Dielectric function of Cu(In, Ga)Se2-based polycrystalline materials

The dielectric functions of Cu(In, Ga)Se2(CIGS)-based polycrystalline layers with different Ga and Cu compositions have been determined by applying spectroscopic ellipsometry (SE) in a wide energy range of 0.7–6.5 eV. To suppress SE analysis errors induced by rough surface and compositional fluctuat...

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Veröffentlicht in:	Journal of applied physics 2013-02, Vol.113 (6)
Hauptverfasser:	Minoura, Shota, Kodera, Keita, Maekawa, Takuji, Miyazaki, Kenichi, Niki, Shigeru, Fujiwara, Hiroyuki
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorption coefficient CIGS Copper COPPER SELENIDE CRYSTAL STRUCTURE Dielectrics Gallium INSULATION (ELECTRICAL) MATHEMATICAL ANALYSIS Mathematical models Optical transition Orbitals Roughness VALENCE
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