Crystal size shrinking in radiation-induced crosslinking of polytetrafluoroethylene: Synchrotron small angle X-ray scattering and scanning electron microscopy analysis

SAXS curves of PTFE (a), XPTFE-150 (b), XPTFE-500 (c), XPTFE-1000 (d), XPTFE-3000 and (e), Scattering intensity decreased with an increase of dose in Fig. It indicates that the content of lamellae decreases as the radiation increases. [Display omitted] •Crystallite size of crosslinked PTFE was inves...

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Veröffentlicht in:European polymer journal 2014-10, Vol.59, p.156-160
Hauptverfasser: Tang, Zhongfeng, Wang, Mouhua, Tian, Feng, Xu, Lu, Wu, Guozhong
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Wang, Mouhua
Tian, Feng
Xu, Lu
Wu, Guozhong
description SAXS curves of PTFE (a), XPTFE-150 (b), XPTFE-500 (c), XPTFE-1000 (d), XPTFE-3000 and (e), Scattering intensity decreased with an increase of dose in Fig. It indicates that the content of lamellae decreases as the radiation increases. [Display omitted] •Crystallite size of crosslinked PTFE was investigated using SAXS at the first time.•Crystallite size of crosslinked PTFE became smaller with an increase of doses.•Crystallite size will become smaller due to the restriction of molecule mobility.•Crystallite size shrinking of crosslinked PTFE was further confirmed by DSC and SEM. The crystal structure of crosslinked polytetrafluoroethylene (XPTFE) and its morphological variations as compared with pure PTFE were investigated using differential scanning calorimetry, synchrotron small angle X-ray scattering (SAXS), and scanning electron microscopy (SEM). The XPTFE samples were obtained by irradiating PTFE at the melt state using different radiation doses. Results showed that the melting temperature of the XPTFE decreases with the increase in radiation dose. The crystal melting enthalpy increases under low-dose irradiation. The scattering intensity decreases with the increase in radiation dose, which indicates the decrease in crystal size. Based on the SAXS patterns, the XPTFE crystallite size is smaller than the PTFE crystallite size. The difference in crystal sizes is more pronounced for XPTFE obtained under high radiation doses. This finding is confirmed by the SEM images of the XPTFE fractured surfaces. These results provide a reasonable explanation for the improved transparency and the relatively low crystallinity and high wear resistance of XPTFE compared with PTFE.
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[Display omitted] •Crystallite size of crosslinked PTFE was investigated using SAXS at the first time.•Crystallite size of crosslinked PTFE became smaller with an increase of doses.•Crystallite size will become smaller due to the restriction of molecule mobility.•Crystallite size shrinking of crosslinked PTFE was further confirmed by DSC and SEM. The crystal structure of crosslinked polytetrafluoroethylene (XPTFE) and its morphological variations as compared with pure PTFE were investigated using differential scanning calorimetry, synchrotron small angle X-ray scattering (SAXS), and scanning electron microscopy (SEM). The XPTFE samples were obtained by irradiating PTFE at the melt state using different radiation doses. Results showed that the melting temperature of the XPTFE decreases with the increase in radiation dose. The crystal melting enthalpy increases under low-dose irradiation. The scattering intensity decreases with the increase in radiation dose, which indicates the decrease in crystal size. Based on the SAXS patterns, the XPTFE crystallite size is smaller than the PTFE crystallite size. The difference in crystal sizes is more pronounced for XPTFE obtained under high radiation doses. This finding is confirmed by the SEM images of the XPTFE fractured surfaces. 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[Display omitted] •Crystallite size of crosslinked PTFE was investigated using SAXS at the first time.•Crystallite size of crosslinked PTFE became smaller with an increase of doses.•Crystallite size will become smaller due to the restriction of molecule mobility.•Crystallite size shrinking of crosslinked PTFE was further confirmed by DSC and SEM. The crystal structure of crosslinked polytetrafluoroethylene (XPTFE) and its morphological variations as compared with pure PTFE were investigated using differential scanning calorimetry, synchrotron small angle X-ray scattering (SAXS), and scanning electron microscopy (SEM). The XPTFE samples were obtained by irradiating PTFE at the melt state using different radiation doses. Results showed that the melting temperature of the XPTFE decreases with the increase in radiation dose. The crystal melting enthalpy increases under low-dose irradiation. The scattering intensity decreases with the increase in radiation dose, which indicates the decrease in crystal size. Based on the SAXS patterns, the XPTFE crystallite size is smaller than the PTFE crystallite size. The difference in crystal sizes is more pronounced for XPTFE obtained under high radiation doses. This finding is confirmed by the SEM images of the XPTFE fractured surfaces. 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The scattering intensity decreases with the increase in radiation dose, which indicates the decrease in crystal size. Based on the SAXS patterns, the XPTFE crystallite size is smaller than the PTFE crystallite size. The difference in crystal sizes is more pronounced for XPTFE obtained under high radiation doses. This finding is confirmed by the SEM images of the XPTFE fractured surfaces. These results provide a reasonable explanation for the improved transparency and the relatively low crystallinity and high wear resistance of XPTFE compared with PTFE.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.eurpolymj.2014.07.013</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0001-9135-7213</orcidid></addata></record>
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subjects Applied sciences
Crosslinking
Crystal
Crystallites
Crystals
Exact sciences and technology
Melting
Organic polymers
Physicochemistry of polymers
Polytetrafluoroethylene
Polytetrafluoroethylenes
Properties and characterization
Radiation
SAXS
Scanning electron microscopy
Small angle X ray scattering
Structure, morphology and analysis
title Crystal size shrinking in radiation-induced crosslinking of polytetrafluoroethylene: Synchrotron small angle X-ray scattering and scanning electron microscopy analysis
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