Effects of Be and Co addition on the growth of Sn whiskers and the properties of Sn-based Pb-free solders
To enhance the reliability of Pb-free solders in high temperature and high humidity conditions, the minor alloying elements of Be and Co are investigated in terms of the growth of Sn whiskers and various properties of Sn-based Pb-free solders. Sn whisker growth is suppressed by adding up to 0.02 wt%...
Gespeichert in:
Veröffentlicht in: | Journal of materials research 2012-07, Vol.27 (14), p.1877-1886 |
---|---|
Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1886 |
---|---|
container_issue | 14 |
container_start_page | 1877 |
container_title | Journal of materials research |
container_volume | 27 |
creator | Chang, Jaewon Seo, Sun-Kyoung Cho, Moon Gi Lee, Dong Nyung Kang, Kyoo-Sik Lee, Hyuck Mo |
description | To enhance the reliability of Pb-free solders in high temperature and high humidity conditions, the minor alloying elements of Be and Co are investigated in terms of the growth of Sn whiskers and various properties of Sn-based Pb-free solders. Sn whisker growth is suppressed by adding up to 0.02 wt% Be to Sn-based solders. Adding Be and Co can effectively reduce the undercooling of Sn–1.0Ag–0.5Cu (wt%) solders. And the microstructures of Sn–1.0Ag–0.5Cu–0.02Be solders are similar to those of Sn–1.0Ag–0.5Cu. Furthermore, adding Co to solders increases the microhardness number as a result of the solid solution hardening. Adding Be causes no changes in the morphology or thickness of Cu6Sn5 at the Cu/OSP (organic solderability preservative) under bump metallurgy interface. However, the scallop-like Cu6Sn5 microstructure changes to a flat (Cu,Co)6Sn5 microstructure when 0.05 wt% of Co is added to Sn–1.0Ag–0.5Cu–0.02Be solders. |
doi_str_mv | 10.1557/jmr.2012.182 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1671289906</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1557_jmr_2012_182</cupid><sourcerecordid>2706808891</sourcerecordid><originalsourceid>FETCH-LOGICAL-c373t-99d41222bd67a7baed0ff8d3278f7e3950a6c149222ac0841e0e21cf8b5549693</originalsourceid><addsrcrecordid>eNqF0E9LwzAYBvAgCs7pzQ8Q8OLB1iRNm-aoY_6BgYJ6LmnzZutsm5l0DL-9qd1BRBBeyOH95eHlQeickpimqbhety5mhLKY5uwATRjhPEoTlh2iCclzHjFJ-TE68X5NCE2J4BNUz42BqvfYGnwLWHUazyxWWtd9bTscpl8BXjq761eDeenwblX7d3D-Gw_bjbMbcH0NfhRRqTxo_FxGxgFgbxsd-Ck6MqrxcLZ_p-jtbv46e4gWT_ePs5tFVCUi6SMpNaeMsVJnQolSgSbG5DphIjcCEpkSlVWUy0BURXJOgQCjlcnLNOUyk8kUXY654ayPLfi-aGtfQdOoDuzWFzQTlOVSkizQi190bbeuC9cVlDDOhCR8UFejqpz13oEpNq5ulfsMqBh6L0LvxdB7EXoPPBq5D6xbgvsZ-qeP9_GqLV2tl_DPhy-Ai5JX</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1024279046</pqid></control><display><type>article</type><title>Effects of Be and Co addition on the growth of Sn whiskers and the properties of Sn-based Pb-free solders</title><source>Springer Nature - Complete Springer Journals</source><source>Cambridge University Press Journals Complete</source><creator>Chang, Jaewon ; Seo, Sun-Kyoung ; Cho, Moon Gi ; Lee, Dong Nyung ; Kang, Kyoo-Sik ; Lee, Hyuck Mo</creator><creatorcontrib>Chang, Jaewon ; Seo, Sun-Kyoung ; Cho, Moon Gi ; Lee, Dong Nyung ; Kang, Kyoo-Sik ; Lee, Hyuck Mo</creatorcontrib><description>To enhance the reliability of Pb-free solders in high temperature and high humidity conditions, the minor alloying elements of Be and Co are investigated in terms of the growth of Sn whiskers and various properties of Sn-based Pb-free solders. Sn whisker growth is suppressed by adding up to 0.02 wt% Be to Sn-based solders. Adding Be and Co can effectively reduce the undercooling of Sn–1.0Ag–0.5Cu (wt%) solders. And the microstructures of Sn–1.0Ag–0.5Cu–0.02Be solders are similar to those of Sn–1.0Ag–0.5Cu. Furthermore, adding Co to solders increases the microhardness number as a result of the solid solution hardening. Adding Be causes no changes in the morphology or thickness of Cu6Sn5 at the Cu/OSP (organic solderability preservative) under bump metallurgy interface. However, the scallop-like Cu6Sn5 microstructure changes to a flat (Cu,Co)6Sn5 microstructure when 0.05 wt% of Co is added to Sn–1.0Ag–0.5Cu–0.02Be solders.