Internal resonance based sensing in non-contact atomic force microscopy

Internal resonance based sensing in non-contact atomic force microscopy

In this letter, the nonlinear dynamics of a non-uniform micro-cantilever for atomic force microscopy is investigated numerically for a non-contact mode of operation. A step-like heterogeneity in the cantilever longitudinal direction yields conditions for both 3:1 and 2:1 internal resonances that gov...

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Veröffentlicht in:Applied physics letters 2012-07, Vol.101 (5), p.53106
Hauptverfasser: Hacker, E., Gottlieb, O.
Format: Artikel
Sprache:eng
Schlagworte:
Atomic force microscopy
Bending
Detection
Energy transfer
Heterogeneity
Mathematical analysis
Mathematical models
Nonlinear dynamics
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description In this letter, the nonlinear dynamics of a non-uniform micro-cantilever for atomic force microscopy is investigated numerically for a non-contact mode of operation. A step-like heterogeneity in the cantilever longitudinal direction yields conditions for both 3:1 and 2:1 internal resonances that govern quasiperiodic energy transfer between the first and second structural bending modes. Thus, quasiperiodic micro-cantilever response can enable multiple function sensing, and possible increased accuracy of time-varying forces via single frequency base excitation.
doi_str_mv 10.1063/1.4739416
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source AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection
subjects Atomic force microscopy
Bending
Detection
Energy transfer
Heterogeneity
Mathematical analysis
Mathematical models
Nonlinear dynamics
title Internal resonance based sensing in non-contact atomic force microscopy
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