Chemical synthesis of nanocrystalline SnO2 thin films for supercapacitor application
Nanocrystalline SnO2 thin films were deposited by simple and inexpensive chemical route. The films were characterized for their structural, morphological, wettability and electrochemical properties using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), scanning electron micr...
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Veröffentlicht in: | Applied surface science 2011-09, Vol.257 (22), p.9498-9502 |
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creator | PUSAWALE, S. N DESHMUKH, P. R LOKHANDE, C. D |
description | Nanocrystalline SnO2 thin films were deposited by simple and inexpensive chemical route. The films were characterized for their structural, morphological, wettability and electrochemical properties using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), scanning electron microscopy techniques (SEM), transmission electron microscopy (TEM), contact angle measurement, and cyclic voltammetry techniques. The XRD study revealed the deposited films were nanocrystalline with tetragonal rutile structure of SnO2. The FT-IR studies confirmed the formation of SnO2 with the characteristic vibrational mode of Sn-O. The SEM studies showed formation of loosely connected agglomerates with average size of 5-10nm as observed from TEM studies. The surface wettability showed the hydrophilic nature of SnO2 thin film (water contact angle 9 degree ). The SnO2 showed a maximum specific capacitance of 66Fg-1 in 0.5 Na2SO4 electrolyte at 10mVs-1 scan rate. |
doi_str_mv | 10.1016/j.apsusc.2011.06.043 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1671301420</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1671301420</sourcerecordid><originalsourceid>FETCH-LOGICAL-c244t-bb31ef482ded54d5724b9dea8dd22549c9a7893239bb3da4ea70210dd427da773</originalsourceid><addsrcrecordid>eNo9kMtqwzAQRUVpoWnaP-hCm0I3dvXya1lCXxDIoulaTCSZKNiyq7EX-fsqJHQ1DHPuDHMIeeQs54yXL4ccRpzR5IJxnrMyZ0pekQWvK5kVRa2uySJhTaakFLfkDvHAGBdpuiDb1d713kBH8RimvUOPdGhpgDCYeMQJus4HR7_DRtBp7wNtfdcjbYdIcR5dNDCC8VNqYRy7tGjyQ7gnNy106B4udUl-3t-2q89svfn4Wr2uMyOUmrLdTnLXqlpYZwtli0qoXWMd1NYKUajGNFDVjRSySaQF5aBigjNrlagsVJVckufz3jEOv7PDSfcejes6CG6YUfOy4pJxJVhC1Rk1cUCMrtVj9D3Eo-ZMnyTqgz5L1CeJmpU6SUyxp8sFwCSpjRCMx_9sekNJzqX8Ax7adcA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1671301420</pqid></control><display><type>article</type><title>Chemical synthesis of nanocrystalline SnO2 thin films for supercapacitor application</title><source>Elsevier ScienceDirect Journals Complete</source><creator>PUSAWALE, S. N ; DESHMUKH, P. R ; LOKHANDE, C. D</creator><creatorcontrib>PUSAWALE, S. N ; DESHMUKH, P. R ; LOKHANDE, C. D</creatorcontrib><description>Nanocrystalline SnO2 thin films were deposited by simple and inexpensive chemical route. The films were characterized for their structural, morphological, wettability and electrochemical properties using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), scanning electron microscopy techniques (SEM), transmission electron microscopy (TEM), contact angle measurement, and cyclic voltammetry techniques. The XRD study revealed the deposited films were nanocrystalline with tetragonal rutile structure of SnO2. The FT-IR studies confirmed the formation of SnO2 with the characteristic vibrational mode of Sn-O. The SEM studies showed formation of loosely connected agglomerates with average size of 5-10nm as observed from TEM studies. The surface wettability showed the hydrophilic nature of SnO2 thin film (water contact angle 9 degree ). The SnO2 showed a maximum specific capacitance of 66Fg-1 in 0.5 Na2SO4 electrolyte at 10mVs-1 scan rate.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2011.06.043</identifier><language>eng</language><publisher>Amsterdam: Elsevier</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Contact angle ; Exact sciences and technology ; Nanocrystals ; Physics ; Scanning electron microscopy ; Single-crystal and powder diffraction ; Solid-fluid interfaces ; Structure and morphology; thickness ; Structure of solids and liquids; crystallography ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology ; Thin films ; Tin dioxide ; Tin oxides ; Transmission electron microscopy ; Wettability ; Wetting ; X-ray diffraction and scattering</subject><ispartof>Applied surface science, 2011-09, Vol.257 (22), p.9498-9502</ispartof><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c244t-bb31ef482ded54d5724b9dea8dd22549c9a7893239bb3da4ea70210dd427da773</citedby><cites>FETCH-LOGICAL-c244t-bb31ef482ded54d5724b9dea8dd22549c9a7893239bb3da4ea70210dd427da773</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=24443113$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>PUSAWALE, S. N</creatorcontrib><creatorcontrib>DESHMUKH, P. R</creatorcontrib><creatorcontrib>LOKHANDE, C. D</creatorcontrib><title>Chemical synthesis of nanocrystalline SnO2 thin films for supercapacitor application</title><title>Applied surface science</title><description>Nanocrystalline SnO2 thin films were deposited by simple and inexpensive chemical route. The films were characterized for their structural, morphological, wettability and electrochemical properties using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), scanning electron microscopy techniques (SEM), transmission electron microscopy (TEM), contact angle measurement, and cyclic voltammetry techniques. The XRD study revealed the deposited films were nanocrystalline with tetragonal rutile structure of SnO2. The FT-IR studies confirmed the formation of SnO2 with the characteristic vibrational mode of Sn-O. The SEM studies showed formation of loosely connected agglomerates with average size of 5-10nm as observed from TEM studies. The surface wettability showed the hydrophilic nature of SnO2 thin film (water contact angle 9 degree ). The SnO2 showed a maximum specific capacitance of 66Fg-1 in 0.5 Na2SO4 electrolyte at 10mVs-1 scan rate.