</description><identifier>ISSN: 0884-2914</identifier><identifier>EISSN: 2044-5326</identifier><identifier>DOI: 10.1557/jmr.2012.182</identifier><identifier>CODEN: JMREEE</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Applied and Technical Physics ; Biomaterials ; Cooling ; Experiments ; High temperature ; Humidity ; Inorganic Chemistry ; Intermetallic compounds ; Lead (metal) ; Materials Engineering ; Materials research ; Materials Science ; Mechanical properties ; Nanotechnology ; Solders ; Studies ; Tin ; Toxicity</subject><ispartof>Journal of materials research, 2012-07, Vol.27 (14), p.1877-1886</ispartof><rights>Copyright © Materials Research Society 2012</rights><rights>The Materials Research Society 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c373t-99d41222bd67a7baed0ff8d3278f7e3950a6c149222ac0841e0e21cf8b5549693</citedby><cites>FETCH-LOGICAL-c373t-99d41222bd67a7baed0ff8d3278f7e3950a6c149222ac0841e0e21cf8b5549693</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1557/jmr.2012.182$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S0884291412001823/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,776,780,27901,27902,41464,42533,51294,55603</link.rule.ids></links><search><creatorcontrib>Chang, Jaewon</creatorcontrib><creatorcontrib>Seo, Sun-Kyoung</creatorcontrib><creatorcontrib>Cho, Moon Gi</creatorcontrib><creatorcontrib>Lee, Dong Nyung</creatorcontrib><creatorcontrib>Kang, Kyoo-Sik</creatorcontrib><creatorcontrib>Lee, Hyuck Mo</creatorcontrib><title>Effects of Be and Co addition on the growth of Sn whiskers and the properties of Sn-based Pb-free solders</title><title>Journal of materials research</title><addtitle>Journal of Materials Research</addtitle><description>To enhance the reliability of Pb-free solders in high temperature and high humidity conditions, the minor alloying elements of Be and Co are investigated in terms of the growth of Sn whiskers and various properties of Sn-based Pb-free solders. Sn whisker growth is suppressed by adding up to 0.02 wt% Be to Sn-based solders. Adding Be and Co can effectively reduce the undercooling of Sn–1.0Ag–0.5Cu (wt%) solders. And the microstructures of Sn–1.0Ag–0.5Cu–0.02Be solders are similar to those of Sn–1.0Ag–0.5Cu. Furthermore, adding Co to solders increases the microhardness number as a result of the solid solution hardening. Adding Be causes no changes in the morphology or thickness of Cu6Sn5 at the Cu/OSP (organic solderability preservative) under bump metallurgy interface. However, the scallop-like Cu6Sn5 microstructure changes to a flat (Cu,Co)6Sn5 microstructure when 0.05 wt% of Co is added to Sn–1.0Ag–0.5Cu–0.02Be solders.</description><subject>Applied and Technical Physics</subject><subject>Biomaterials</subject><subject>Cooling</subject><subject>Experiments</subject><subject>High temperature</subject><subject>Humidity</subject><subject>Inorganic Chemistry</subject><subject>Intermetallic compounds</subject><subject>Lead (metal)</subject><subject>Materials Engineering</subject><subject>Materials research</subject><subject>Materials Science</subject><subject>Mechanical properties</subject><subject>Nanotechnology</subject><subject>Solders</subject><subject>Studies</subject><subject>Tin</subject><subject>Toxicity</subject><issn>0884-2914</issn><issn>2044-5326</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNqF0E9LwzAYBvAgCs7pzQ8Q8OLB1iRNm-aoY_6BgYJ6LmnzZutsm5l0DL-9qd1BRBBeyOH95eHlQeickpimqbhety5mhLKY5uwATRjhPEoTlh2iCclzHjFJ-TE68X5NCE2J4BNUz42BqvfYGnwLWHUazyxWWtd9bTscpl8BXjq761eDeenwblX7d3D-Gw_bjbMbcH0NfhRRqTxo_FxGxgFgbxsd-Ck6MqrxcLZ_p-jtbv46e4gWT_ePs5tFVCUi6SMpNaeMsVJnQolSgSbG5DphIjcCEpkSlVWUy0BURXJOgQCjlcnLNOUyk8kUXY654ayPLfi-aGtfQdOoDuzWFzQTlOVSkizQi190bbeuC9cVlDDOhCR8UFejqpz13oEpNq5ulfsMqBh6L0LvxdB7EXoPPBq5D6xbgvsZ-qeP9_GqLV2tl_DPhy-Ai5JX</recordid><startdate>20120728</startdate><enddate>20120728</enddate><creator>Chang, Jaewon</creator><creator>Seo, Sun-Kyoung</creator><creator>Cho, Moon Gi</creator><creator>Lee, Dong Nyung</creator><creator>Kang, Kyoo-Sik</creator><creator>Lee, Hyuck Mo</creator><general>Cambridge University Press</general><general>Springer International Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>0U~</scope><scope>1-H</scope><scope>3V.</scope><scope>7SR</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>K60</scope><scope>K6~</scope><scope>KB.</scope><scope>L.