Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer
An efficient and fast way to measure photoelectron diffraction data over the full 2π angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning a...
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| Veröffentlicht in: | Journal of electron spectroscopy and related phenomena 2014-12, Vol.197, p.30-36 |
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| container_title | Journal of electron spectroscopy and related phenomena |
| container_volume | 197 |
| creator | Greif, Michael Castiglioni, Luca Becker-Koch, David Osterwalder, Jürg Hengsberger, Matthias |
| description | An efficient and fast way to measure photoelectron diffraction data over the full 2π angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(111) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality. The sampling technique is extended to UV-excited angle-resolved photoelectron spectroscopy as illustrated by a mapping of the Fermi surface of Cu(111). |
| doi_str_mv | 10.1016/j.elspec.2014.08.007 |
| format | Article |
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We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(111) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality. 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We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(111) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality. The sampling technique is extended to UV-excited angle-resolved photoelectron spectroscopy as illustrated by a mapping of the Fermi surface of Cu(111).</description><subject>2D detector</subject><subject>Analyzers</subject><subject>Data points</subject><subject>Density</subject><subject>Detectors</subject><subject>Diffraction</subject><subject>Diffraction patterns</subject><subject>Electron spectrometer</subject><subject>Mapping</subject><subject>Photoelectron</subject><subject>Photoelectrons</subject><subject>Two dimensional</subject><issn>0368-2048</issn><issn>1873-2526</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kEFr3DAQhUVJoJtN_0EOPuZidyTZsnwpLEubFhZyac9CGY8SLV7LkbRZ0l9fpVt6zGngfe89mMfYDYeGA1ef9w1NaSFsBPC2Ad0A9B_Yiute1qIT6oKtQCpdC2j1R3aV0h6Ko5NixWiDz0effPZhroKrlqeQA02EORZh9M5Fi3_hYnOmOKfq5PNTZat8CvXoDzSnQu1U5JFqOz9OVP3P2wJef1O8ZpfOTok-_btr9uvb15_b7_Xu_u7HdrOrUcoh17wdsOvBtUIMVmLL5YAoR9Aoetm3fds5GJzk_IFQPWjeKUlckXIKQQlAuWa3594lhucjpWwOPiFNk50pHJPhSgF0muuuWNuzFWNIKZIzS_QHG18NB_O2qtmb86rmbVUD2pTNSuzLOVYYvXiKJqGnGWn0sTxtxuDfL_gDn0SDxg</recordid><startdate>20141201</startdate><enddate>20141201</enddate><creator>Greif, Michael</creator><creator>Castiglioni, Luca</creator><creator>Becker-Koch, David</creator><creator>Osterwalder, Jürg</creator><creator>Hengsberger, Matthias</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20141201</creationdate><title>Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer</title><author>Greif, Michael ; Castiglioni, Luca ; Becker-Koch, David ; Osterwalder, Jürg ; Hengsberger, Matthias</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c339t-149c570f4229a3c4139cc3d08c27374745f09f311bec6b81563e16e6f6c0620c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>2D detector</topic><topic>Analyzers</topic><topic>Data points</topic><topic>Density</topic><topic>Detectors</topic><topic>Diffraction</topic><topic>Diffraction patterns</topic><topic>Electron spectrometer</topic><topic>Mapping</topic><topic>Photoelectron</topic><topic>Photoelectrons</topic><topic>Two dimensional</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Greif, Michael</creatorcontrib><creatorcontrib>Castiglioni, Luca</creatorcontrib><creatorcontrib>Becker-Koch, David</creatorcontrib><creatorcontrib>Osterwalder, Jürg</creatorcontrib><creatorcontrib>Hengsberger, Matthias</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of electron spectroscopy and related phenomena</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Greif, Michael</au><au>Castiglioni, Luca</au><au>Becker-Koch, David</au><au>Osterwalder, Jürg</au><au>Hengsberger, Matthias</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer</atitle><jtitle>Journal of electron spectroscopy and related phenomena</jtitle><date>2014-12-01</date><risdate>2014</risdate><volume>197</volume><spage>30</spage><epage>36</epage><pages>30-36</pages><issn>0368-2048</issn><eissn>1873-2526</eissn><abstract>An efficient and fast way to measure photoelectron diffraction data over the full 2π angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. 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| ispartof | Journal of electron spectroscopy and related phenomena, 2014-12, Vol.197, p.30-36 |
| issn | 0368-2048 1873-2526 |
| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| subjects | 2D detector Analyzers Data points Density Detectors Diffraction Diffraction patterns Electron spectrometer Mapping Photoelectron Photoelectrons Two dimensional |
| title | Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer |
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