The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect
A project funded by the European Commission which started in 1998 has been completed. The aim of this project was to establish a measurement system that allows the calibration of standard capacitors in terms of R/sub K-90/. The whole system comprises quantum Hall samples, an automated modular bridge...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2003-04, Vol.52 (2), p.563-568 |
|---|---|
| Hauptverfasser: | , , , , , , , , , , , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 568 |
|---|---|
| container_issue | 2 |
| container_start_page | 563 |
| container_title | IEEE transactions on instrumentation and measurement |
| container_volume | 52 |
| creator | Melcher, J. Schurr, J. Pierz, K. Williams, J.M. Giblin, S.P. Cabiati, F. Callegaro, L. Marullo-Reedtz, G. Cassiago, C. Jeckelmann, B. Jeanneret, B. Overney, F. Bohacek, J. Riha, J. Power, O. Murray, J. Nunes, M. Lobo, M. Godinho, I. |
| description | A project funded by the European Commission which started in 1998 has been completed. The aim of this project was to establish a measurement system that allows the calibration of standard capacitors in terms of R/sub K-90/. The whole system comprises quantum Hall samples, an automated modular bridge system, and devices to calibrate and characterize the set-up. The uncertainty for the calibration of a 10-pF capacitor is about one part in 10/sup 7/. |
| doi_str_mv | 10.1109/TIM.2003.810731 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_1671250627</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1202098</ieee_id><sourcerecordid>1671250627</sourcerecordid><originalsourceid>FETCH-LOGICAL-c350t-93fdfc826d668cc9ba4908bde74fe7563051084f3cc98a756d7a487caf6884033</originalsourceid><addsrcrecordid>eNp9kU1r3DAQhkVpoNuk5x56ET2UXLwZWbY-egvLphtIKYXtWczKI-rFtjaSDc2_r5YtFHroaZiZ550PXsbeC1gLAfZu__h1XQPItRGgpXjFVqJtdWWVql-zFYAwlW1a9Ya9zfkIAFo1esV-7X8S3y4pnggnfr_5vtvyU4pH8vNnPsZuGTDx_JJnGnmIic8F9zj0h4RzHyceQ0lP6PsZJ088l9Bh6jI_YKaOF-KseF5wmpeR73AYOIVQpt-wq4BDpnd_4jX78bDdb3bV07cvj5v7p8rLFubKytAFb2rVKWW8twdsLJhDR7oJpFsloRVgmiBLz2ApdBoboz0GZUwDUl6zT5e55avnhfLsxj57GgacKC7Z1UZZkMYW8Pa_oFBa1C2oWhf04z_oMS5pKm-4srTcrRQU6O4C-RRzThTcKfUjphcnwJ0dc8Uxd3bMXRwrig8XRU9Ef-kaarBG_gY6fpFe</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884350660</pqid></control><display><type>article</type><title>The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect</title><source>IEEE Xplore</source><creator>Melcher, J. ; Schurr, J. ; Pierz, K. ; Williams, J.M. ; Giblin, S.P. ; Cabiati, F. ; Callegaro, L. ; Marullo-Reedtz, G. ; Cassiago, C. ; Jeckelmann, B. ; Jeanneret, B. ; Overney, F. ; Bohacek, J. ; Riha, J. ; Power, O. ; Murray, J. ; Nunes, M. ; Lobo, M. ; Godinho, I.</creator><creatorcontrib>Melcher, J. ; Schurr, J. ; Pierz, K. ; Williams, J.M. ; Giblin, S.P. ; Cabiati, F. ; Callegaro, L. ; Marullo-Reedtz, G. ; Cassiago, C. ; Jeckelmann, B. ; Jeanneret, B. ; Overney, F. ; Bohacek, J. ; Riha, J. ; Power, O. ; Murray, J. ; Nunes, M. ; Lobo, M. ; Godinho, I.</creatorcontrib><description>A project funded by the European Commission which started in 1998 has been completed. The aim of this project was to establish a measurement system that allows the calibration of standard capacitors in terms of R/sub K-90/. The whole system comprises quantum Hall samples, an automated modular bridge system, and devices to calibrate and characterize the set-up. The uncertainty for the calibration of a 10-pF capacitor is about one part in 10/sup 7/.