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Contact angle</subject><subject>Exact sciences and technology</subject><subject>Nanocrystals</subject><subject>Physics</subject><subject>Scanning electron microscopy</subject><subject>Single-crystal and powder diffraction</subject><subject>Solid-fluid interfaces</subject><subject>Structure and morphology; thickness</subject><subject>Structure of solids and liquids; crystallography</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><subject>Thin films</subject><subject>Tin dioxide</subject><subject>Tin oxides</subject><subject>Transmission electron microscopy</subject><subject>Wettability</subject><subject>Wetting</subject><subject>X-ray diffraction and scattering</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNo9kMtqwzAQRUVpoWnaP-hCm0I3dvXya1lCXxDIoulaTCSZKNiyq7EX-fsqJHQ1DHPuDHMIeeQs54yXL4ccRpzR5IJxnrMyZ0pekQWvK5kVRa2uySJhTaakFLfkDvHAGBdpuiDb1d713kBH8RimvUOPdGhpgDCYeMQJus4HR7_DRtBp7wNtfdcjbYdIcR5dNDCC8VNqYRy7tGjyQ7gnNy106B4udUl-3t-2q89svfn4Wr2uMyOUmrLdTnLXqlpYZwtli0qoXWMd1NYKUajGNFDVjRSySaQF5aBigjNrlagsVJVckufz3jEOv7PDSfcejes6CG6YUfOy4pJxJVhC1Rk1cUCMrtVj9D3Eo-ZMnyTqgz5L1CeJmpU6SUyxp8sFwCSpjRCMx_9sekNJzqX8Ax7adcA</recordid><startdate>20110901</startdate><enddate>20110901</enddate><creator>PUSAWALE, S. N</creator><creator>DESHMUKH, P. R</creator><creator>LOKHANDE, C. D</creator><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20110901</creationdate><title>Chemical synthesis of nanocrystalline SnO2 thin films for supercapacitor application</title><author>PUSAWALE, S. N ; DESHMUKH, P. R ; LOKHANDE, C. D</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c244t-bb31ef482ded54d5724b9dea8dd22549c9a7893239bb3da4ea70210dd427da773</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Contact angle</topic><topic>Exact sciences and technology</topic><topic>Nanocrystals</topic><topic>Physics</topic><topic>Scanning electron microscopy</topic><topic>Single-crystal and powder diffraction</topic><topic>Solid-fluid interfaces</topic><topic>Structure and morphology; thickness</topic><topic>Structure of solids and liquids; crystallography</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><topic>Thin films</topic><topic>Tin dioxide</topic><topic>Tin oxides</topic><topic>Transmission electron microscopy</topic><topic>Wettability</topic><topic>Wetting</topic><topic>X-ray diffraction and scattering</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>PUSAWALE, S. N</creatorcontrib><creatorcontrib>DESHMUKH, P. R</creatorcontrib><creatorcontrib>LOKHANDE, C. D</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>PUSAWALE, S. N</au><au>DESHMUKH, P. R</au><au>LOKHANDE, C. D</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Chemical synthesis of nanocrystalline SnO2 thin films for supercapacitor application</atitle><jtitle>Applied surface science</jtitle><date>2011-09-01</date><risdate>2011</risdate><volume>257</volume><issue>22</issue><spage>9498</spage><epage>9502</epage><pages>9498-9502</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>Nanocrystalline SnO2 thin films were deposited by simple and inexpensive chemical route. The films were characterized for their structural, morphological, wettability and electrochemical properties using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), scanning electron microscopy techniques (SEM), transmission electron microscopy (TEM), contact angle measurement, and cyclic voltammetry techniques. The XRD study revealed the deposited films were nanocrystalline with tetragonal rutile structure of SnO2. The FT-IR studies confirmed the formation of SnO2 with the characteristic vibrational mode of Sn-O. The SEM studies showed formation of loosely connected agglomerates with average size of 5-10nm as observed from TEM studies. The surface wettability showed the hydrophilic nature of SnO2 thin film (water contact angle 9 degree ). The SnO2 showed a maximum specific capacitance of 66Fg-1 in 0.5 Na2SO4 electrolyte at 10mVs-1 scan rate.</abstract><cop>Amsterdam</cop><pub>Elsevier</pub><doi>10.1016/j.apsusc.2011.06.043</doi><tpages>5</tpages></addata></record> |
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subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Contact angle Exact sciences and technology Nanocrystals Physics Scanning electron microscopy Single-crystal and powder diffraction Solid-fluid interfaces Structure and morphology thickness Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Thin films Tin dioxide Tin oxides Transmission electron microscopy Wettability Wetting X-ray diffraction and scattering |
title | Chemical synthesis of nanocrystalline SnO2 thin films for supercapacitor application |
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