$Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X‑ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni–Al$

Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X‑ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni–Al

The efficient identification of compositional areas of interest in thin film materials systems fabricated by combinatorial deposition methods is essential in combinatorial materials science. We use a combination of compositional screening by EDX together with high-throughput measurements of electric...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	ACS combinatorial science 2014-12, Vol.16 (12), p.686-694
Hauptverfasser:	Thienhaus, S., Naujoks, D., Pfetzing-Micklich, J., König, D., Ludwig, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Alloys - chemical synthesis Alloys - chemistry Aluminum - chemistry Combinatorial analysis Combinatorial Chemistry Techniques - methods Crystallinity Deposition Diffraction Elastic Modulus Electric Impedance Libraries Microscopy, Electron, Scanning Nickel Nickel - chemistry Reference systems Thin films X-Ray Diffraction X-rays
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!