Growth and Degradation of an Anodic Oxide Film on Titanium in Sulphuric Acid Observed by Ellipso-microscopy
The surface of polycrystalline titanium polarised anodically in 0.05moldm−3 sulphuric acid was monitored using an ellipso-microscope. During dynamic polarisation, a patch-like bright image was seen on an ellipso-microscopic view, and the brightness and image changed with increase in potential. The c...
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| Veröffentlicht in: | Electrochimica acta 2014-10, Vol.144, p.56-63 |
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| container_title | Electrochimica acta |
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| creator | Fushimi, K. Kurauchi, K. Yamamoto, Y. Nakanishi, T. Hasegawa, Y. Ohtsuka, T. |
| description | The surface of polycrystalline titanium polarised anodically in 0.05moldm−3 sulphuric acid was monitored using an ellipso-microscope. During dynamic polarisation, a patch-like bright image was seen on an ellipso-microscopic view, and the brightness and image changed with increase in potential. The change in the brightness and image mainly corresponded to growth of an anodic oxide film on the surface. An in situ monitoring using the ellipso-microscope revealed that the film formation rate was dependent on the crystallographic orientation of the substrate. Breakdown of the film induced in a solution containing bromide ions was also monitored using the microscope. Prior to the pitting propagation, the surface was partially changed with flow of a large anodic current. AES measurement revealed that the formation of bromo-oxide resulted in localised film degradation followed by pitting corrosion. |
| doi_str_mv | 10.1016/j.electacta.2014.08.082 |
| format | Article |
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During dynamic polarisation, a patch-like bright image was seen on an ellipso-microscopic view, and the brightness and image changed with increase in potential. The change in the brightness and image mainly corresponded to growth of an anodic oxide film on the surface. An in situ monitoring using the ellipso-microscope revealed that the film formation rate was dependent on the crystallographic orientation of the substrate. Breakdown of the film induced in a solution containing bromide ions was also monitored using the microscope. Prior to the pitting propagation, the surface was partially changed with flow of a large anodic current. AES measurement revealed that the formation of bromo-oxide resulted in localised film degradation followed by pitting corrosion.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/j.electacta.2014.08.082</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Anodic ; breakdown ; Brightness ; crystallographic orientation ; Degradation ; ellipso-microscopy ; Oxide coatings ; passive film ; Pitting (corrosion) ; Sulfuric acid ; Titanium</subject><ispartof>Electrochimica acta, 2014-10, Vol.144, p.56-63</ispartof><rights>2014 Elsevier Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c451t-2c839790815884091fc3eeda2f3020280ba355419cfb25dec7051d1e53f2a13b3</citedby><cites>FETCH-LOGICAL-c451t-2c839790815884091fc3eeda2f3020280ba355419cfb25dec7051d1e53f2a13b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0013468614017162$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Fushimi, K.</creatorcontrib><creatorcontrib>Kurauchi, K.</creatorcontrib><creatorcontrib>Yamamoto, Y.</creatorcontrib><creatorcontrib>Nakanishi, T.</creatorcontrib><creatorcontrib>Hasegawa, Y.</creatorcontrib><creatorcontrib>Ohtsuka, T.</creatorcontrib><title>Growth and Degradation of an Anodic Oxide Film on Titanium in Sulphuric Acid Observed by Ellipso-microscopy</title><title>Electrochimica acta</title><description>The surface of polycrystalline titanium polarised anodically in 0.05moldm−3 sulphuric acid was monitored using an ellipso-microscope. During dynamic polarisation, a patch-like bright image was seen on an ellipso-microscopic view, and the brightness and image changed with increase in potential. The change in the brightness and image mainly corresponded to growth of an anodic oxide film on the surface. An in situ monitoring using the ellipso-microscope revealed that the film formation rate was dependent on the crystallographic orientation of the substrate. Breakdown of the film induced in a solution containing bromide ions was also monitored using the microscope. Prior to the pitting propagation, the surface was partially changed with flow of a large anodic current. AES measurement revealed that the formation of bromo-oxide resulted in localised film degradation followed by pitting corrosion.