Prospects for development of nanometrology
The ensemble of possible and existing nano-objects and nanomaterials is treated as a multilevel multidimensional system. We introduce the quantitative and qualitative characteristics of elements of the system and give a graphical representation for it. A systems approach makes it possible to establi...
Gespeichert in:
| Veröffentlicht in: | Measurement techniques 2010-11, Vol.53 (8), p.845-851 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 851 |
|---|---|
| container_issue | 8 |
| container_start_page | 845 |
| container_title | Measurement techniques |
| container_volume | 53 |
| creator | Aleksandrov, V. S. Trunov, N. N. Lobashev, A. A. |
| description | The ensemble of possible and existing nano-objects and nanomaterials is treated as a multilevel multidimensional system. We introduce the quantitative and qualitative characteristics of elements of the system and give a graphical representation for it. A systems approach makes it possible to establish a basis for a continuously updateable and refineable database including the important properties of nano-objects and their interconnections. Creation of such a database is expedient for dynamic data support of nanometrology in its fundamental and applied aspects. |
| doi_str_mv | 10.1007/s11018-010-9586-7 |
| format | Article |
| fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_miscellaneous_1671234675</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A363382422</galeid><sourcerecordid>A363382422</sourcerecordid><originalsourceid>FETCH-LOGICAL-c373t-bea0b3ba19a8a80bd189d7a05ed47e324497dfdd55a37586c6fdc8b9bb23200a3</originalsourceid><addsrcrecordid>eNp1kV1LwzAUhoMoOKc_wLvhlQqdJ0mbNJdj-DEYKH5ch7Q5HR1tM5NO3L83o4IoSC4OhOc5vJyXkHMKUwogbwKlQPMEKCQqy0UiD8iIZpInuQJxSEaQpTyhSrJjchLCGgC4FGpErp-8Cxss-zCpnJ9Y_MDGbVrs-omrJp3pXIu9d41b7U7JUWWagGffc0ze7m5f5w_J8vF-MZ8tk5JL3icFGih4YagyucmhsDRXVhrI0KYSOUtTJW1lbZYZLmPUUlS2zAtVFIwzAMPH5HLYu_HufYuh120dSmwa06HbBk2FpIynQmYRvfiDrt3WdzGdVoyCEoLvoekArUyDuu4q13tTxmexrUvXYVXH_xkXnOcsZSwKV7-EyPT42a_MNgS9eHn-zdKBLeMdg8dKb3zdGr_TFPS-GT00o2Mzet-MltFhgxMi263Q_6T-X_oCsdqOlg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>921096635</pqid></control><display><type>article</type><title>Prospects for development of nanometrology</title><source>Springer Online Journals Complete</source><creator>Aleksandrov, V. S. ; Trunov, N. N. ; Lobashev, A. A.</creator><creatorcontrib>Aleksandrov, V. S. ; Trunov, N. N. ; Lobashev, A. A.</creatorcontrib><description>The ensemble of possible and existing nano-objects and nanomaterials is treated as a multilevel multidimensional system. We introduce the quantitative and qualitative characteristics of elements of the system and give a graphical representation for it. A systems approach makes it possible to establish a basis for a continuously updateable and refineable database including the important properties of nano-objects and their interconnections. Creation of such a database is expedient for dynamic data support of nanometrology in its fundamental and applied aspects.</description><identifier>ISSN: 0543-1972</identifier><identifier>EISSN: 1573-8906</identifier><identifier>DOI: 10.1007/s11018-010-9586-7</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Analytical Chemistry ; Characterization and Evaluation of Materials ; Data compression ; Dynamical systems ; Dynamics ; Measurement Science and Instrumentation ; Measurement techniques ; Multilevel ; Nanocomposites ; Nanomaterials ; Nanometrology ; Nanoparticles ; Nanostructure ; Nanotechnology ; Physical Chemistry ; Physics ; Physics and Astronomy ; Quantum dots ; Science</subject><ispartof>Measurement techniques, 2010-11, Vol.53 (8), p.845-851</ispartof><rights>Springer Science+Business Media, Inc. 2010</rights><rights>COPYRIGHT 2010 Springer</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c373t-bea0b3ba19a8a80bd189d7a05ed47e324497dfdd55a37586c6fdc8b9bb23200a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11018-010-9586-7$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11018-010-9586-7$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Aleksandrov, V. S.</creatorcontrib><creatorcontrib>Trunov, N. N.</creatorcontrib><creatorcontrib>Lobashev, A. A.</creatorcontrib><title>Prospects for development of nanometrology</title><title>Measurement techniques</title><addtitle>Meas Tech</addtitle><description>The ensemble of possible and existing nano-objects and nanomaterials is treated as a multilevel multidimensional system. We introduce the quantitative and qualitative characteristics of elements of the system and give a graphical representation for it. A systems approach makes it possible to establish a basis for a continuously updateable and refineable database including the important properties of nano-objects and their interconnections. Creation of such a database is expedient for dynamic data support of nanometrology in its fundamental and applied aspects.