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.2003.810731</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Calibration ; Capacitors ; Devices ; Electrical resistance measurement ; Frequency measurement ; Hall effect ; Halls ; Instrumentation ; Laboratories ; Measurement standards ; Metrology ; Modular ; Quantum capacitance ; Quantum Hall effect ; Shape measurement</subject><ispartof>IEEE transactions on instrumentation and measurement, 2003-04, Vol.52 (2), p.563-568</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2003</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-93fdfc826d668cc9ba4908bde74fe7563051084f3cc98a756d7a487caf6884033</citedby><cites>FETCH-LOGICAL-c350t-93fdfc826d668cc9ba4908bde74fe7563051084f3cc98a756d7a487caf6884033</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1202098$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1202098$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Melcher, J.</creatorcontrib><creatorcontrib>Schurr, J.</creatorcontrib><creatorcontrib>Pierz, K.</creatorcontrib><creatorcontrib>Williams, J.M.</creatorcontrib><creatorcontrib>Giblin, S.P.</creatorcontrib><creatorcontrib>Cabiati, F.</creatorcontrib><creatorcontrib>Callegaro, L.</creatorcontrib><creatorcontrib>Marullo-Reedtz, G.</creatorcontrib><creatorcontrib>Cassiago, C.</creatorcontrib><creatorcontrib>Jeckelmann, B.</creatorcontrib><creatorcontrib>Jeanneret, B.</creatorcontrib><creatorcontrib>Overney, F.</creatorcontrib><creatorcontrib>Bohacek, J.</creatorcontrib><creatorcontrib>Riha, J.</creatorcontrib><creatorcontrib>Power, O.</creatorcontrib><creatorcontrib>Murray, J.</creatorcontrib><creatorcontrib>Nunes, M.</creatorcontrib><creatorcontrib>Lobo, M.</creatorcontrib><creatorcontrib>Godinho, I.</creatorcontrib><title>The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>A project funded by the European Commission which started in 1998 has been completed. The aim of this project was to establish a measurement system that allows the calibration of standard capacitors in terms of R/sub K-90/. The whole system comprises quantum Hall samples, an automated modular bridge system, and devices to calibrate and characterize the set-up. The uncertainty for the calibration of a 10-pF capacitor is about one part in 10/sup 7/.</description><subject>Calibration</subject><subject>Capacitors</subject><subject>Devices</subject><subject>Electrical resistance measurement</subject><subject>Frequency measurement</subject><subject>Hall effect</subject><subject>Halls</subject><subject>Instrumentation</subject><subject>Laboratories</subject><subject>Measurement standards</subject><subject>Metrology</subject><subject>Modular</subject><subject>Quantum capacitance</subject><subject>Quantum Hall effect</subject><subject>Shape measurement</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kU1r3DAQhkVpoNuk5x56ET2UXLwZWbY-egvLphtIKYXtWczKI-rFtjaSDc2_r5YtFHroaZiZ550PXsbeC1gLAfZu__h1XQPItRGgpXjFVqJtdWWVql-zFYAwlW1a9Ya9zfkIAFo1esV-7X8S3y4pnggnfr_5vtvyU4pH8vNnPsZuGTDx_JJnGnmIic8F9zj0h4RzHyceQ0lP6PsZJ088l9Bh6jI_YKaOF-KseF5wmpeR73AYOIVQpt-wq4BDpnd_4jX78bDdb3bV07cvj5v7p8rLFubKytAFb2rVKWW8twdsLJhDR7oJpFsloRVgmiBLz2ApdBoboz0GZUwDUl6zT5e55avnhfLsxj57GgacKC7Z1UZZkMYW8Pa_oFBa1C2oWhf04z_oMS5pKm-4srTcrRQU6O4C-RRzThTcKfUjphcnwJ0dc8Uxd3bMXRwrig8XRU9Ef-kaarBG_gY6fpFe</recordid><startdate>20030401</startdate><enddate>20030401</enddate><creator>Melcher, J.</creator><creator>Schurr, J.</creator><creator>Pierz, K.</creator><creator>Williams, J.M.</creator><creator>Giblin, S.P.</creator><creator>Cabiati, F.</creator><creator>Callegaro, L.</creator><creator>Marullo-Reedtz, G.</creator><creator>Cassiago, C.</creator><creator>Jeckelmann, B.</creator><creator>Jeanneret, B.</creator><creator>Overney, F.</creator><creator>Bohacek, J.</creator><creator>Riha, J.</creator><creator>Power, O.</creator><creator>Murray, J.</creator><creator>Nunes, M.</creator><creator>Lobo, M.</creator><creator>Godinho, I.