Contactless probing of the intrinsic carrier transport single-walled carbon nanotubes
Intrinsic carrier transport properties of single-walled carbon nanotubes have been probed by two parallel methods on the same individual tubes： The contactless dielectric force microscopy （DFM） technique and the conventional field-effect transistor （FET） method. The dielectric responses of SWNTs are...
Gespeichert in:
| Veröffentlicht in: | Nano research 2014-11, Vol.7 (11), p.1623-1630 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1630 |
|---|---|
| container_issue | 11 |
| container_start_page | 1623 |
| container_title | Nano research |
| container_volume | 7 |
| creator | Li, Yize Stephanie Ge, Jun Cai, Jinhua Zhang, Jie Lu, Wei Liu, Jia Chen, Liwei |
| description | Intrinsic carrier transport properties of single-walled carbon nanotubes have been probed by two parallel methods on the same individual tubes： The contactless dielectric force microscopy （DFM） technique and the conventional field-effect transistor （FET） method. The dielectric responses of SWNTs are strongly correlated with electronic transport of the corresponding FETs. The DC bias voltage in DFM plays a role analogous to the gate voltage in FET. A microscopic model based on the general continuity equation and numerical simulation is built to reveal the link between intrinsic properties such as carrier concentration and mobility and the macroscopic observable, i.e. dielectric responses, in DFM experiments. Local transport barriers in nanotubes, which influence the device transport behaviors, are also detected with nanometer scale resolution. |
| doi_str_mv | 10.1007/s12274-014-0522-z |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1651422290</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cqvip_id>666115680</cqvip_id><sourcerecordid>1651422290</sourcerecordid><originalsourceid>FETCH-LOGICAL-c512t-8ce4fd9c4dc570b8a6d8b83df1e289e39d2903740b153334bb899622bbb602ce3</originalsourceid><addsrcrecordid>eNp9kE9LAzEQxYMoWKsfwNuiFy-rmdlsmj1K8R8IXvQckmy2btkmbZIi-ulNWRXx4ECYgfzem-ERcgr0EiidXUVAnLGSQn41YvmxRybQNKKkufa_Z0B2SI5iXFLKEZiYkJe5d0mZNNgYi3XwuneLwndFerVF71LoXexNYVQIvQ1FCsrFtQ-piJkbbPmmhsG2u3_tXeGU82mrbTwmB50aoj356lPycnvzPL8vH5_uHubXj6WpAVMpjGVd2xjWmnpGtVC8FVpUbQcWRWOrpsWGVjNGNdRVVTGtRdNwRK01p2hsNSUXo2--fLO1MclVH40dBuWs30YJvAaGuHOZkvM_6NJvg8vXZQo5IKWCZQpGygQfY7CdXId-pcK7BCp3QcsxaJmDlrug5UfW4KiJmXULG345_yM6-1r06t1ik3U_mzjnADUXtPoEoOOMyQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1626120084</pqid></control><display><type>article</type><title>Contactless probing of the intrinsic carrier transport single-walled carbon nanotubes</title><source>SpringerLink Journals</source><creator>Li, Yize Stephanie ; Ge, Jun ; Cai, Jinhua ; Zhang, Jie ; Lu, Wei ; Liu, Jia ; Chen, Liwei</creator><creatorcontrib>Li, Yize Stephanie ; Ge, Jun ; Cai, Jinhua ; Zhang, Jie ; Lu, Wei ; Liu, Jia ; Chen, Liwei</creatorcontrib><description>Intrinsic carrier transport properties of single-walled carbon nanotubes have been probed by two parallel methods on the same individual tubes： The contactless dielectric force microscopy （DFM） technique and the conventional field-effect transistor （FET） method. The dielectric responses of SWNTs are strongly correlated with electronic transport of the corresponding FETs. The DC bias voltage in DFM plays a role analogous to the gate voltage in FET. A microscopic model based on the general continuity equation and numerical simulation is built to reveal the link between intrinsic properties such as carrier concentration and mobility and the macroscopic observable, i.e. dielectric responses, in DFM experiments. Local transport barriers in nanotubes, which influence the device transport behaviors, are also detected with nanometer scale resolution.</description><identifier>ISSN: 1998-0124</identifier><identifier>EISSN: 1998-0000</identifier><identifier>DOI: 10.1007/s12274-014-0522-z</identifier><language>eng</language><publisher>Heidelberg: Tsinghua University Press</publisher><subject>Atomic/Molecular Structure and Spectra ; Biomedicine ; Biotechnology ; Carbon ; Carrier transport ; Chemical vapor deposition ; Chemistry and Materials Science ; Condensed Matter Physics ; Dielectric properties ; Electric potential ; Electrons ; Experiments ; Materials Science ; Mathematical models ; Microscopy ; Nanomaterials ; Nanostructure ; Nanotechnology ; Nanowires ; Research Article ; Semiconductor research ; Single wall carbon nanotubes ; Transistors ; Transport ; Voltage ; 介电响应 ; 单壁碳纳米管 ; 场效应晶体管 ; 本征 ; 纳米级分辨率 ; 载流子传输 ; 输运特性 ; 非接触式探测</subject><ispartof>Nano research, 2014-11, Vol.7 (11), p.1623-1630</ispartof><rights>Tsinghua University Press and