Two-dimensional scanning focused refractive-index microscopy and applications to refractive-index profiling of optical fibers
The refractive-index profile (RIP) of optical fibers is of fundamental significance in determining critical fiber properties. Here, we present the application of a two-dimensional (2-D) scanning focused refractive-index microscopy (SFRIM) to accurately obtain the 2-D RIP of a graded-index optical fi...
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| Veröffentlicht in: | Review of scientific instruments 2015-01, Vol.86 (1), p.013702-013702 |
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| container_title | Review of scientific instruments |
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| creator | Wang, Xiaowan Ye, Qing Sun, Tengqian Wang, Jin Deng, Zhichao Mei, Jianchun Zhou, Wenyuan Zhang, Chunping Tian, Jianguo |
| description | The refractive-index profile (RIP) of optical fibers is of fundamental significance in determining critical fiber properties. Here, we present the application of a two-dimensional (2-D) scanning focused refractive-index microscopy (SFRIM) to accurately obtain the 2-D RIP of a graded-index optical fiber. Some modifications are made to SFRIM for better 2-D measurement. Quantitative RIP of the fiber is obtained with derivative total reflection method. The refractive-index accuracy is 0.002. The measured result is in good agreement with theoretical expectation. This method is straightforward, simple, repeatable, and free from signal distortion. This technique is suitable for symmetric and asymmetric optical fibers. The results indicate that this technique can be applied to obtain the RIPs of a wide range of materials and has broad application prospect in many fields. |
| doi_str_mv | 10.1063/1.4905179 |
| format | Article |
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Here, we present the application of a two-dimensional (2-D) scanning focused refractive-index microscopy (SFRIM) to accurately obtain the 2-D RIP of a graded-index optical fiber. Some modifications are made to SFRIM for better 2-D measurement. Quantitative RIP of the fiber is obtained with derivative total reflection method. The refractive-index accuracy is 0.002. The measured result is in good agreement with theoretical expectation. This method is straightforward, simple, repeatable, and free from signal distortion. This technique is suitable for symmetric and asymmetric optical fibers. The results indicate that this technique can be applied to obtain the RIPs of a wide range of materials and has broad application prospect in many fields.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.4905179</identifier><identifier>PMID: 25638085</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>Microscopy ; Optical fibers ; Optical properties ; Scientific apparatus & instruments ; Signal distortion</subject><ispartof>Review of scientific instruments, 2015-01, Vol.86 (1), p.013702-013702</ispartof><rights>2015 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-11949cccfa547b1533bf8ebcd753bf1b5d34f754a14d86b7eba79f431489cfa3</citedby><cites>FETCH-LOGICAL-c350t-11949cccfa547b1533bf8ebcd753bf1b5d34f754a14d86b7eba79f431489cfa3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/25638085$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, Xiaowan</creatorcontrib><creatorcontrib>Ye, Qing</creatorcontrib><creatorcontrib>Sun, Tengqian</creatorcontrib><creatorcontrib>Wang, Jin</creatorcontrib><creatorcontrib>Deng, Zhichao</creatorcontrib><creatorcontrib>Mei, Jianchun</creatorcontrib><creatorcontrib>Zhou, Wenyuan</creatorcontrib><creatorcontrib>Zhang, Chunping</creatorcontrib><creatorcontrib>Tian, Jianguo</creatorcontrib><title>Two-dimensional scanning focused refractive-index microscopy and applications to refractive-index profiling of optical fibers</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>The refractive-index profile (RIP) of optical fibers is of fundamental significance in determining critical fiber properties. Here, we present the application of a two-dimensional (2-D) scanning focused refractive-index microscopy (SFRIM) to accurately obtain the 2-D RIP of a graded-index optical fiber. Some modifications are made to SFRIM for better 2-D measurement. Quantitative RIP of the fiber is obtained with derivative total reflection method. The refractive-index accuracy is 0.002. The measured result is in good agreement with theoretical expectation. This method is straightforward, simple, repeatable, and free from signal distortion. This technique is suitable for symmetric and asymmetric optical fibers. The results indicate that this technique can be applied to obtain the RIPs of a wide range of materials and has broad application prospect in many fields.