, J.</creatorcontrib><creatorcontrib>Łużny, W.</creatorcontrib><creatorcontrib>Budkowski, A.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Marzec, M.M.</au><au>Bernasik, A.</au><au>Rysz, J.</au><au>Łużny, W.</au><au>Budkowski, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry</atitle><jtitle>Electrochimica acta</jtitle><date>2013-08-01</date><risdate>2013</risdate><volume>104</volume><spage>462</spage><epage>467</epage><pages>462-467</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><abstract>Buried interfaces between a polystyrene (PS) or polar poly(methyl methacrylate) (PMMA) thin film and the gold surface patterned with CH3- and COOH-terminated alkanethiols self-assembled monolayers (SAM) were examined via Kelvin probe force microscopy. Chemical composition of the interface was probed by secondary ion mass spectrometry. The contact potential difference maps measured on the PS and the PMMA films show inverted contrast. This observation is discussed in terms of reorientations of the COOH-SAM net dipole moments induced by interactions with PMMA.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.electacta.2013.02.128</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0013-4686 |
| ispartof | Electrochimica acta, 2013-08, Vol.104, p.462-467 |
| issn | 0013-4686 1873-3859 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1671502936 |
| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Acoustic microscopes Buried interface Dipole moment Kelvin probe force microscopy Microscopy Polymethyl methacrylates Polystyrene resins Secondary ion mass spectrometry Self-assembled monolayers Thin polymer film |
| title | Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T05%3A52%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Examination%20of%20polymer/metal%20interface%20modified%20by%20self-assembled%20monolayer%20by%20Kelvin%20probe%20force%20microscopy%20and%20secondary%20ion%20mass%20spectrometry&rft.jtitle=Electrochimica%20acta&rft.au=Marzec,%20M.M.&rft.date=2013-08-01&rft.volume=104&rft.spage=462&rft.epage=467&rft.pages=462-467&rft.issn=0013-4686&rft.eissn=1873-3859&rft_id=info:doi/10.1016/j.electacta.2013.02.128&rft_dat=%3Cproquest_cross%3E1531010947%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1531010947&rft_id=info:pmid/&rft_els_id=S0013468613003733&rfr_iscdi=true |