Springer-Verlag Berlin Heidelberg 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c512t-8ce4fd9c4dc570b8a6d8b83df1e289e39d2903740b153334bb899622bbb602ce3</citedby><cites>FETCH-LOGICAL-c512t-8ce4fd9c4dc570b8a6d8b83df1e289e39d2903740b153334bb899622bbb602ce3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://image.cqvip.com/vip1000/qk/71233X/71233X.jpg</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s12274-014-0522-z$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s12274-014-0522-z$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,777,781,27905,27906,41469,42538,51300</link.rule.ids></links><search><creatorcontrib>Li, Yize Stephanie</creatorcontrib><creatorcontrib>Ge, Jun</creatorcontrib><creatorcontrib>Cai, Jinhua</creatorcontrib><creatorcontrib>Zhang, Jie</creatorcontrib><creatorcontrib>Lu, Wei</creatorcontrib><creatorcontrib>Liu, Jia</creatorcontrib><creatorcontrib>Chen, Liwei</creatorcontrib><title>Contactless probing of the intrinsic carrier transport single-walled carbon nanotubes</title><title>Nano research</title><addtitle>Nano Res</addtitle><addtitle>Nano Research</addtitle><description>Intrinsic carrier transport properties of single-walled carbon nanotubes have been probed by two parallel methods on the same individual tubes： The contactless dielectric force microscopy （DFM） technique and the conventional field-effect transistor （FET） method. The dielectric responses of SWNTs are strongly correlated with electronic transport of the corresponding FETs. The DC bias voltage in DFM plays a role analogous to the gate voltage in FET. A microscopic model based on the general continuity equation and numerical simulation is built to reveal the link between intrinsic properties such as carrier concentration and mobility and the macroscopic observable, i.e. dielectric responses, in DFM experiments. Local transport barriers in nanotubes, which influence the device transport behaviors, are also detected with nanometer scale resolution.</description><subject>Atomic/Molecular Structure and Spectra</subject><subject>Biomedicine</subject><subject>Biotechnology</subject><subject>Carbon</subject><subject>Carrier transport</subject><subject>Chemical vapor deposition</subject><subject>Chemistry and Materials Science</subject><subject>Condensed Matter Physics</subject><subject>Dielectric properties</subject><subject>Electric potential</subject><subject>Electrons</subject><subject>Experiments</subject><subject>Materials Science</subject><subject>Mathematical models</subject><subject>Microscopy</subject><subject>Nanomaterials</subject><subject>Nanostructure</subject><subject>Nanotechnology</subject><subject>Nanowires</subject><subject>Research Article</subject><subject>Semiconductor research</subject><subject>Single wall carbon nanotubes</subject><subject>Transistors</subject><subject>Transport</subject><subject>Voltage</subject><subject>介电响应</subject><subject>单壁碳纳米管</subject><subject>场效应晶体管</subject><subject>本征</subject><subject>纳米级分辨率</subject><subject>载流子传输</subject><subject>输运特性</subject><subject>非接触式探测</subject><issn>1998-0124</issn><issn>1998-0000</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp9kE9LAzEQxYMoWKsfwNuiFy-rmdlsmj1K8R8IXvQckmy2btkmbZIi-ulNWRXx4ECYgfzem-ERcgr0EiidXUVAnLGSQn41YvmxRybQNKKkufa_Z0B2SI5iXFLKEZiYkJe5d0mZNNgYi3XwuneLwndFerVF71LoXexNYVQIvQ1FCsrFtQ-piJkbbPmmhsG2u3_tXeGU82mrbTwmB50aoj356lPycnvzPL8vH5_uHubXj6WpAVMpjGVd2xjWmnpGtVC8FVpUbQcWRWOrpsWGVjNGNdRVVTGtRdNwRK01p2hsNSUXo2--fLO1MclVH40dBuWs30YJvAaGuHOZkvM_6NJvg8vXZQo5IKWCZQpGygQfY7CdXId-pcK7BCp3QcsxaJmDlrug5UfW4KiJmXULG345_yM6-1r06t1ik3U_mzjnADUXtPoEoOOMyQ</recordid><startdate>20141101</startdate><enddate>20141101</enddate><creator>Li, Yize Stephanie</creator><creator>Ge, Jun</creator><creator>Cai, Jinhua</creator><creator>Zhang, Jie</creator><creator>Lu, Wei</creator><creator>Liu, Jia</creator><creator>Chen, Liwei</creator><general>Tsinghua University Press</general><general>Springer Nature B.V</general><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SE</scope><scope>7SR</scope><scope>7U5</scope><scope>7X7</scope><scope>7XB</scope><scope>8AO</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>H8G</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>K9.</scope><scope>KB.