2-in-1 red-/green-/blue sensitive a-SiC:H/a-Si:H/a-SiGeC:H thin film photo detector with an integrated optical filter
This paper presents an inventive unipolar amorphous silicon (a-Si:H) two terminal two color photo sensor, featuring two functional modes of operation. The sensor structure is green sensitive at −8.5V and reaches a sensitivity maximum of 130mA/W. At lower absolute bias voltage values the spectral res...
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description | This paper presents an inventive unipolar amorphous silicon (a-Si:H) two terminal two color photo sensor, featuring two functional modes of operation. The sensor structure is green sensitive at −8.5V and reaches a sensitivity maximum of 130mA/W. At lower absolute bias voltage values the spectral response at 550nm is suppressed by an internal optical filter. The filter structure consists of an a-Si:H/a-SiGeC:H absorber interface, generating an interior trapping area with high defect densities. The combination of an internal band gap barrier and an area with high defect states causes localized charge recombination. The interface deteriorates transport properties locally to suppress green sensitivity while the detectors blue and red efficiencies exceed. The maximum suppression of the 530nm response is 32.5mA/W at −5.5V bias voltage. Additionally, we observe a shift of both two color sensitivity maxima. The peak at lower wavelength shifts from 350nm to 480nm. In consequence, the device is even able to detect signals in the near ultraviolet spectrum. The second peak shifts from 590nm to 640nm. At −8.5V the filter is deactivated and the maximum detector response is located at 530nm. In reverse biased conditions the device's dynamic range remains constantly high and reaches values of 90dB at 1000lx white-light illumination. The interior 85nm a-Si:H layer reduces the dark current density to 10−8A/cm2 at −8V. Possible sensor applications may exist in fields of medical diagnostics, fluorescence and spectrophotometrical measurements, chemical analysis or in colorimetric and hyperspectral imagery.
•Two color (red/blue) and one color (blue) detector in one device•Near ultraviolet/-visible amorphous silicon sensor•High dynamic range |
doi_str_mv | 10.1016/j.tsf.2013.12.021 |
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•Two color (red/blue) and one color (blue) detector in one device•Near ultraviolet/-visible amorphous silicon sensor•High dynamic range</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/j.tsf.2013.12.021</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Amorphous silicon ; Bias ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Defects ; Defects and impurities: doping, implantation, distribution, concentration, etc ; Density ; Devices ; Electric potential ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Exact sciences and technology ; General equipment and techniques ; Hyperspectral imaging ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Optical filters ; Optics ; Photonic device ; Physics ; Reflectance measurement ; Sensors ; Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing ; Surface and interface electron states ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film detector ; Thin film structure and morphology ; Thin films ; Two color sensor ; Voltage</subject><ispartof>Thin solid films, 2014-02, Vol.552, p.212-217</ispartof><rights>2013 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c360t-d4ea3629cca769270e0833f7af3e6cfda38c017e30a6b600c3635e21cab44e253</citedby><cites>FETCH-LOGICAL-c360t-d4ea3629cca769270e0833f7af3e6cfda38c017e30a6b600c3635e21cab44e253</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0040609013020671$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28250282$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Bablich, A.</creatorcontrib><creatorcontrib>Merfort, C.</creatorcontrib><creatorcontrib>Schäfer-Eberwein, H.</creatorcontrib><creatorcontrib>Haring-Bolivar, P.</creatorcontrib><creatorcontrib>Boehm, M.</creatorcontrib><title>2-in-1 red-/green-/blue sensitive a-SiC:H/a-Si:H/a-SiGeC:H thin film photo detector with an integrated optical filter</title><title>Thin solid films</title><description>This paper presents an inventive unipolar amorphous silicon (a-Si:H) two terminal two color photo sensor, featuring two functional modes of operation. The sensor structure is green sensitive at −8.5V and reaches a sensitivity maximum of 130mA/W. At lower absolute bias voltage values the spectral response at 550nm is suppressed by an internal optical filter. The filter structure consists of an a-Si:H/a-SiGeC:H absorber interface, generating an interior trapping area with high defect densities. The combination of an internal band gap barrier and an area with high defect states causes localized charge recombination. The interface deteriorates transport properties locally to suppress green sensitivity while the detectors blue and red efficiencies exceed. The maximum suppression of the 530nm response is 32.5mA/W at −5.5V bias voltage. Additionally, we observe a shift of both two color sensitivity maxima. The peak at lower wavelength shifts from 350nm to 480nm. In consequence, the device is even able to detect signals in the near ultraviolet spectrum. The second peak shifts from 590nm to 640nm. At −8.5V the filter is deactivated and the maximum detector response is located at 530nm. In reverse biased conditions the device's dynamic range remains constantly high and reaches values of 90dB at 1000lx white-light illumination. The interior 85nm a-Si:H layer reduces the dark current density to 10−8A/cm2 at −8V. Possible sensor applications may exist in fields of medical diagnostics, fluorescence and spectrophotometrical measurements, chemical analysis or in colorimetric and hyperspectral imagery.
