Sub-unit cell layer-by-layer growth of Fe3O4, MgO, and Sr2RuO4 thin films

The use of oxide materials in oxide electronics requires their controlled epitaxial growth. Recently, it was shown that Reflection High Energy Electron Diffraction (RHEED) allows the growth of oxide thin films to be monitored, even at high oxygen pressures. Here, we report the sub-unit cell molecula...

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Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 2003-10, Vol.77 (5), p.619-621
Hauptverfasser:	Reisinger, D., Blass, B., Klein, J., Philipp, J.B., Schonecke, M., Erb, A., Alff, L., Gross, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Blocking Epitaxial growth Magnesium oxide Oscillations Oxides Stoichiometry Thin films Unit cell
Online-Zugang:	Volltext
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