</scope><scope>L7M</scope><scope>LK8</scope><scope>M0S</scope><scope>M7P</scope><scope>P64</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>20141101</creationdate><title>Contactless probing of the intrinsic carrier transport single-walled carbon nanotubes</title><author>Li, Yize Stephanie ; Ge, Jun ; Cai, Jinhua ; Zhang, Jie ; Lu, Wei ; Liu, Jia ; Chen, Liwei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c512t-8ce4fd9c4dc570b8a6d8b83df1e289e39d2903740b153334bb899622bbb602ce3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Atomic/Molecular Structure and Spectra</topic><topic>Biomedicine</topic><topic>Biotechnology</topic><topic>Carbon</topic><topic>Carrier transport</topic><topic>Chemical vapor deposition</topic><topic>Chemistry and Materials Science</topic><topic>Condensed Matter Physics</topic><topic>Dielectric properties</topic><topic>Electric potential</topic><topic>Electrons</topic><topic>Experiments</topic><topic>Materials Science</topic><topic>Mathematical models</topic><topic>Microscopy</topic><topic>Nanomaterials</topic><topic>Nanostructure</topic><topic>Nanotechnology</topic><topic>Nanowires</topic><topic>Research Article</topic><topic>Semiconductor research</topic><topic>Single wall carbon nanotubes</topic><topic>Transistors</topic><topic>Transport</topic><topic>Voltage</topic><topic>介电响应</topic><topic>单壁碳纳米管</topic><topic>场效应晶体管</topic><topic>本征</topic><topic>纳米级分辨率</topic><topic>载流子传输</topic><topic>输运特性</topic><topic>非接触式探测</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Yize Stephanie</creatorcontrib><creatorcontrib>Ge, Jun</creatorcontrib><creatorcontrib>Cai, Jinhua</creatorcontrib><creatorcontrib>Zhang, Jie</creatorcontrib><creatorcontrib>Lu, Wei</creatorcontrib><creatorcontrib>Liu, Jia</creatorcontrib><creatorcontrib>Chen, Liwei</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ProQuest Pharma Collection</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>Copper Technical Reference Library</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Biological Science Database</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Nano research</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Li, Yize Stephanie</au><au>Ge, Jun</au><au>Cai, Jinhua</au><au>Zhang, Jie</au><au>Lu, Wei</au><au>Liu, Jia</au><au>Chen, Liwei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Contactless probing of the intrinsic carrier transport single-walled carbon nanotubes</atitle><jtitle>Nano research</jtitle><stitle>Nano Res</stitle><addtitle>Nano Research</addtitle><date>2014-11-01</date><risdate>2014</risdate><volume>7</volume><issue>11</issue><spage>1623</spage><epage>1630</epage><pages>1623-1630</pages><issn>1998-0124</issn><eissn>1998-0000</eissn><abstract>Intrinsic carrier transport properties of single-walled carbon nanotubes have been probed by two parallel methods on the same individual tubes： The contactless dielectric force microscopy （DFM） technique and the conventional field-effect transistor （FET） method. The dielectric responses of SWNTs are strongly correlated with electronic transport of the corresponding FETs. The DC bias voltage in DFM plays a role analogous to the gate voltage in FET. A microscopic model based on the general continuity equation and numerical simulation is built to reveal the link between intrinsic properties such as carrier concentration and mobility and the macroscopic observable, i.e. dielectric responses, in DFM experiments. Local transport barriers in nanotubes, which influence the device transport behaviors, are also detected with nanometer scale resolution.</abstract><cop>Heidelberg</cop><pub>Tsinghua University Press</pub><doi>10.1007/s12274-014-0522-z</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1998-0124 |
| ispartof | Nano research, 2014-11, Vol.7 (11), p.1623-1630 |
| issn | 1998-0124 1998-0000 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1651422290 |
| source | SpringerLink Journals |
| subjects | Atomic/Molecular Structure and Spectra Biomedicine Biotechnology Carbon Carrier transport Chemical vapor deposition Chemistry and Materials Science Condensed Matter Physics Dielectric properties Electric potential Electrons Experiments Materials Science Mathematical models Microscopy Nanomaterials Nanostructure Nanotechnology Nanowires Research Article Semiconductor research Single wall carbon nanotubes Transistors Transport Voltage 介电响应 单壁碳纳米管 场效应晶体管 本征 纳米级分辨率 载流子传输 输运特性 非接触式探测 |
| title | Contactless probing of the intrinsic carrier transport single-walled carbon nanotubes |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T03%3A22%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Contactless%20probing%20of%20the%20intrinsic%20carrier%20transport%20single-walled%20carbon%20nanotubes&rft.jtitle=Nano%20research&rft.au=Li,%20Yize%20Stephanie&rft.date=2014-11-01&rft.volume=7&rft.issue=11&rft.spage=1623&rft.epage=1630&rft.pages=1623-1630&rft.issn=1998-0124&rft.eissn=1998-0000&rft_id=info:doi/10.1007/s12274-014-0522-z&rft_dat=%3Cproquest_cross%3E1651422290%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1626120084&rft_id=info:pmid/&rft_cqvip_id=666115680&rfr_iscdi=true |