A Comparative of 3D Surface Extraction Methods for Potential Metrology Applications

The number of factors influencing the CT process for metrology applications increases its complexity and cause the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation f...

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Veröffentlicht in:Key engineering materials 2014-06, Vol.615, p.15-21
Hauptverfasser: Ontiveros-Zepeda, Sinué, Brosed Dueso, Francisco Javier, Jiménez, Roberto, Yagüe-Fabra, José Antonio
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creator Ontiveros-Zepeda, Sinué
Brosed Dueso, Francisco Javier
Jiménez, Roberto
Yagüe-Fabra, José Antonio
description The number of factors influencing the CT process for metrology applications increases its complexity and cause the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation from the CT`s volume data. This paper presents different edge detection methods commonly used in areas like machine and computer vision and they are analyzed as an alternative to the commonly and commercially used for CT metrology applications. Each method is described and analyzed separately in order to highlight its advantages and disadvantages from a metrological point of view. An experimental comparative between two of them is also shown.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1651420740</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1651420740</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2135-910d3010f398dda3295169372325ddf1355f91d7446f09d700b4a89a257b712a3</originalsourceid><addsrcrecordid>eNqNkE1LAzEQhhdRUKv_IRfBy24zyWZ3cxAptX5gi0L1HNJsYrdsN2uSWvvvTang1dMMw_POME-SXAHOckyq4Xa7zbxqdBca06is02H4PJllBbAM2FFyBkVBUl5ydhx7DDTlFSlOk3PvVxhTqICdJfMRGtt1L50MzZdG1iB6h-YbZ6TSaPIdnFShsR2a6bC0tUfGOvRqw_6mbPdTZ1v7sUOjvm8bJfesv0hOjGy9vvytg-T9fvI2fkynLw9P49E0VQQoSzngmmLAhvKqriUlnEHBaUkoYXVtIsIMh7rM88JgXpcYL3JZcUlYuSiBSDpIrg97e2c_N9oHsW680m0rO203XkDBICe4zHFEbw6octZ7p43oXbOWbicAi71MEWWKP5kiyhRRpogyBbCYvz3ko5DOB62WYmU3rovv_XPDDwBAhL4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1651420740</pqid></control><display><type>article</type><title>A Comparative of 3D Surface Extraction Methods for Potential Metrology Applications</title><source>Scientific.net Journals</source><creator>Ontiveros-Zepeda, Sinué ; Brosed Dueso, Francisco Javier ; Jiménez, Roberto ; Yagüe-Fabra, José Antonio</creator><creatorcontrib>Ontiveros-Zepeda, Sinué ; Brosed Dueso, Francisco Javier ; Jiménez, Roberto ; Yagüe-Fabra, José Antonio</creatorcontrib><description>The number of factors influencing the CT process for metrology applications increases its complexity and cause the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation from the CT`s volume data. This paper presents different edge detection methods commonly used in areas like machine and computer vision and they are analyzed as an alternative to the commonly and commercially used for CT metrology applications. Each method is described and analyzed separately in order to highlight its advantages and disadvantages from a metrological point of view. An experimental comparative between two of them is also shown.</description><identifier>ISSN: 1013-9826</identifier><identifier>ISSN: 1662-9795</identifier><identifier>EISSN: 1662-9795</identifier><identifier>DOI: 10.4028/www.scientific.net/KEM.615.15</identifier><language>eng</language><publisher>Trans Tech Publications Ltd</publisher><subject>Complexity ; Computer vision ; Edge detection ; Extraction ; Formations ; Image segmentation ; Metrology ; Three dimensional</subject><ispartof>Key engineering materials, 2014-06, Vol.615, p.15-21</ispartof><rights>2014 Trans Tech Publications Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2135-910d3010f398dda3295169372325ddf1355f91d7446f09d700b4a89a257b712a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/3232?width=600</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Ontiveros-Zepeda, Sinué</creatorcontrib><creatorcontrib>Brosed Dueso, Francisco Javier</creatorcontrib><creatorcontrib>Jiménez, Roberto</creatorcontrib><creatorcontrib>Yagüe-Fabra, José Antonio</creatorcontrib><title>A Comparative of 3D Surface Extraction Methods for Potential Metrology Applications</title><title>Key engineering materials</title><description>The number of factors influencing the CT process for metrology applications increases its complexity and cause the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation from the CT`s volume data. This paper presents different edge detection methods commonly used in areas like machine and computer vision and they are analyzed as an alternative to the commonly and commercially used for CT metrology applications. Each method is described and analyzed separately in order to highlight its advantages and disadvantages from a metrological point of view. An experimental comparative between two of them is also shown.