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20030401</creationdate><title>The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect</title><author>Melcher, J. ; Schurr, J. ; Pierz, K. ; Williams, J.M. ; Giblin, S.P. ; Cabiati, F. ; Callegaro, L. ; Marullo-Reedtz, G. ; Cassiago, C. ; Jeckelmann, B. ; Jeanneret, B. ; Overney, F. ; Bohacek, J. ; Riha, J. ; Power, O. ; Murray, J. ; Nunes, M. ; Lobo, M. ; Godinho, I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-93fdfc826d668cc9ba4908bde74fe7563051084f3cc98a756d7a487caf6884033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Calibration</topic><topic>Capacitors</topic><topic>Devices</topic><topic>Electrical resistance measurement</topic><topic>Frequency measurement</topic><topic>Hall effect</topic><topic>Halls</topic><topic>Instrumentation</topic><topic>Laboratories</topic><topic>Measurement standards</topic><topic>Metrology</topic><topic>Modular</topic><topic>Quantum capacitance</topic><topic>Quantum Hall effect</topic><topic>Shape measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Melcher, J.</creatorcontrib><creatorcontrib>Schurr, J.</creatorcontrib><creatorcontrib>Pierz, K.</creatorcontrib><creatorcontrib>Williams, J.M.</creatorcontrib><creatorcontrib>Giblin, S.P.</creatorcontrib><creatorcontrib>Cabiati, F.</creatorcontrib><creatorcontrib>Callegaro, L.</creatorcontrib><creatorcontrib>Marullo-Reedtz, G.</creatorcontrib><creatorcontrib>Cassiago, C.</creatorcontrib><creatorcontrib>Jeckelmann, B.</creatorcontrib><creatorcontrib>Jeanneret, B.</creatorcontrib><creatorcontrib>Overney, F.</creatorcontrib><creatorcontrib>Bohacek, J.</creatorcontrib><creatorcontrib>Riha, J.</creatorcontrib><creatorcontrib>Power, O.</creatorcontrib><creatorcontrib>Murray, J.</creatorcontrib><creatorcontrib>Nunes, M.</creatorcontrib><creatorcontrib>Lobo, M.</creatorcontrib><creatorcontrib>Godinho, I.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Melcher, J.</au><au>Schurr, J.</au><au>Pierz, K.</au><au>Williams, J.M.</au><au>Giblin, S.P.</au><au>Cabiati, F.</au><au>Callegaro, L.</au><au>Marullo-Reedtz, G.</au><au>Cassiago, C.</au><au>Jeckelmann, B.</au><au>Jeanneret, B.</au><au>Overney, F.</au><au>Bohacek, J.</au><au>Riha, J.</au><au>Power, O.</au><au>Murray, J.</au><au>Nunes, M.</au><au>Lobo, M.</au><au>Godinho, I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2003-04-01</date><risdate>2003</risdate><volume>52</volume><issue>2</issue><spage>563</spage><epage>568</epage><pages>563-568</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>A project funded by the European Commission which started in 1998 has been completed. The aim of this project was to establish a measurement system that allows the calibration of standard capacitors in terms of R/sub K-90/. The whole system comprises quantum Hall samples, an automated modular bridge system, and devices to calibrate and characterize the set-up. The uncertainty for the calibration of a 10-pF capacitor is about one part in 10/sup 7/.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2003.810731</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9456 |
| ispartof | IEEE transactions on instrumentation and measurement, 2003-04, Vol.52 (2), p.563-568 |
| issn | 0018-9456 1557-9662 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1671250627 |
| source | IEEE Xplore |
| subjects | Calibration Capacitors Devices Electrical resistance measurement Frequency measurement Hall effect Halls Instrumentation Laboratories Measurement standards Metrology Modular Quantum capacitance Quantum Hall effect Shape measurement |
| title | The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-18T07%3A13%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20European%20ACQHE%20project:%20modular%20system%20for%20the%20calibration%20of%20capacitance%20standards%20based%20on%20the%20quantum%20Hall%20effect&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Melcher,%20J.&rft.date=2003-04-01&rft.volume=52&rft.issue=2&rft.spage=563&rft.epage=568&rft.pages=563-568&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/TIM.2003.810731&rft_dat=%3Cproquest_RIE%3E1671250627%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=884350660&rft_id=info:pmid/&rft_ieee_id=1202098&rfr_iscdi=true |