Noise properties of thin-film Ni-P resistors embedded in printed circuit boards
Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply ) of 100 Ώ/sq. Noise of the selected pairs of samples...
Gespeichert in:
| Veröffentlicht in: | Bulletin of the Polish Academy of Sciences. Technical sciences 2013-09, Vol.61 (3), p.731-735 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 735 |
|---|---|
| container_issue | 3 |
| container_start_page | 731 |
| container_title | Bulletin of the Polish Academy of Sciences. Technical sciences |
| container_volume | 61 |
| creator | Stadler, A.W. Zawiślak, Z. Stęplewski, W. Dziedzic, A. |
| description | Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply
) of 100 Ώ/sq. Noise of the selected pairs of samples has been measured in the DC resistance bridge with a transformer as the first stage in a signal path. 1/f noise caused by resistance fluctuations has been found to be the main noise component. Parameters describing noise properties of the resistors have been calculated and then compared with the parameters of other previously studied thin- and thick-film resistive materials. |
| doi_str_mv | 10.2478/bpasts-2013-0078 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1669893318</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1669893318</sourcerecordid><originalsourceid>FETCH-LOGICAL-c354t-6cbf9340f1e7aeac4343d7afc523e4168cf06de9a569be8819909c4b343349a73</originalsourceid><addsrcrecordid>eNp1kM1LxDAQxYMouKx791jw4iWadNKkuQgifoHsetBzSNOpZum2a5Ii_vdmWQ8iOJd5h_eGNz9CTjm7KIWqL5utjSnSknGgjKn6gMxKYIxyzdUhmbESNFVVWR-TRYxrlgeAKwkzslqOPmKxDeMWQ_IYi7Er0rsfaOf7TbH09LkIGH1MY4gFbhpsW2wLP-SIH1KWzgc3-VQ0ow1tPCFHne0jLn72nLze3b7cPNCn1f3jzfUTdVCJRKVrOg2CdRyVResECGiV7VxVAgoua9cx2aK2ldQN1jXXmmknmmwDoa2COTnf383NPyaMyWx8dNj3dsBxioZLqWudv6yz9eyPdT1OYcjtDBeiAql2POaE7V0ujDEG7Ex-cGPDl-HM7CCbPWSzg2x2kHPkah_5tH3C0OJbmL6y-HX_n6jkoIDDN2_RhNs</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1445367000</pqid></control><display><type>article</type><title>Noise properties of thin-film Ni-P resistors embedded in printed circuit boards</title><source>DOAJ Directory of Open Access Journals</source><source>EZB-FREE-00999 freely available EZB journals</source><creator>Stadler, A.W. ; Zawiślak, Z. ; Stęplewski, W. ; Dziedzic, A.</creator><creatorcontrib>Stadler, A.W. ; Zawiślak, Z. ; Stęplewski, W. ; Dziedzic, A.</creatorcontrib><description>Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply
) of 100 Ώ/sq. Noise of the selected pairs of samples has been measured in the DC resistance bridge with a transformer as the first stage in a signal path. 1/f noise caused by resistance fluctuations has been found to be the main noise component. Parameters describing noise properties of the resistors have been calculated and then compared with the parameters of other previously studied thin- and thick-film resistive materials.</description><identifier>ISSN: 0239-7528</identifier><identifier>EISSN: 2300-1917</identifier><identifier>DOI: 10.2478/bpasts-2013-0078</identifier><language>eng</language><publisher>Warsaw: Versita</publisher><subject>1/f noise ; Boards ; Fluctuation ; low-frequency noise measurements ; Mathematical analysis ; Ni-P foil ; Nickel ; Noise ; Printed circuits ; Resistors ; Thin films ; thin-film resistors</subject><ispartof>Bulletin of the Polish Academy of Sciences. Technical sciences, 2013-09, Vol.61 (3), p.731-735</ispartof><rights>Copyright Versita Sep 2013</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,862,27907,27908</link.rule.ids></links><search><creatorcontrib>Stadler, A.W.</creatorcontrib><creatorcontrib>Zawiślak, Z.</creatorcontrib><creatorcontrib>Stęplewski, W.</creatorcontrib><creatorcontrib>Dziedzic, A.</creatorcontrib><title>Noise properties of thin-film Ni-P resistors embedded in printed circuit boards</title><title>Bulletin of the Polish Academy of Sciences. Technical sciences</title><description>Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply
) of 100 Ώ/sq. Noise of the selected pairs of samples has been measured in the DC resistance bridge with a transformer as the first stage in a signal path. 1/f noise caused by resistance fluctuations has been found to be the main noise component. Parameters describing noise properties of the resistors have been calculated and then compared with the parameters of other previously studied thin- and thick-film resistive materials.</description><subject>1/f noise</subject><subject>Boards</subject><subject>Fluctuation</subject><subject>low-frequency noise measurements</subject><subject>Mathematical analysis</subject><subject>Ni-P foil</subject><subject>Nickel</subject><subject>Noise</subject><subject>Printed circuits</subject><subject>Resistors</subject><subject>Thin films</subject><subject>thin-film resistors</subject><issn>0239-7528</issn><issn>2300-1917</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kM1LxDAQxYMouKx791jw4iWadNKkuQgifoHsetBzSNOpZum2a5Ii_vdmWQ8iOJd5h_eGNz9CTjm7KIWqL5utjSnSknGgjKn6gMxKYIxyzdUhmbESNFVVWR-TRYxrlgeAKwkzslqOPmKxDeMWQ_IYi7Er0rsfaOf7TbH09LkIGH1MY4gFbhpsW2wLP-SIH1KWzgc3-VQ0ow1tPCFHne0jLn72nLze3b7cPNCn1f3jzfUTdVCJRKVrOg2CdRyVResECGiV7VxVAgoua9cx2aK2ldQN1jXXmmknmmwDoa2COTnf383NPyaMyWx8dNj3dsBxioZLqWudv6yz9eyPdT1OYcjtDBeiAql2POaE7V0ujDEG7Ex-cGPDl-HM7CCbPWSzg2x2kHPkah_5tH3C0OJbmL6y-HX_n6jkoIDDN2_RhNs</recordid><startdate>20130901</startdate><enddate>20130901</enddate><creator>Stadler, A.W.</creator><creator>Zawiślak, Z.</creator><creator>Stęplewski, W.</creator><creator>Dziedzic, A.</creator><general>Versita</general><general>Polish Academy of Sciences</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>7SC</scope><scope>7SP</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20130901</creationdate><title>Noise properties of thin-film Ni-P resistors embedded in printed circuit boards</title><author>Stadler, A.W. ; Zawiślak, Z. ; Stęplewski, W. ; Dziedzic, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c354t-6cbf9340f1e7aeac4343d7afc523e4168cf06de9a569be8819909c4b343349a73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>1/f noise</topic><topic>Boards</topic><topic>Fluctuation</topic><topic>low-frequency noise measurements</topic><topic>Mathematical analysis</topic><topic>Ni-P foil</topic><topic>Nickel</topic><topic>Noise</topic><topic>Printed circuits</topic><topic>Resistors</topic><topic>Thin films</topic><topic>thin-film resistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Stadler, A.W.</creatorcontrib><creatorcontrib>Zawiślak, Z.</creatorcontrib><creatorcontrib>Stęplewski, W.</creatorcontrib><creatorcontrib>Dziedzic, A.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer Science Database</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>Bulletin of the Polish Academy of Sciences. Technical sciences</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Stadler, A.W.</au><au>Zawiślak, Z.</au><au>Stęplewski, W.</au><au>Dziedzic, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Noise properties of thin-film Ni-P resistors embedded in printed circuit boards</atitle><jtitle>Bulletin of the Polish Academy of Sciences. Technical sciences</jtitle><date>2013-09-01</date><risdate>2013</risdate><volume>61</volume><issue>3</issue><spage>731</spage><epage>735</epage><pages>731-735</pages><issn>0239-7528</issn><eissn>2300-1917</eissn><abstract>Noise studies of planar thin-film Ni-P resistors made in/on Printed Circuit Boards, both covered with two different types of cladding or uncladded have been described. The resistors have been made of the resistive-conductive-material (Ohmega-Ply
) of 100 Ώ/sq. Noise of the selected pairs of samples has been measured in the DC resistance bridge with a transformer as the first stage in a signal path. 1/f noise caused by resistance fluctuations has been found to be the main noise component. Parameters describing noise properties of the resistors have been calculated and then compared with the parameters of other previously studied thin- and thick-film resistive materials.</abstract><cop>Warsaw</cop><pub>Versita</pub><doi>10.2478/bpasts-2013-0078</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0239-7528 |
| ispartof | Bulletin of the Polish Academy of Sciences. Technical sciences, 2013-09, Vol.61 (3), p.731-735 |
| issn | 0239-7528 2300-1917 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1669893318 |
| source | DOAJ Directory of Open Access Journals; EZB-FREE-00999 freely available EZB journals |
| subjects | 1/f noise Boards Fluctuation low-frequency noise measurements Mathematical analysis Ni-P foil Nickel Noise Printed circuits Resistors Thin films thin-film resistors |
| title | Noise properties of thin-film Ni-P resistors embedded in printed circuit boards |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T08%3A32%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Noise%20properties%20of%20thin-film%20Ni-P%20resistors%20embedded%20in%20printed%20circuit%20boards&rft.jtitle=Bulletin%20of%20the%20Polish%20Academy%20of%20Sciences.%20Technical%20sciences&rft.au=Stadler,%20A.W.&rft.date=2013-09-01&rft.volume=61&rft.issue=3&rft.spage=731&rft.epage=735&rft.pages=731-735&rft.issn=0239-7528&rft.eissn=2300-1917&rft_id=info:doi/10.2478/bpasts-2013-0078&rft_dat=%3Cproquest_cross%3E1669893318%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1445367000&rft_id=info:pmid/&rfr_iscdi=true |