Structural properties of K x V2O5.nH2O nanocrystalline films

Structural properties of K x V2O5.nH2O nanocrystalline films

X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscope (AFM), Fourier transform infrared (FTIR) spectra and differential scanning calorimetry (DSC) were used to investigate the structure of K x V2O5.nH2O xerogel films (with 0.0a[control][curren] x

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Veröffentlicht in:Solid state sciences 2011-03, Vol.13 (3), p.590-595
Hauptverfasser: Negm, Samia E, Mady, HA, Moghny, ASAbdel, Abd-Rabo, A S, Bahgat, A A
Format: Artikel
Sprache:eng
Schlagworte:
Atomic force microscopes
Atomic force microscopy
Differential scanning calorimetry
Diffraction
Endothermic reactions
Nanocrystals
Sol gel process
Spectra
Transmission electron microscopy
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Zusammenfassung:X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscope (AFM), Fourier transform infrared (FTIR) spectra and differential scanning calorimetry (DSC) were used to investigate the structure of K x V2O5.nH2O xerogel films (with 0.0a[control][curren] x
ISSN:1293-2558
DOI:10.1016/j.solidstatesciences.2010.12.031