Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer
The absolute optical thickness of a transparent plate 6-mm thick and 10 mm in diameter was measured by the excess fraction method and a wavelength-tuning Fizeau interferometer. The optical thickness, defined by the group refractive index at the central wavelength, was measured by wavelength scanning...
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| Veröffentlicht in: | Optics express 2015-02, Vol.23 (4), p.4065-4073 |
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| container_title | Optics express |
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| creator | Kim, Yangjin Hibino, Kenichi Sugita, Naohiko Mitsuishi, Mamoru |
| description | The absolute optical thickness of a transparent plate 6-mm thick and 10 mm in diameter was measured by the excess fraction method and a wavelength-tuning Fizeau interferometer. The optical thickness, defined by the group refractive index at the central wavelength, was measured by wavelength scanning. The optical thickness deviation, defined by the ordinary refractive index, was measured using the phase-shifting technique. Two kinds of optical thicknesses, measured by discrete Fourier analysis and the phase-shifting technique, were synthesized to obtain the optical thickness with respect to the ordinary refractive index using Sellmeier equation and least-square fitting. |
| doi_str_mv | 10.1364/oe.23.004065 |
| format | Article |
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| source | Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Alma/SFX Local Collection; DOAJ开放获取期刊资源库 |
| title | Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer |
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