</description><subject>Anodic</subject><subject>breakdown</subject><subject>Brightness</subject><subject>crystallographic orientation</subject><subject>Degradation</subject><subject>ellipso-microscopy</subject><subject>Oxide coatings</subject><subject>passive film</subject><subject>Pitting (corrosion)</subject><subject>Sulfuric acid</subject><subject>Titanium</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqFkEFP3DAQhS3USt0u_Q31kUuWsR0nznFFgSIh7QE4W449KV6SONgJ7f77erWIK9KTRpr55mnmEfKTwYYBqy73G-zRziZrw4GVG1BZ_IysmKpFIZRsvpAVABNFWanqG_me0h4A6qqGFXm5jeHv_EzN6Ogv_BONM7MPIw1dbtHtGJy3dPfPO6Q3vh9oHj362Yx-Gagf6cPST89LzMzWekd3bcL4ho62B3rd935KoRi8jSHZMB3OydfO9Al_vNc1ebq5frz6Xdzvbu-utveFLSWbC26VaOoGFJNKldCwzgpEZ3gngANX0BohZcka27VcOrQ1SOYYStFxw0Qr1uTi5DvF8LpgmvXgk8W-NyOGJWlWSZZ9m0pmtD6hxxtTxE5P0Q8mHjQDfYxX7_VHvPoYrwaVxfPm9rSJ-ZM3j1En63G06HzMvHbBf-rxH9mIh7k</recordid><startdate>20141020</startdate><enddate>20141020</enddate><creator>Fushimi, K.</creator><creator>Kurauchi, K.</creator><creator>Yamamoto, Y.</creator><creator>Nakanishi, T.</creator><creator>Hasegawa, Y.</creator><creator>Ohtsuka, T.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SE</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope><scope>KR7</scope><scope>L7M</scope></search><sort><creationdate>20141020</creationdate><title>Growth and Degradation of an Anodic Oxide Film on Titanium in Sulphuric Acid Observed by Ellipso-microscopy</title><author>Fushimi, K. ; Kurauchi, K. ; Yamamoto, Y. ; Nakanishi, T. ; Hasegawa, Y. ; Ohtsuka, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c451t-2c839790815884091fc3eeda2f3020280ba355419cfb25dec7051d1e53f2a13b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Anodic</topic><topic>breakdown</topic><topic>Brightness</topic><topic>crystallographic orientation</topic><topic>Degradation</topic><topic>ellipso-microscopy</topic><topic>Oxide coatings</topic><topic>passive film</topic><topic>Pitting (corrosion)</topic><topic>Sulfuric acid</topic><topic>Titanium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fushimi, K.</creatorcontrib><creatorcontrib>Kurauchi, K.</creatorcontrib><creatorcontrib>Yamamoto, Y.</creatorcontrib><creatorcontrib>Nakanishi, T.</creatorcontrib><creatorcontrib>Hasegawa, Y.</creatorcontrib><creatorcontrib>Ohtsuka, T.</creatorcontrib><collection>CrossRef</collection><collection>Corrosion Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fushimi, K.</au><au>Kurauchi, K.</au><au>Yamamoto, Y.</au><au>Nakanishi, T.</au><au>Hasegawa, Y.</au><au>Ohtsuka, T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth and Degradation of an Anodic Oxide Film on Titanium in Sulphuric Acid Observed by Ellipso-microscopy</atitle><jtitle>Electrochimica acta</jtitle><date>2014-10-20</date><risdate>2014</risdate><volume>144</volume><spage>56</spage><epage>63</epage><pages>56-63</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><abstract>The surface of polycrystalline titanium polarised anodically in 0.05moldm−3 sulphuric acid was monitored using an ellipso-microscope. During dynamic polarisation, a patch-like bright image was seen on an ellipso-microscopic view, and the brightness and image changed with increase in potential. The change in the brightness and image mainly corresponded to growth of an anodic oxide film on the surface. An in situ monitoring using the ellipso-microscope revealed that the film formation rate was dependent on the crystallographic orientation of the substrate. Breakdown of the film induced in a solution containing bromide ions was also monitored using the microscope. Prior to the pitting propagation, the surface was partially changed with flow of a large anodic current. AES measurement revealed that the formation of bromo-oxide resulted in localised film degradation followed by pitting corrosion.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.electacta.2014.08.082</doi><tpages>8</tpages></addata></record> |
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| subjects | Anodic breakdown Brightness crystallographic orientation Degradation ellipso-microscopy Oxide coatings passive film Pitting (corrosion) Sulfuric acid Titanium |
| title | Growth and Degradation of an Anodic Oxide Film on Titanium in Sulphuric Acid Observed by Ellipso-microscopy |
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