Bilateral filter based orientation smoothing of EBSD data

Bilateral filter based orientation smoothing was implemented in this study to improve the angular precision of orientation maps for deposited and deformed structures of pure Cu obtained from electron backscattered diffraction (EBSD) measurements. Applying the method to the deformed and deposited str...

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Veröffentlicht in:Ultramicroscopy 2010-09, Vol.110 (10), p.1297-1305
Hauptverfasser: Chen, Delphic, Kuo, Jui-Chao
Format: Artikel
Sprache:eng
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Zusammenfassung:Bilateral filter based orientation smoothing was implemented in this study to improve the angular precision of orientation maps for deposited and deformed structures of pure Cu obtained from electron backscattered diffraction (EBSD) measurements. Applying the method to the deformed and deposited structures, the accuracy of misorientation (or the limit of orientation noise) is enhanced from 0.7° to 0.25° and 0.07°, respectively. Orientation smoothing has two features: preservation of boundary structures or deformed substructures and significant reduction in orientation noise after only one pass.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2010.06.003