Alternative emitter substrates for Ionic Liquid Ion Source implementation in focused ion beams
Ionic Liquid Ion Sources (ILIS) are high-brightness sources with properties adequate for implementation in Focused Ion Beam Applications. ILIS are capable of producing positively or negatively charged beams of heavy and reactive ions, which could be used advantageously in applications such as lithog...
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description | Ionic Liquid Ion Sources (ILIS) are high-brightness sources with properties adequate for implementation in Focused Ion Beam Applications. ILIS are capable of producing positively or negatively charged beams of heavy and reactive ions, which could be used advantageously in applications such as lithography and localized etching. For FIB use, stable operation over lifetimes in excess of hundreds of hours must be demonstrated. In this paper, we describe an oxidation treatment for ILIS emitters that allows better wetting by the ionic liquid. This emitter is implemented with a distal electrode contact to improve its electrochemical behavior. The current-voltage responses of this configuration are presented, and coarse retarding potential analysis measurements indicate that the alternative ILIS geometry produces a beam population similar to the traditional configuration. Current measurements over prolonged tests demonstrate that the sources can operate for several hundred hours and are capable of excellent short-term stability, but random variations in the emission over hour timescales indicate that factors such as backsputtering, tip geometry and liquid contamination should be controlled to guarantee prolonged stable operation. |
doi_str_mv | 10.1016/j.mee.2014.02.032 |
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ILIS are capable of producing positively or negatively charged beams of heavy and reactive ions, which could be used advantageously in applications such as lithography and localized etching. For FIB use, stable operation over lifetimes in excess of hundreds of hours must be demonstrated. In this paper, we describe an oxidation treatment for ILIS emitters that allows better wetting by the ionic liquid. This emitter is implemented with a distal electrode contact to improve its electrochemical behavior. The current-voltage responses of this configuration are presented, and coarse retarding potential analysis measurements indicate that the alternative ILIS geometry produces a beam population similar to the traditional configuration. Current measurements over prolonged tests demonstrate that the sources can operate for several hundred hours and are capable of excellent short-term stability, but random variations in the emission over hour timescales indicate that factors such as backsputtering, tip geometry and liquid contamination should be controlled to guarantee prolonged stable operation.</description><identifier>ISSN: 0167-9317</identifier><identifier>EISSN: 1873-5568</identifier><identifier>DOI: 10.1016/j.mee.2014.02.032</identifier><identifier>CODEN: MIENEF</identifier><language>eng</language><publisher>Amsterdam: Elsevier</publisher><subject>Applied sciences ; Beams (radiation) ; Condensed matter: structure, mechanical and thermal properties ; Corrosion ; Corrosion mechanisms ; Cross-disciplinary physics: materials science; rheology ; Electrodes ; Electronics ; Emittance ; Etching ; Exact sciences and technology ; Ion beams ; Ion sources ; Ionic liquids ; Lithography ; Materials science ; Metals. Metallurgy ; Methods of nanofabrication ; Microelectronic fabrication (materials and surfaces technology) ; Nanolithography ; Physics ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Solid-fluid interfaces ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Wetting</subject><ispartof>Microelectronic engineering, 2014-07, Vol.123, p.13-17</ispartof><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c374t-74a2713fa358bdc02cf4acadd499285f0b694193ebf3adf6a4ff8e6fbcd971a83</citedby><cites>FETCH-LOGICAL-c374t-74a2713fa358bdc02cf4acadd499285f0b694193ebf3adf6a4ff8e6fbcd971a83</cites><orcidid>0000-0003-0256-0477</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23929,23930,25139,27923,27924</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28878203$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>PEREZ-MARTINEZ, Carla</creatorcontrib><creatorcontrib>ROJAS-HERRERA, Jimmy</creatorcontrib><creatorcontrib>LOZANO, Paulo