Three-dimensional profile measurement of small lens using subpixel localization with color grating
In this paper a measurement method of three-dimensional profiles and a reconstruction system using subpixel localization with color gratings projection is described. The system has the effects of identical contrast on gratings for easier identification, switchable picture-in-picture on the display,...
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| Veröffentlicht in: | Optik (Stuttgart) 2010-12, Vol.121 (23), p.2122-2127 |
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| container_issue | 23 |
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| container_title | Optik (Stuttgart) |
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| creator | Lin, Chern-Sheng Lin, Chia-Hau Lin, Chi-Chin Yeh, Mau-Shiun |
| description | In this paper a measurement method of three-dimensional profiles and a reconstruction system using subpixel localization with color gratings projection is described. The system has the effects of identical contrast on gratings for easier identification, switchable picture-in-picture on the display, and adjustable gratings with an adjustment module.
The measurement method includes the following: the projection step; image extraction step; image fine-tuning step; subpixel localization processing step; and reconstruction step. A projection apparatus emits a grating towards a small lens under measurement, and forms a grating image on the small lens under measurement. The contrast values of the plurality of grating stripes of the grating image are identical. The grating image and picture-in-picture of a display can be fine-tuned and reconstruct the three-dimensional profiles of the small lens. This method can help improve measurement competence in the reverse engineering industry. |
| doi_str_mv | 10.1016/j.ijleo.2009.07.012 |
| format | Article |
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The measurement method includes the following: the projection step; image extraction step; image fine-tuning step; subpixel localization processing step; and reconstruction step. A projection apparatus emits a grating towards a small lens under measurement, and forms a grating image on the small lens under measurement. The contrast values of the plurality of grating stripes of the grating image are identical. The grating image and picture-in-picture of a display can be fine-tuned and reconstruct the three-dimensional profiles of the small lens. This method can help improve measurement competence in the reverse engineering industry.</description><identifier>ISSN: 0030-4026</identifier><identifier>EISSN: 1618-1336</identifier><identifier>DOI: 10.1016/j.ijleo.2009.07.012</identifier><identifier>CODEN: OTIKAJ</identifier><language>eng</language><publisher>Reutlingen: Elsevier GmbH</publisher><subject>Color ; Color gratings ; Exact sciences and technology ; Image contrast ; Lenses ; Localization ; Measurement methods ; Measurements common to several branches of physics and astronomy ; Metrology, measurements and laboratory procedures ; Physics ; Position (location) ; Projection ; Spatial dimensions (e.g.: position, lengths, volume, angles, displacements, including nanometer-scale displacements) ; Sub-pixel ; Three-dimensional profiles</subject><ispartof>Optik (Stuttgart), 2010-12, Vol.121 (23), p.2122-2127</ispartof><rights>2009 Elsevier GmbH</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c366t-d6823207fcc8388011083e4b6bce671703ca6d23aace35e6c7192b45a9aa5ce03</citedby><cites>FETCH-LOGICAL-c366t-d6823207fcc8388011083e4b6bce671703ca6d23aace35e6c7192b45a9aa5ce03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.ijleo.2009.07.012$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,777,781,3537,27905,27906,45976</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23598330$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lin, Chern-Sheng</creatorcontrib><creatorcontrib>Lin, Chia-Hau</creatorcontrib><creatorcontrib>Lin, Chi-Chin</creatorcontrib><creatorcontrib>Yeh, Mau-Shiun</creatorcontrib><title>Three-dimensional profile measurement of small lens using subpixel localization with color grating</title><title>Optik (Stuttgart)</title><description>In this paper a measurement method of three-dimensional profiles and a reconstruction system using subpixel localization with color gratings projection is described. The system has the effects of identical contrast on gratings for easier identification, switchable picture-in-picture on the display, and adjustable gratings with an adjustment module.