•Two color (red/blue) and one color (blue) detector in one device•Near ultraviolet/-visible amorphous silicon sensor•High dynamic range</description><subject>Amorphous silicon</subject><subject>Bias</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Defects</subject><subject>Defects and impurities: doping, implantation, distribution, concentration, etc</subject><subject>Density</subject><subject>Devices</subject><subject>Electric potential</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Exact sciences and technology</subject><subject>General equipment and techniques</subject><subject>Hyperspectral imaging</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Optical filters</subject><subject>Optics</subject><subject>Photonic device</subject><subject>Physics</subject><subject>Reflectance measurement</subject><subject>Sensors</subject><subject>Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing</subject><subject>Surface and interface electron states</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film detector</subject><subject>Thin film structure and morphology</subject><subject>Thin films</subject><subject>Two color sensor</subject><subject>Voltage</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kMFOAjEQhhujiYg-gLdeTLx0mbbQZfVkiIIJiQf13JTuLJQsXWwLxre3BOLRS_-k-f6ZzEfILYeCA1eDdZFiUwjgsuCiAMHPSI-Py4qJUvJz0gMYAlNQwSW5inENAFwI2SM7wZxnnAas2WAZED0bLNod0og-uuT2SA17d5OH2eCQp5hi_qBp5TxtXLuh21WXOlpjQpu6QL9dWlHjqfMJl8EkrGm3Tc6a9oAnDNfkojFtxJtT9snny_PHZMbmb9PXydOcWakgsXqIRipRWWtKVYkSEMZSNqVpJCrb1EaOLfASJRi1UAC5JUcouDWL4RDFSPbJ_XHuNnRfO4xJb1y02LbGY7eLmqvcGqlKlhnlR9SGLsaAjd4GtzHhR3PQB8V6rbNifVCsudBZce7cncabmI9rgvHWxb-iGIsR5Cdzj0cO8617h0FH69BbrF3IxnTduX-2_AI36I9t</recordid><startdate>20140203</startdate><enddate>20140203</enddate><creator>Bablich, A.</creator><creator>Merfort, C.</creator><creator>Schäfer-Eberwein, H.</creator><creator>Haring-Bolivar, P.</creator><creator>Boehm, M.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20140203</creationdate><title>2-in-1 red-/green-/blue sensitive a-SiC:H/a-Si:H/a-SiGeC:H thin film photo detector with an integrated optical filter</title><author>Bablich, A. ; Merfort, C. ; Schäfer-Eberwein, H. ; Haring-Bolivar, P. ; Boehm, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c360t-d4ea3629cca769270e0833f7af3e6cfda38c017e30a6b600c3635e21cab44e253</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Amorphous silicon</topic><topic>Bias</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Defects</topic><topic>Defects and impurities: doping, implantation, distribution, concentration, etc</topic><topic>Density</topic><topic>Devices</topic><topic>Electric potential</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Exact sciences and technology</topic><topic>General equipment and techniques</topic><topic>Hyperspectral imaging</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Optical filters</topic><topic>Optics</topic><topic>Photonic device</topic><topic>Physics</topic><topic>Reflectance measurement</topic><topic>Sensors</topic><topic>Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing</topic><topic>Surface and interface electron states</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film detector</topic><topic>Thin film structure and morphology</topic><topic>Thin films</topic><topic>Two color sensor</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bablich, A.</creatorcontrib><creatorcontrib>Merfort, C.</creatorcontrib><creatorcontrib>Schäfer-Eberwein, H.</creatorcontrib><creatorcontrib>Haring-Bolivar, P.</creatorcontrib><creatorcontrib>Boehm, M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bablich, A.</au><au>Merfort, C.</au><au>Schäfer-Eberwein, H.</au><au>Haring-Bolivar, P.</au><au>Boehm, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>2-in-1 red-/green-/blue sensitive a-SiC:H/a-Si:H/a-SiGeC:H thin film photo detector with an integrated optical filter</atitle><jtitle>Thin solid films</jtitle><date>2014-02-03</date><risdate>2014</risdate><volume>552</volume><spage>212</spage><epage>217</epage><pages>212-217</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>This paper presents an inventive unipolar amorphous silicon (a-Si:H) two terminal two color photo sensor, featuring two functional modes of operation. The sensor structure is green sensitive at −8.5V and reaches a sensitivity maximum of 130mA/W. At lower absolute bias voltage values the spectral response at 550nm is suppressed by an internal optical filter. The filter structure consists of an a-Si:H/a-SiGeC:H absorber interface, generating an interior trapping area with high defect densities. The combination of an internal band gap barrier and an area with high defect states causes localized charge recombination. The interface deteriorates transport properties locally to suppress green sensitivity while the detectors blue and red efficiencies exceed. The maximum suppression of the 530nm response is 32.5mA/W at −5.5V bias voltage. Additionally, we observe a shift of both two color sensitivity maxima. The peak at lower wavelength shifts from 350nm to 480nm. In consequence, the device is even able to detect signals in the near ultraviolet spectrum. The second peak shifts from 590nm to 640nm. At −8.5V the filter is deactivated and the maximum detector response is located at 530nm. In reverse biased conditions the device's dynamic range remains constantly high and reaches values of 90dB at 1000lx white-light illumination. The interior 85nm a-Si:H layer reduces the dark current density to 10−8A/cm2 at −8V. Possible sensor applications may exist in fields of medical diagnostics, fluorescence and spectrophotometrical measurements, chemical analysis or in colorimetric and hyperspectral imagery.
•Two color (red/blue) and one color (blue) detector in one device•Near ultraviolet/-visible amorphous silicon sensor•High dynamic range</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.tsf.2013.12.021</doi><tpages>6</tpages></addata></record> |
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subjects | Amorphous silicon Bias Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Defects Defects and impurities: doping, implantation, distribution, concentration, etc Density Devices Electric potential Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology General equipment and techniques Hyperspectral imaging Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optical filters Optics Photonic device Physics Reflectance measurement Sensors Sensors (chemical, optical, electrical, movement, gas, etc.) remote sensing Surface and interface electron states Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film detector Thin film structure and morphology Thin films Two color sensor Voltage |
title | 2-in-1 red-/green-/blue sensitive a-SiC:H/a-Si:H/a-SiGeC:H thin film photo detector with an integrated optical filter |
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