-</scope><scope>L.0</scope><scope>M0C</scope><scope>PDBOC</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>Q9U</scope><scope>S0W</scope></search><sort><creationdate>20120728</creationdate><title>Effects of Be and Co addition on the growth of Sn whiskers and the properties of Sn-based Pb-free solders</title><author>Chang, Jaewon ; Seo, Sun-Kyoung ; Cho, Moon Gi ; Lee, Dong Nyung ; Kang, Kyoo-Sik ; Lee, Hyuck Mo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c373t-99d41222bd67a7baed0ff8d3278f7e3950a6c149222ac0841e0e21cf8b5549693</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Applied and Technical Physics</topic><topic>Biomaterials</topic><topic>Cooling</topic><topic>Experiments</topic><topic>High temperature</topic><topic>Humidity</topic><topic>Inorganic Chemistry</topic><topic>Intermetallic compounds</topic><topic>Lead (metal)</topic><topic>Materials Engineering</topic><topic>Materials research</topic><topic>Materials Science</topic><topic>Mechanical properties</topic><topic>Nanotechnology</topic><topic>Solders</topic><topic>Studies</topic><topic>Tin</topic><topic>Toxicity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chang, Jaewon</creatorcontrib><creatorcontrib>Seo, Sun-Kyoung</creatorcontrib><creatorcontrib>Cho, Moon Gi</creatorcontrib><creatorcontrib>Lee, Dong Nyung</creatorcontrib><creatorcontrib>Kang, Kyoo-Sik</creatorcontrib><creatorcontrib>Lee, Hyuck Mo</creatorcontrib><collection>CrossRef</collection><collection>Global News & ABI/Inform Professional</collection><collection>Trade PRO</collection><collection>ProQuest Central (Corporate)</collection><collection>Engineered Materials Abstracts</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Materials Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ABI/INFORM Professional Standard</collection><collection>ABI/INFORM Global</collection><collection>Materials Science Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central Basic</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials research</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chang, Jaewon</au><au>Seo, Sun-Kyoung</au><au>Cho, Moon Gi</au><au>Lee, Dong Nyung</au><au>Kang, Kyoo-Sik</au><au>Lee, Hyuck Mo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of Be and Co addition on the growth of Sn whiskers and the properties of Sn-based Pb-free solders</atitle><jtitle>Journal of materials research</jtitle><stitle>Journal of Materials Research</stitle><date>2012-07-28</date><risdate>2012</risdate><volume>27</volume><issue>14</issue><spage>1877</spage><epage>1886</epage><pages>1877-1886</pages><issn>0884-2914</issn><eissn>2044-5326</eissn><coden>JMREEE</coden><abstract>To enhance the reliability of Pb-free solders in high temperature and high humidity conditions, the minor alloying elements of Be and Co are investigated in terms of the growth of Sn whiskers and various properties of Sn-based Pb-free solders. Sn whisker growth is suppressed by adding up to 0.02 wt% Be to Sn-based solders. Adding Be and Co can effectively reduce the undercooling of Sn–1.0Ag–0.5Cu (wt%) solders. And the microstructures of Sn–1.0Ag–0.5Cu–0.02Be solders are similar to those of Sn–1.0Ag–0.5Cu. Furthermore, adding Co to solders increases the microhardness number as a result of the solid solution hardening. Adding Be causes no changes in the morphology or thickness of Cu6Sn5 at the Cu/OSP (organic solderability preservative) under bump metallurgy interface. However, the scallop-like Cu6Sn5 microstructure changes to a flat (Cu,Co)6Sn5 microstructure when 0.05 wt% of Co is added to Sn–1.0Ag–0.5Cu–0.02Be solders.</abstract><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1557/jmr.2012.182</doi><tpages>10</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0884-2914 |
ispartof | Journal of materials research, 2012-07, Vol.27 (14), p.1877-1886 |
issn | 0884-2914 2044-5326 |
language | eng |
recordid | cdi_proquest_miscellaneous_1671289906 |
source | Springer Nature - Complete Springer Journals; Cambridge University Press Journals Complete |
subjects | Applied and Technical Physics Biomaterials Cooling Experiments High temperature Humidity Inorganic Chemistry Intermetallic compounds Lead (metal) Materials Engineering Materials research Materials Science Mechanical properties Nanotechnology Solders Studies Tin Toxicity |
title | Effects of Be and Co addition on the growth of Sn whiskers and the properties of Sn-based Pb-free solders |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T20%3A08%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effects%20of%20Be%20and%20Co%20addition%20on%20the%20growth%20of%20Sn%20whiskers%20and%20the%20properties%20of%20Sn-based%20Pb-free%20solders&rft.jtitle=Journal%20of%20materials%20research&rft.au=Chang,%20Jaewon&rft.date=2012-07-28&rft.volume=27&rft.issue=14&rft.spage=1877&rft.epage=1886&rft.pages=1877-1886&rft.issn=0884-2914&rft.eissn=2044-5326&rft.coden=JMREEE&rft_id=info:doi/10.1557/jmr.2012.182&rft_dat=%3Cproquest_cross%3E2706808891%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1024279046&rft_id=info:pmid/&rft_cupid=10_1557_jmr_2012_182&rfr_iscdi=true |