Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X‑ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni–Al
The efficient identification of compositional areas of interest in thin film materials systems fabricated by combinatorial deposition methods is essential in combinatorial materials science. We use a combination of compositional screening by EDX together with high-throughput measurements of electric...
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| Veröffentlicht in: | ACS combinatorial science 2014-12, Vol.16 (12), p.686-694 |
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| creator | Thienhaus, S. Naujoks, D. Pfetzing-Micklich, J. König, D. Ludwig, A. |
| description | The efficient identification of compositional areas of interest in thin film materials systems fabricated by combinatorial deposition methods is essential in combinatorial materials science. We use a combination of compositional screening by EDX together with high-throughput measurements of electrical and optical properties of thin film libraries to determine efficiently the areas of interest in a materials system. Areas of interest are compositions which show distinctive properties. The crystallinity of the thus determined areas is identified by X-ray diffraction. Additionally, by using automated nanoindentation across the materials library, mechanical data of the thin films can be obtained which complements the identification of areas of interest. The feasibility of this approach is demonstrated by using a Ni–Al thin film library as a reference system. The obtained results promise that this approach can be used for the case of ternary and higher order systems. |
| doi_str_mv | 10.1021/co5000757 |
| format | Article |
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The obtained results promise that this approach can be used for the case of ternary and higher order systems.</description><subject>Alloys - chemical synthesis</subject><subject>Alloys - chemistry</subject><subject>Aluminum - chemistry</subject><subject>Combinatorial analysis</subject><subject>Combinatorial Chemistry Techniques - methods</subject><subject>Crystallinity</subject><subject>Deposition</subject><subject>Diffraction</subject><subject>Elastic Modulus</subject><subject>Electric Impedance</subject><subject>Libraries</subject><subject>Microscopy, Electron, Scanning</subject><subject>Nickel</subject><subject>Nickel - chemistry</subject><subject>Reference systems</subject><subject>Thin films</subject><subject>X-Ray Diffraction</subject><subject>X-rays</subject><issn>2156-8952</issn><issn>2156-8944</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqNkc1u1DAUhSMEolXpghdAd4MEUgO2Y-eH3Who6UhTKsEgsYsc_0xcJXawncXs-gqIN-MR-iR4NGVWLNjYx9efzr26J8teYvQOI4LfC8cQQhWrnmSnBLMyrxtKnx41IyfZeQh3iUGUNqREz7MTwoqSUdScZr-_8MlIWEllo9FG8GicBadh4RUPe7GyUXkVIhgLmz4dV2YY4YanquFDgLXpPPdGBeh2sHRjZ6yxW7gclIg-GQ4XcDvFg_j-cP_T8x18NFp7Lva9LoBbCTdK9NzuIbg22z7f9N7N236aY_riYfZqTAOGD7CAJQ8KvsZZ7kA7D7FPr12IaoTP5uH-12J4kT3TaTB1_nifZd-uLjfL63x9-2m1XKxzXtA65rWqNcJd1SBZCc1lyYjWlaqR5KJjDZYsVetadB3BsiQNLiWtS1zihpKOkKo4y94cfCfvfsxpQ-1oglDDwK1yc2hxWSLUUIyL_0ALWpGKMZTQtwdUeBeCV7qdvBm537UYtfvA22PgiX31aDt3o5JH8m-8CXh9ALgI7Z2bvU0L-YfRH2pttJY</recordid><startdate>20141208</startdate><enddate>20141208</enddate><creator>Thienhaus, S.</creator><creator>Naujoks, D.</creator><creator>Pfetzing-Micklich, J.</creator><creator>König, D.</creator><creator>Ludwig, A.</creator><general>American Chemical Society</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7QF</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20141208</creationdate><title>Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X‑ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni–Al</title><author>Thienhaus, S. ; Naujoks, D. ; Pfetzing-Micklich, J. ; König, D. ; Ludwig, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a348t-8e8f01b790d7cfad652ff7e80dacb591d5cfa88cbb21d62916d486161942b2273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Alloys - chemical synthesis</topic><topic>Alloys - chemistry</topic><topic>Aluminum - chemistry</topic><topic>Combinatorial analysis</topic><topic>Combinatorial Chemistry Techniques - methods</topic><topic>Crystallinity</topic><topic>Deposition</topic><topic>Diffraction</topic><topic>Elastic Modulus</topic><topic>Electric Impedance</topic><topic>Libraries</topic><topic>Microscopy, Electron, Scanning</topic><topic>Nickel</topic><topic>Nickel - chemistry</topic><topic>Reference systems</topic><topic>Thin films</topic><topic>X-Ray Diffraction</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Thienhaus, S.</creatorcontrib><creatorcontrib>Naujoks, D.</creatorcontrib><creatorcontrib>Pfetzing-Micklich, J.</creatorcontrib><creatorcontrib>König, D.</creatorcontrib><creatorcontrib>Ludwig, A.</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Aluminium Industry Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>ACS combinatorial science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Thienhaus, S.</au><au>Naujoks, D.</au><au>Pfetzing-Micklich, J.</au><au>König, D.</au><au>Ludwig, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X‑ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni–Al</atitle><jtitle>ACS combinatorial science</jtitle><addtitle>ACS Comb. 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| ispartof | ACS combinatorial science, 2014-12, Vol.16 (12), p.686-694 |
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| subjects | Alloys - chemical synthesis Alloys - chemistry Aluminum - chemistry Combinatorial analysis Combinatorial Chemistry Techniques - methods Crystallinity Deposition Diffraction Elastic Modulus Electric Impedance Libraries Microscopy, Electron, Scanning Nickel Nickel - chemistry Reference systems Thin films X-Ray Diffraction X-rays |
| title | Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X‑ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni–Al |
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