Two-dimensional bending vector sensor based on Mach-Zehnder interferometer of two orthogonal lateral-offsets
ABSTRACT A simple, compact bending vector sensor based on Mach–Zehnder interferometer (MZI) utilizing two orthogonal lateral‐offsets is proposed. The two‐dimensional bending vector sensing characteristics, including the curvature and four orthogonal directions, could be measured accurately and simul...
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Veröffentlicht in: | Microwave and optical technology letters 2015-03, Vol.57 (3), p.709-713 |
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creator | Zhang, Jianhao Zhang, Weigang Wang, Jiuzhen Huang, Shang Liu, Min Li, Jieliang Wang, Li |
description | ABSTRACT
A simple, compact bending vector sensor based on Mach–Zehnder interferometer (MZI) utilizing two orthogonal lateral‐offsets is proposed. The two‐dimensional bending vector sensing characteristics, including the curvature and four orthogonal directions, could be measured accurately and simultaneously by the MZI using a special data processing method. Besides, the impact of temperature on the MZI can be eliminated through constructing a matrix using the different response of two loss peak to the bending and temperature sensitivities. This research work would be helpful to develop the practicability of fiber bending vector sensors. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:709–713, 2015 |
doi_str_mv | 10.1002/mop.28937 |
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A simple, compact bending vector sensor based on Mach–Zehnder interferometer (MZI) utilizing two orthogonal lateral‐offsets is proposed. The two‐dimensional bending vector sensing characteristics, including the curvature and four orthogonal directions, could be measured accurately and simultaneously by the MZI using a special data processing method. Besides, the impact of temperature on the MZI can be eliminated through constructing a matrix using the different response of two loss peak to the bending and temperature sensitivities. This research work would be helpful to develop the practicability of fiber bending vector sensors. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:709–713, 2015</description><identifier>ISSN: 0895-2477</identifier><identifier>EISSN: 1098-2760</identifier><identifier>DOI: 10.1002/mop.28937</identifier><identifier>CODEN: MOTLEO</identifier><language>eng</language><publisher>New York: Blackwell Publishing Ltd</publisher><subject>Bending ; Data processing ; lateral offset ; Mach ; Mach-Zehnder interferometers ; Mathematical analysis ; Microwaves ; Sensors ; Two dimensional ; two-dimensional bending vector sensor ; Vectors (mathematics) ; Zehnder interferometer</subject><ispartof>Microwave and optical technology letters, 2015-03, Vol.57 (3), p.709-713</ispartof><rights>2015 Wiley Periodicals, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3687-e61294958a2472471d4a96a59922ca04871df744c48702467ce5b9cfd7f30b413</citedby><cites>FETCH-LOGICAL-c3687-e61294958a2472471d4a96a59922ca04871df744c48702467ce5b9cfd7f30b413</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fmop.28937$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fmop.28937$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids></links><search><creatorcontrib>Zhang, Jianhao</creatorcontrib><creatorcontrib>Zhang, Weigang</creatorcontrib><creatorcontrib>Wang, Jiuzhen</creatorcontrib><creatorcontrib>Huang, Shang</creatorcontrib><creatorcontrib>Liu, Min</creatorcontrib><creatorcontrib>Li, Jieliang</creatorcontrib><creatorcontrib>Wang, Li</creatorcontrib><title>Two-dimensional bending vector sensor based on Mach-Zehnder interferometer of two orthogonal lateral-offsets</title><title>Microwave and optical technology letters</title><addtitle>Microw. Opt. Technol. Lett</addtitle><description>ABSTRACT
A simple, compact bending vector sensor based on Mach–Zehnder interferometer (MZI) utilizing two orthogonal lateral‐offsets is proposed. The two‐dimensional bending vector sensing characteristics, including the curvature and four orthogonal directions, could be measured accurately and simultaneously by the MZI using a special data processing method. Besides, the impact of temperature on the MZI can be eliminated through constructing a matrix using the different response of two loss peak to the bending and temperature sensitivities. This research work would be helpful to develop the practicability of fiber bending vector sensors. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:709–713, 2015</description><subject>Bending</subject><subject>Data processing</subject><subject>lateral offset</subject><subject>Mach</subject><subject>Mach-Zehnder interferometers</subject><subject>Mathematical analysis</subject><subject>Microwaves</subject><subject>Sensors</subject><subject>Two dimensional</subject><subject>two-dimensional bending vector sensor</subject><subject>Vectors (mathematics)</subject><subject>Zehnder interferometer</subject><issn>0895-2477</issn><issn>1098-2760</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNp1kEFPGzEQhS1UJFLKgX9gqZf24OC1vfb62CIIBQIcQEhcLMc7JpvuroO9acq_xyGUQyWkkWY0872n0UPosKDjglJ21IXlmFWaqx00KqiuCFOSfkIjWumSMKHUHvqc0oJSypViI9TergOpmw761ITetngGfd30j_gPuCFEnPIht5lNUOPQ46l1c_IA876GiJt-gOghhg7ygIPHwzrgEId5eHw1a23e25YE7xMM6Qva9bZNcPDW99Hd6cnt8Rm5vJ78Ov5xSRyXlSIgC6aFLiubH85V1MJqaUutGXOWiipvvBLC5YkyIZWDcqadr5XndCYKvo--bX2XMTytIA2ma5KDtrU9hFUyhZS6UprKDfr1P3QRVjH_vqGEKpXkQmbq-5ZyMaQUwZtlbDobn01BzSZ3k3M3r7ln9mjLrpsWnj8GzfT65p-CbBVNGuDvu8LG30YqrkpzfzUxqjrn-ie_MGf8BRcMk4A</recordid><startdate>201503</startdate><enddate>201503</enddate><creator>Zhang, Jianhao</creator><creator>Zhang, Weigang</creator><creator>Wang, Jiuzhen</creator><creator>Huang, Shang</creator><creator>Liu, Min</creator><creator>Li, Jieliang</creator><creator>Wang, Li</creator><general>Blackwell Publishing Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>201503</creationdate><title>Two-dimensional bending vector sensor based on Mach-Zehnder interferometer of two orthogonal lateral-offsets</title><author>Zhang, Jianhao ; Zhang, Weigang ; Wang, Jiuzhen ; Huang, Shang ; Liu, Min ; Li, Jieliang ; Wang, Li</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3687-e61294958a2472471d4a96a59922ca04871df744c48702467ce5b9cfd7f30b413</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Bending</topic><topic>Data processing</topic><topic>lateral offset</topic><topic>Mach</topic><topic>Mach-Zehnder interferometers</topic><topic>Mathematical analysis</topic><topic>Microwaves</topic><topic>Sensors</topic><topic>Two dimensional</topic><topic>two-dimensional bending vector sensor</topic><topic>Vectors (mathematics)</topic><topic>Zehnder interferometer</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Jianhao</creatorcontrib><creatorcontrib>Zhang, Weigang</creatorcontrib><creatorcontrib>Wang, Jiuzhen</creatorcontrib><creatorcontrib>Huang, Shang</creatorcontrib><creatorcontrib>Liu, Min</creatorcontrib><creatorcontrib>Li, Jieliang</creatorcontrib><creatorcontrib>Wang, Li</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microwave and optical technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Jianhao</au><au>Zhang, Weigang</au><au>Wang, Jiuzhen</au><au>Huang, Shang</au><au>Liu, Min</au><au>Li, Jieliang</au><au>Wang, Li</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Two-dimensional bending vector sensor based on Mach-Zehnder interferometer of two orthogonal lateral-offsets</atitle><jtitle>Microwave and optical technology letters</jtitle><addtitle>Microw. Opt. Technol. Lett</addtitle><date>2015-03</date><risdate>2015</risdate><volume>57</volume><issue>3</issue><spage>709</spage><epage>713</epage><pages>709-713</pages><issn>0895-2477</issn><eissn>1098-2760</eissn><coden>MOTLEO</coden><abstract>ABSTRACT
A simple, compact bending vector sensor based on Mach–Zehnder interferometer (MZI) utilizing two orthogonal lateral‐offsets is proposed. The two‐dimensional bending vector sensing characteristics, including the curvature and four orthogonal directions, could be measured accurately and simultaneously by the MZI using a special data processing method. Besides, the impact of temperature on the MZI can be eliminated through constructing a matrix using the different response of two loss peak to the bending and temperature sensitivities. This research work would be helpful to develop the practicability of fiber bending vector sensors. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:709–713, 2015</abstract><cop>New York</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1002/mop.28937</doi><tpages>5</tpages></addata></record> |
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subjects | Bending Data processing lateral offset Mach Mach-Zehnder interferometers Mathematical analysis Microwaves Sensors Two dimensional two-dimensional bending vector sensor Vectors (mathematics) Zehnder interferometer |
title | Two-dimensional bending vector sensor based on Mach-Zehnder interferometer of two orthogonal lateral-offsets |
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