Three-dimensional profile measurement of small lens using subpixel localization with color grating

In this paper a measurement method of three-dimensional profiles and a reconstruction system using subpixel localization with color gratings projection is described. The system has the effects of identical contrast on gratings for easier identification, switchable picture-in-picture on the display,...

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Veröffentlicht in:	Optik (Stuttgart) 2010-12, Vol.121 (23), p.2122-2127
Hauptverfasser:	Lin, Chern-Sheng, Lin, Chia-Hau, Lin, Chi-Chin, Yeh, Mau-Shiun
Format:	Artikel
Sprache:	eng
Schlagworte:	Color Color gratings Exact sciences and technology Image contrast Lenses Localization Measurement methods Measurements common to several branches of physics and astronomy Metrology, measurements and laboratory procedures Physics Position (location) Projection Spatial dimensions (e.g.: position, lengths, volume, angles, displacements, including nanometer-scale displacements) Sub-pixel Three-dimensional profiles
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