Reliability matrix solution to multiple mechanism prediction

•We integrate multiple failure mechanism models into a single matrix format.•Multiple test conditions are shown to be integrated into a linear reliability matrix.•Accelerated testing at various accelerated conditions can be used to predict reliability at user conditions.•User conditions can be chang...

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Veröffentlicht in:	Microelectronics and reliability 2014-12, Vol.54 (12), p.2951-2955
Hauptverfasser:	Bernstein, Joseph B., Gabbay, Moti, Delly, Ofir
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Constants Electronic systems Electronics Exact sciences and technology Failure Failure mechanisms Failure rates FIT Fracture mechanics (crack, fatigue, damage...) Fundamental areas of phenomenology (including applications) HTOL Integrated circuits Integrated circuits by function (including memories and processors) M-HTOL Mathematical analysis Mathematical models Matrix Multiple mechanisms Operational research and scientific management Operational research. Management science Physics Prediction Reliability theory. Replacement problems Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Solid mechanics Stresses Structural and continuum mechanics
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