Chemical synthesis of nanocrystalline SnO2 thin films for supercapacitor application

Nanocrystalline SnO2 thin films were deposited by simple and inexpensive chemical route. The films were characterized for their structural, morphological, wettability and electrochemical properties using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), scanning electron micr...

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Veröffentlicht in:	Applied surface science 2011-09, Vol.257 (22), p.9498-9502
Hauptverfasser:	PUSAWALE, S. N, DESHMUKH, P. R, LOKHANDE, C. D
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Contact angle Exact sciences and technology Nanocrystals Physics Scanning electron microscopy Single-crystal and powder diffraction Solid-fluid interfaces Structure and morphology thickness Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Thin films Tin dioxide Tin oxides Transmission electron microscopy Wettability Wetting X-ray diffraction and scattering
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