</description><subject>Microscopy</subject><subject>Optical fibers</subject><subject>Optical properties</subject><subject>Scientific apparatus & instruments</subject><subject>Signal distortion</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNplkT9PwzAQxS0EoqUw8AWQJRYYAr7Yju0RVfyTkFi6R45jI1dJHOIE6MB3xxWFAW65G373dPceQqdAroAU9BqumCIchNpDcyBSZaLI6T6aE0JZVggmZ-goxjVJxQEO0SznBZVE8jn6XL2HrPat7aIPnW5wNLrrfPeCXTBTtDUerBu0Gf2bzXxX2w_cejOEaEK_wbqrse77xhs9pvWIx_Cf74fgfLOVDA6Hfkxwg52v7BCP0YHTTbQnu75Aq7vb1fIhe3q-f1zePGWGcjJmAIopY4zTnIkKOKWVk7YyteBpgorXlDnBmQZWy6ISttJCOUaBSZWW6AJdfMumU14nG8ey9dHYptGdDVMsoeA5o0zkKqHnf9B1mIZkTCxzyJliuZAsUZff1NaJmD4u-8G3etiUQMptJCWUu0gSe7ZTnKrW1r_kTwb0C87hiH0</recordid><startdate>201501</startdate><enddate>201501</enddate><creator>Wang, Xiaowan</creator><creator>Ye, Qing</creator><creator>Sun, Tengqian</creator><creator>Wang, Jin</creator><creator>Deng, Zhichao</creator><creator>Mei, Jianchun</creator><creator>Zhou, Wenyuan</creator><creator>Zhang, Chunping</creator><creator>Tian, Jianguo</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>201501</creationdate><title>Two-dimensional scanning focused refractive-index microscopy and applications to refractive-index profiling of optical fibers</title><author>Wang, Xiaowan ; Ye, Qing ; Sun, Tengqian ; Wang, Jin ; Deng, Zhichao ; Mei, Jianchun ; Zhou, Wenyuan ; Zhang, Chunping ; Tian, Jianguo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-11949cccfa547b1533bf8ebcd753bf1b5d34f754a14d86b7eba79f431489cfa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Microscopy</topic><topic>Optical fibers</topic><topic>Optical properties</topic><topic>Scientific apparatus & instruments</topic><topic>Signal distortion</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Xiaowan</creatorcontrib><creatorcontrib>Ye, Qing</creatorcontrib><creatorcontrib>Sun, Tengqian</creatorcontrib><creatorcontrib>Wang, Jin</creatorcontrib><creatorcontrib>Deng, Zhichao</creatorcontrib><creatorcontrib>Mei, Jianchun</creatorcontrib><creatorcontrib>Zhou, Wenyuan</creatorcontrib><creatorcontrib>Zhang, Chunping</creatorcontrib><creatorcontrib>Tian, Jianguo</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Xiaowan</au><au>Ye, Qing</au><au>Sun, Tengqian</au><au>Wang, Jin</au><au>Deng, Zhichao</au><au>Mei, Jianchun</au><au>Zhou, Wenyuan</au><au>Zhang, Chunping</au><au>Tian, Jianguo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Two-dimensional scanning focused refractive-index microscopy and applications to refractive-index profiling of optical fibers</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2015-01</date><risdate>2015</risdate><volume>86</volume><issue>1</issue><spage>013702</spage><epage>013702</epage><pages>013702-013702</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><abstract>The refractive-index profile (RIP) of optical fibers is of fundamental significance in determining critical fiber properties. Here, we present the application of a two-dimensional (2-D) scanning focused refractive-index microscopy (SFRIM) to accurately obtain the 2-D RIP of a graded-index optical fiber. Some modifications are made to SFRIM for better 2-D measurement. Quantitative RIP of the fiber is obtained with derivative total reflection method. The refractive-index accuracy is 0.002. The measured result is in good agreement with theoretical expectation. This method is straightforward, simple, repeatable, and free from signal distortion. This technique is suitable for symmetric and asymmetric optical fibers. The results indicate that this technique can be applied to obtain the RIPs of a wide range of materials and has broad application prospect in many fields.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>25638085</pmid><doi>10.1063/1.4905179</doi><tpages>1</tpages></addata></record> |
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| language | eng |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Microscopy Optical fibers Optical properties Scientific apparatus & instruments Signal distortion |
| title | Two-dimensional scanning focused refractive-index microscopy and applications to refractive-index profiling of optical fibers |
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