Magnetic properties and microstructure investigation of electrodeposited FeNi/ITO films with different thickness
•FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates by electrodeposition method.•A columnar crystalline microstructure and domain structure were obtained in FeNi thin films.•Particular FMR spectra of FeNi alloy with different thickness we...
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| Veröffentlicht in: | Journal of alloys and compounds 2013-12, Vol.581, p.66-70 |
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| container_title | Journal of alloys and compounds |
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| creator | Cao, Derang Wang, Zhenkun Feng, Erxi Wei, Jinwu Wang, Jianbo Liu, Qingfang |
| description | •FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates by electrodeposition method.•A columnar crystalline microstructure and domain structure were obtained in FeNi thin films.•Particular FMR spectra of FeNi alloy with different thickness were studied.
FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates from the electrolytes by electrodeposition method have been studied by magnetic force microscopy (MFM), scanning electron microscopy (SEM) and ferromagnetic resonance (FMR) technique. For these films possessing an in-plane isotropy, the remanence decreases with the increasing of film thickness and the critical thickness that a stripe domain structure emerges is about 116nm. Characteristic differences of the FMR spectra of different thickness are also observed. The results show that the resonance field at high measured angle increases firstly then decreases with increasing thickness, which may be related to the striped domain structure. |
| doi_str_mv | 10.1016/j.jallcom.2013.07.050 |
| format | Article |
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FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates from the electrolytes by electrodeposition method have been studied by magnetic force microscopy (MFM), scanning electron microscopy (SEM) and ferromagnetic resonance (FMR) technique. For these films possessing an in-plane isotropy, the remanence decreases with the increasing of film thickness and the critical thickness that a stripe domain structure emerges is about 116nm. Characteristic differences of the FMR spectra of different thickness are also observed. The results show that the resonance field at high measured angle increases firstly then decreases with increasing thickness, which may be related to the striped domain structure.</description><identifier>ISSN: 0925-8388</identifier><identifier>EISSN: 1873-4669</identifier><identifier>DOI: 10.1016/j.jallcom.2013.07.050</identifier><language>eng</language><publisher>Kidlington: Elsevier B.V</publisher><subject>Alloys ; Chemistry ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Deposition ; Electrochemistry ; Electrodeposition ; Electrodeposition, electroplating ; Electrolytes ; Exact sciences and technology ; FeNi film ; Film thickness ; FMR ; General and physical chemistry ; Indium tin oxide ; Magnetic fields ; Magnetic properties ; Magnetic properties and materials ; Materials science ; Methods of deposition of films and coatings; film growth and epitaxy ; Physics ; Properties of electrolytes: conductivity ; Scanning electron microscopy ; Spectra ; Stripe domain ; Structure and morphology; thickness ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thickness ; Thin film structure and morphology</subject><ispartof>Journal of alloys and compounds, 2013-12, Vol.581, p.66-70</ispartof><rights>2013 Elsevier B.V.</rights><rights>2014 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c405t-680d6b7896f9950fe40362e1f2d1a1a6329bbd01087787104ddbf403d932fe9a3</citedby><cites>FETCH-LOGICAL-c405t-680d6b7896f9950fe40362e1f2d1a1a6329bbd01087787104ddbf403d932fe9a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0925838813016630$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27822824$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Cao, Derang</creatorcontrib><creatorcontrib>Wang, Zhenkun</creatorcontrib><creatorcontrib>Feng, Erxi</creatorcontrib><creatorcontrib>Wei, Jinwu</creatorcontrib><creatorcontrib>Wang, Jianbo</creatorcontrib><creatorcontrib>Liu, Qingfang</creatorcontrib><title>Magnetic properties and microstructure investigation of electrodeposited FeNi/ITO films with different thickness</title><title>Journal of alloys and compounds</title><description>•FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates by electrodeposition method.•A columnar crystalline microstructure and domain structure were obtained in FeNi thin films.•Particular FMR spectra of FeNi alloy with different thickness were studied.
FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates from the electrolytes by electrodeposition method have been studied by magnetic force microscopy (MFM), scanning electron microscopy (SEM) and ferromagnetic resonance (FMR) technique. For these films possessing an in-plane isotropy, the remanence decreases with the increasing of film thickness and the critical thickness that a stripe domain structure emerges is about 116nm. Characteristic differences of the FMR spectra of different thickness are also observed. The results show that the resonance field at high measured angle increases firstly then decreases with increasing thickness, which may be related to the striped domain structure.</description><subject>Alloys</subject><subject>Chemistry</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Deposition</subject><subject>Electrochemistry</subject><subject>Electrodeposition</subject><subject>Electrodeposition, electroplating</subject><subject>Electrolytes</subject><subject>Exact sciences and technology</subject><subject>FeNi film</subject><subject>Film thickness</subject><subject>FMR</subject><subject>General and physical chemistry</subject><subject>Indium tin oxide</subject><subject>Magnetic fields</subject><subject>Magnetic properties</subject><subject>Magnetic properties and materials</subject><subject>Materials science</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Physics</subject><subject>Properties of electrolytes: conductivity</subject><subject>Scanning electron microscopy</subject><subject>Spectra</subject><subject>Stripe domain</subject><subject>Structure and morphology; thickness</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thickness</subject><subject>Thin film structure and morphology</subject><issn>0925-8388</issn><issn>1873-4669</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkUtvFDEQhEcRSCyBn4DkCxKXmbQ9Mx77hFBEHlIgl3C2vHY76c28sL1B_Hu82hXXnPrydVd1VVV94tBw4PJi1-zsOLplagTwtoGhgR7Oqg1XQ1t3Uuo31Qa06GvVKvWuep_SDgC4bvmmWn_YxxkzObbGZcWYCROzs2cTubikHPcu7yMyml8wZXq0mZaZLYHhiC7HxeO6JMro2RX-pIvbh3sWaJwS-0P5iXkKASPOmeUncs8zpvShehvsmPDjaZ5Xv66-P1ze1Hf317eX3-5q10Gfa6nAy-2gtAxa9xCwg1YK5EF4brmVrdDbrQcOahjUwKHzfhsK43UrAmrbnldfjnfLX7_3xbuZKDkcRzvjsk-Gy4F3GmTXv472vO1kV3wVtD-ih3BSxGDWSJONfw0HcyjD7MypDHMow8BgShll7_NJwiZnxxDt7Cj9XxaDEkKJrnBfjxyWaF4Io0mOcHboKZa8jV_oFaV_Lp2j3w</recordid><startdate>20131225</startdate><enddate>20131225</enddate><creator>Cao, Derang</creator><creator>Wang, Zhenkun</creator><creator>Feng, Erxi</creator><creator>Wei, Jinwu</creator><creator>Wang, Jianbo</creator><creator>Liu, Qingfang</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20131225</creationdate><title>Magnetic properties and microstructure investigation of electrodeposited FeNi/ITO films with different thickness</title><author>Cao, Derang ; Wang, Zhenkun ; Feng, Erxi ; Wei, Jinwu ; Wang, Jianbo ; Liu, Qingfang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c405t-680d6b7896f9950fe40362e1f2d1a1a6329bbd01087787104ddbf403d932fe9a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Alloys</topic><topic>Chemistry</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Deposition</topic><topic>Electrochemistry</topic><topic>Electrodeposition</topic><topic>Electrodeposition, electroplating</topic><topic>Electrolytes</topic><topic>Exact sciences and technology</topic><topic>FeNi film</topic><topic>Film thickness</topic><topic>FMR</topic><topic>General and physical chemistry</topic><topic>Indium tin oxide</topic><topic>Magnetic fields</topic><topic>Magnetic properties</topic><topic>Magnetic properties and materials</topic><topic>Materials science</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Physics</topic><topic>Properties of electrolytes: conductivity</topic><topic>Scanning electron microscopy</topic><topic>Spectra</topic><topic>Stripe domain</topic><topic>Structure and morphology; thickness</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thickness</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cao, Derang</creatorcontrib><creatorcontrib>Wang, Zhenkun</creatorcontrib><creatorcontrib>Feng, Erxi</creatorcontrib><creatorcontrib>Wei, Jinwu</creatorcontrib><creatorcontrib>Wang, Jianbo</creatorcontrib><creatorcontrib>Liu, Qingfang</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of alloys and compounds</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cao, Derang</au><au>Wang, Zhenkun</au><au>Feng, Erxi</au><au>Wei, Jinwu</au><au>Wang, Jianbo</au><au>Liu, Qingfang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Magnetic properties and microstructure investigation of electrodeposited FeNi/ITO films with different thickness</atitle><jtitle>Journal of alloys and compounds</jtitle><date>2013-12-25</date><risdate>2013</risdate><volume>581</volume><spage>66</spage><epage>70</epage><pages>66-70</pages><issn>0925-8388</issn><eissn>1873-4669</eissn><abstract>•FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates by electrodeposition method.•A columnar crystalline microstructure and domain structure were obtained in FeNi thin films.•Particular FMR spectra of FeNi alloy with different thickness were studied.
FeNi alloy thin films with different thickness deposited on Indium Tin Oxides (ITOs) conductive glass substrates from the electrolytes by electrodeposition method have been studied by magnetic force microscopy (MFM), scanning electron microscopy (SEM) and ferromagnetic resonance (FMR) technique. For these films possessing an in-plane isotropy, the remanence decreases with the increasing of film thickness and the critical thickness that a stripe domain structure emerges is about 116nm. Characteristic differences of the FMR spectra of different thickness are also observed. The results show that the resonance field at high measured angle increases firstly then decreases with increasing thickness, which may be related to the striped domain structure.</abstract><cop>Kidlington</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jallcom.2013.07.050</doi><tpages>5</tpages></addata></record> |
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| subjects | Alloys Chemistry Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Deposition Electrochemistry Electrodeposition Electrodeposition, electroplating Electrolytes Exact sciences and technology FeNi film Film thickness FMR General and physical chemistry Indium tin oxide Magnetic fields Magnetic properties Magnetic properties and materials Materials science Methods of deposition of films and coatings film growth and epitaxy Physics Properties of electrolytes: conductivity Scanning electron microscopy Spectra Stripe domain Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thickness Thin film structure and morphology |
| title | Magnetic properties and microstructure investigation of electrodeposited FeNi/ITO films with different thickness |
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