</description><subject>Analytical Chemistry</subject><subject>Characterization and Evaluation of Materials</subject><subject>Data compression</subject><subject>Dynamical systems</subject><subject>Dynamics</subject><subject>Measurement Science and Instrumentation</subject><subject>Measurement techniques</subject><subject>Multilevel</subject><subject>Nanocomposites</subject><subject>Nanomaterials</subject><subject>Nanometrology</subject><subject>Nanoparticles</subject><subject>Nanostructure</subject><subject>Nanotechnology</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Quantum dots</subject><subject>Science</subject><issn>0543-1972</issn><issn>1573-8906</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kV1LwzAUhoMoOKc_wLvhlQqdJ0mbNJdj-DEYKH5ch7Q5HR1tM5NO3L83o4IoSC4OhOc5vJyXkHMKUwogbwKlQPMEKCQqy0UiD8iIZpInuQJxSEaQpTyhSrJjchLCGgC4FGpErp-8Cxss-zCpnJ9Y_MDGbVrs-omrJp3pXIu9d41b7U7JUWWagGffc0ze7m5f5w_J8vF-MZ8tk5JL3icFGih4YagyucmhsDRXVhrI0KYSOUtTJW1lbZYZLmPUUlS2zAtVFIwzAMPH5HLYu_HufYuh120dSmwa06HbBk2FpIynQmYRvfiDrt3WdzGdVoyCEoLvoekArUyDuu4q13tTxmexrUvXYVXH_xkXnOcsZSwKV7-EyPT42a_MNgS9eHn-zdKBLeMdg8dKb3zdGr_TFPS-GT00o2Mzet-MltFhgxMi263Q_6T-X_oCsdqOlg</recordid><startdate>20101101</startdate><enddate>20101101</enddate><creator>Aleksandrov, V. S.</creator><creator>Trunov, N. N.</creator><creator>Lobashev, A. A.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope><scope>3V.</scope><scope>7U5</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>88I</scope><scope>8AL</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>L7M</scope><scope>M0C</scope><scope>M0N</scope><scope>M2P</scope><scope>M7S</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>PYYUZ</scope><scope>Q9U</scope></search><sort><creationdate>20101101</creationdate><title>Prospects for development of nanometrology</title><author>Aleksandrov, V. S. ; Trunov, N. N. ; Lobashev, A. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c373t-bea0b3ba19a8a80bd189d7a05ed47e324497dfdd55a37586c6fdc8b9bb23200a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Analytical Chemistry</topic><topic>Characterization and Evaluation of Materials</topic><topic>Data compression</topic><topic>Dynamical systems</topic><topic>Dynamics</topic><topic>Measurement Science and Instrumentation</topic><topic>Measurement techniques</topic><topic>Multilevel</topic><topic>Nanocomposites</topic><topic>Nanomaterials</topic><topic>Nanometrology</topic><topic>Nanoparticles</topic><topic>Nanostructure</topic><topic>Nanotechnology</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Quantum dots</topic><topic>Science</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Aleksandrov, V. S.</creatorcontrib><creatorcontrib>Trunov, N. N.</creatorcontrib><creatorcontrib>Lobashev, A. A.</creatorcontrib><collection>CrossRef</collection><collection>Gale In Context: Science</collection><collection>ProQuest Central (Corporate)</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>ABI/INFORM Collection China</collection><collection>ProQuest Central Basic</collection><jtitle>Measurement techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Aleksandrov, V. S.</au><au>Trunov, N. N.</au><au>Lobashev, A. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Prospects for development of nanometrology</atitle><jtitle>Measurement techniques</jtitle><stitle>Meas Tech</stitle><date>2010-11-01</date><risdate>2010</risdate><volume>53</volume><issue>8</issue><spage>845</spage><epage>851</epage><pages>845-851</pages><issn>0543-1972</issn><eissn>1573-8906</eissn><abstract>The ensemble of possible and existing nano-objects and nanomaterials is treated as a multilevel multidimensional system. We introduce the quantitative and qualitative characteristics of elements of the system and give a graphical representation for it. A systems approach makes it possible to establish a basis for a continuously updateable and refineable database including the important properties of nano-objects and their interconnections. Creation of such a database is expedient for dynamic data support of nanometrology in its fundamental and applied aspects.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s11018-010-9586-7</doi><tpages>7</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0543-1972 |
| ispartof | Measurement techniques, 2010-11, Vol.53 (8), p.845-851 |
| issn | 0543-1972 1573-8906 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1671234675 |
| source | Springer Online Journals Complete |
| subjects | Analytical Chemistry Characterization and Evaluation of Materials Data compression Dynamical systems Dynamics Measurement Science and Instrumentation Measurement techniques Multilevel Nanocomposites Nanomaterials Nanometrology Nanoparticles Nanostructure Nanotechnology Physical Chemistry Physics Physics and Astronomy Quantum dots Science |
| title | Prospects for development of nanometrology |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T16%3A35%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Prospects%20for%20development%20of%20nanometrology&rft.jtitle=Measurement%20techniques&rft.au=Aleksandrov,%20V.%20S.&rft.date=2010-11-01&rft.volume=53&rft.issue=8&rft.spage=845&rft.epage=851&rft.pages=845-851&rft.issn=0543-1972&rft.eissn=1573-8906&rft_id=info:doi/10.1007/s11018-010-9586-7&rft_dat=%3Cgale_proqu%3EA363382422%3C/gale_proqu%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=921096635&rft_id=info:pmid/&rft_galeid=A363382422&rfr_iscdi=true |