The measurement method includes the following: the projection step; image extraction step; image fine-tuning step; subpixel localization processing step; and reconstruction step. A projection apparatus emits a grating towards a small lens under measurement, and forms a grating image on the small lens under measurement. The contrast values of the plurality of grating stripes of the grating image are identical. The grating image and picture-in-picture of a display can be fine-tuned and reconstruct the three-dimensional profiles of the small lens. This method can help improve measurement competence in the reverse engineering industry.</description><subject>Color</subject><subject>Color gratings</subject><subject>Exact sciences and technology</subject><subject>Image contrast</subject><subject>Lenses</subject><subject>Localization</subject><subject>Measurement methods</subject><subject>Measurements common to several branches of physics and astronomy</subject><subject>Metrology, measurements and laboratory procedures</subject><subject>Physics</subject><subject>Position (location)</subject><subject>Projection</subject><subject>Spatial dimensions (e.g.: position, lengths, volume, angles, displacements, including nanometer-scale displacements)</subject><subject>Sub-pixel</subject><subject>Three-dimensional profiles</subject><issn>0030-4026</issn><issn>1618-1336</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp9UMtOwzAQtBBIlMcXcPEFiUvC2m7t9MABIV4SEhc4W46zaV05cbETXl-PSyuOnFaanZndGULOGJQMmLxclW7lMZQcYF6CKoHxPTJhklUFE0LukwmAgGIKXB6So5RWAKAUqAmpX5YRsWhch31yoTeermNonUfaoUljxLwYaGhp6oz31GcaHZPrFzSN9dp9YsaCNd59myHr6YcbltQGHyJdxAz1ixNy0Bqf8HQ3j8nr3e3LzUPx9Hz_eHP9VFgh5VA0suKCg2qtrURVAWNQCZzWsrYoFVMgrJENF8ZYFDOUVrE5r6czMzdmZhHEMbnY-uYAbyOmQXcuWfTe9BjGpFl24YoJNs1UsaXaGFKK2Op1dJ2JX5qB3jSqV_q3Ub1pVIPSudGsOt8dMCknbqPprUt_Ui5m80qIzSNXWx7mtO8Oo07WYW-xcRHtoJvg_r3zA6R9jsA</recordid><startdate>201012</startdate><enddate>201012</enddate><creator>Lin, Chern-Sheng</creator><creator>Lin, Chia-Hau</creator><creator>Lin, Chi-Chin</creator><creator>Yeh, Mau-Shiun</creator><general>Elsevier GmbH</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>201012</creationdate><title>Three-dimensional profile measurement of small lens using subpixel localization with color grating</title><author>Lin, Chern-Sheng ; Lin, Chia-Hau ; Lin, Chi-Chin ; Yeh, Mau-Shiun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c366t-d6823207fcc8388011083e4b6bce671703ca6d23aace35e6c7192b45a9aa5ce03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Color</topic><topic>Color gratings</topic><topic>Exact sciences and technology</topic><topic>Image contrast</topic><topic>Lenses</topic><topic>Localization</topic><topic>Measurement methods</topic><topic>Measurements common to several branches of physics and astronomy</topic><topic>Metrology, measurements and laboratory procedures</topic><topic>Physics</topic><topic>Position (location)</topic><topic>Projection</topic><topic>Spatial dimensions (e.g.: position, lengths, volume, angles, displacements, including nanometer-scale displacements)</topic><topic>Sub-pixel</topic><topic>Three-dimensional profiles</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lin, Chern-Sheng</creatorcontrib><creatorcontrib>Lin, Chia-Hau</creatorcontrib><creatorcontrib>Lin, Chi-Chin</creatorcontrib><creatorcontrib>Yeh, Mau-Shiun</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Optik (Stuttgart)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lin, Chern-Sheng</au><au>Lin, Chia-Hau</au><au>Lin, Chi-Chin</au><au>Yeh, Mau-Shiun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Three-dimensional profile measurement of small lens using subpixel localization with color grating</atitle><jtitle>Optik (Stuttgart)</jtitle><date>2010-12</date><risdate>2010</risdate><volume>121</volume><issue>23</issue><spage>2122</spage><epage>2127</epage><pages>2122-2127</pages><issn>0030-4026</issn><eissn>1618-1336</eissn><coden>OTIKAJ</coden><abstract>In this paper a measurement method of three-dimensional profiles and a reconstruction system using subpixel localization with color gratings projection is described. The system has the effects of identical contrast on gratings for easier identification, switchable picture-in-picture on the display, and adjustable gratings with an adjustment module.
The measurement method includes the following: the projection step; image extraction step; image fine-tuning step; subpixel localization processing step; and reconstruction step. A projection apparatus emits a grating towards a small lens under measurement, and forms a grating image on the small lens under measurement. The contrast values of the plurality of grating stripes of the grating image are identical. The grating image and picture-in-picture of a display can be fine-tuned and reconstruct the three-dimensional profiles of the small lens. This method can help improve measurement competence in the reverse engineering industry.</abstract><cop>Reutlingen</cop><pub>Elsevier GmbH</pub><doi>10.1016/j.ijleo.2009.07.012</doi><tpages>6</tpages></addata></record> |
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| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Color Color gratings Exact sciences and technology Image contrast Lenses Localization Measurement methods Measurements common to several branches of physics and astronomy Metrology, measurements and laboratory procedures Physics Position (location) Projection Spatial dimensions (e.g.: position, lengths, volume, angles, displacements, including nanometer-scale displacements) Sub-pixel Three-dimensional profiles |
| title | Three-dimensional profile measurement of small lens using subpixel localization with color grating |
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