Investigation of Ghosting Recovery Mechanisms in Selenium X-ray Detector Structures for Mammography

The ghosting recovery mechanisms in multilayer selenium X-ray detector structures for mammography are experimentally and theoretically investigated. The experiments have been carried out under low positive applied electric field . A ghost removal technique is investigated by reversing the bias polar...

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Veröffentlicht in:	IEEE transactions on nuclear science 2012-06, Vol.59 (3), p.597-604
Hauptverfasser:	Mahmood, S. A., Kabir, M. Z., Tousignant, O., Greenspan, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Amorphous selenium Bias Carriers Charging dark current Detectors Electric fields Electron traps ghosting mammography Metals Probes Recovery Selenium Sensitivity Studies X-ray image detector X-ray imaging X-ray sensitivity X-rays
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