A Comparative of 3D Surface Extraction Methods for Potential Metrology Applications

The number of factors influencing the CT process for metrology applications increases its complexity and cause the loss of accuracy during CT measurements. One of the most critical is the edge detection also called surface extraction or image segmentation, which is the process of surface formation from the CT`s volume data. This paper presents different edge detection methods commonly used in areas like machine and computer vision and they are analyzed as an alternative to the commonly and commercially used for CT metrology applications. Each method is described and analyzed separately in order to highlight its advantages and disadvantages from a metrological point of view. An experimental comparative between two of them is also shown.