</description><subject>Complexity</subject><subject>Computer vision</subject><subject>Edge detection</subject><subject>Extraction</subject><subject>Formations</subject><subject>Image segmentation</subject><subject>Metrology</subject><subject>Three dimensional</subject><issn>1013-9826</issn><issn>1662-9795</issn><issn>1662-9795</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqNkE1LAzEQhhdRUKv_IRfBy24zyWZ3cxAptX5gi0L1HNJsYrdsN2uSWvvvTang1dMMw_POME-SXAHOckyq4Xa7zbxqdBca06is02H4PJllBbAM2FFyBkVBUl5ydhx7DDTlFSlOk3PvVxhTqICdJfMRGtt1L50MzZdG1iB6h-YbZ6TSaPIdnFShsR2a6bC0tUfGOvRqw_6mbPdTZ1v7sUOjvm8bJfesv0hOjGy9vvytg-T9fvI2fkynLw9P49E0VQQoSzngmmLAhvKqriUlnEHBaUkoYXVtIsIMh7rM88JgXpcYL3JZcUlYuSiBSDpIrg97e2c_N9oHsW680m0rO203XkDBICe4zHFEbw6octZ7p43oXbOWbicAi71MEWWKP5kiyhRRpogyBbCYvz3ko5DOB62WYmU3rovv_XPDDwBAhL4</recordid><startdate>20140601</startdate><enddate>20140601</enddate><creator>Ontiveros-Zepeda, Sinué</creator><creator>Brosed Dueso, Francisco Javier</creator><creator>Jiménez, Roberto</creator><creator>Yagüe-Fabra, José Antonio</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope></search><sort><creationdate>20140601</creationdate><title>A Comparative of 3D Surface Extraction Methods for Potential Metrology Applications</title><author>Ontiveros-Zepeda, Sinué ; Brosed Dueso, Francisco Javier ; Jiménez, Roberto ; Yagüe-Fabra, José Antonio</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2135-910d3010f398dda3295169372325ddf1355f91d7446f09d700b4a89a257b712a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Complexity</topic><topic>Computer vision</topic><topic>Edge detection</topic><topic>Extraction</topic><topic>Formations</topic><topic>Image segmentation</topic><topic>Metrology</topic><topic>Three dimensional</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ontiveros-Zepeda, Sinué</creatorcontrib><creatorcontrib>Brosed Dueso, Francisco Javier</creatorcontrib><creatorcontrib>Jiménez, Roberto</creatorcontrib><creatorcontrib>Yagüe-Fabra, José Antonio</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><jtitle>Key engineering materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ontiveros-Zepeda, Sinué</au><au>Brosed Dueso, Francisco Javier</au><au>Jiménez, Roberto</au><au>Yagüe-Fabra, José Antonio</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Comparative of 3D Surface Extraction Methods for Potential Metrology Applications</atitle><jtitle>Key engineering materials</jtitle><date>2014-06-01</date><risdate>2014</risdate><volume>615</volume><spage>15</spage><epage>21</epage><pages>15-21</pages><issn>1013-9826</issn><issn>1662-9795</issn><eissn>1662-9795</eissn><abstract>The number of factors influencing the CT process for metrology applications increases its complexity and cause the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation from the CT`s volume data. This paper presents different edge detection methods commonly used in areas like machine and computer vision and they are analyzed as an alternative to the commonly and commercially used for CT metrology applications. Each method is described and analyzed separately in order to highlight its advantages and disadvantages from a metrological point of view. An experimental comparative between two of them is also shown.</abstract><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/KEM.615.15</doi><tpages>7</tpages></addata></record>
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subjects Complexity
Computer vision
Edge detection
Extraction
Formations
Image segmentation
Metrology
Three dimensional
title A Comparative of 3D Surface Extraction Methods for Potential Metrology Applications
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T05%3A11%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Comparative%20of%203D%20Surface%20Extraction%20Methods%20for%20Potential%20Metrology%20Applications&rft.jtitle=Key%20engineering%20materials&rft.au=Ontiveros-Zepeda,%20Sinu%C3%A9&rft.date=2014-06-01&rft.volume=615&rft.spage=15&rft.epage=21&rft.pages=15-21&rft.issn=1013-9826&rft.eissn=1662-9795&rft_id=info:doi/10.4028/www.scientific.net/KEM.615.15&rft_dat=%3Cproquest_cross%3E1651420740%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1651420740&rft_id=info:pmid/&rfr_iscdi=true