C</creatorcontrib><title>Alternative emitter substrates for Ionic Liquid Ion Source implementation in focused ion beams</title><title>Microelectronic engineering</title><description>Ionic Liquid Ion Sources (ILIS) are high-brightness sources with properties adequate for implementation in Focused Ion Beam Applications. ILIS are capable of producing positively or negatively charged beams of heavy and reactive ions, which could be used advantageously in applications such as lithography and localized etching. For FIB use, stable operation over lifetimes in excess of hundreds of hours must be demonstrated. In this paper, we describe an oxidation treatment for ILIS emitters that allows better wetting by the ionic liquid. This emitter is implemented with a distal electrode contact to improve its electrochemical behavior. The current-voltage responses of this configuration are presented, and coarse retarding potential analysis measurements indicate that the alternative ILIS geometry produces a beam population similar to the traditional configuration. Current measurements over prolonged tests demonstrate that the sources can operate for several hundred hours and are capable of excellent short-term stability, but random variations in the emission over hour timescales indicate that factors such as backsputtering, tip geometry and liquid contamination should be controlled to guarantee prolonged stable operation.</description><subject>Applied sciences</subject><subject>Beams (radiation)</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Corrosion</subject><subject>Corrosion mechanisms</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electrodes</subject><subject>Electronics</subject><subject>Emittance</subject><subject>Etching</subject><subject>Exact sciences and technology</subject><subject>Ion beams</subject><subject>Ion sources</subject><subject>Ionic liquids</subject><subject>Lithography</subject><subject>Materials science</subject><subject>Metals. Metallurgy</subject><subject>Methods of nanofabrication</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>Nanolithography</subject><subject>Physics</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Solid-fluid interfaces</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Wetting</subject><issn>0167-9317</issn><issn>1873-5568</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNo9kEtLAzEUhYMoWKs_wF02gpsZ85pJZlmKj0LBhbo1ZDI3kDKPNskI_ntTWlxdvst3zuIgdE9JSQmtn3blAFAyQkVJWEk4u0ALqiQvqqpWl2iRHVk0nMprdBPjjmQWRC3Q96pPEEaT_A9gGHzKhOPcxhRMgojdFPBmGr3FW3-YfXcE_DHNwQL2w76HAcaU0_nrx2zbOUKHj9iCGeItunKmj3B3vkv09fL8uX4rtu-vm_VqW1guRSqkMExS7gyvVNtZwqwTxpquE03DVOVIWzeCNhxax03naiOcU1C71naNpEbxJXo89e7DdJghJj34aKHvzQjTHDWtKyoIJzXNKj2pNkwxBnB6H_xgwq-mRB-31Dudt9THLTVhOm-ZMw_nehOt6V0wo_XxP8iUkooRzv8AFP93Tg</recordid><startdate>20140701</startdate><enddate>20140701</enddate><creator>PEREZ-MARTINEZ, Carla</creator><creator>ROJAS-HERRERA, Jimmy</creator><creator>LOZANO, Paulo C</creator><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-0256-0477</orcidid></search><sort><creationdate>20140701</creationdate><title>Alternative emitter substrates for Ionic Liquid Ion Source implementation in focused ion beams</title><author>PEREZ-MARTINEZ, Carla ; ROJAS-HERRERA, Jimmy ; LOZANO, Paulo C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c374t-74a2713fa358bdc02cf4acadd499285f0b694193ebf3adf6a4ff8e6fbcd971a83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Applied sciences</topic><topic>Beams (radiation)</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Corrosion</topic><topic>Corrosion mechanisms</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electrodes</topic><topic>Electronics</topic><topic>Emittance</topic><topic>Etching</topic><topic>Exact sciences and technology</topic><topic>Ion beams</topic><topic>Ion sources</topic><topic>Ionic liquids</topic><topic>Lithography</topic><topic>Materials science</topic><topic>Metals. Metallurgy</topic><topic>Methods of nanofabrication</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>Nanolithography</topic><topic>Physics</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Solid-fluid interfaces</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Wetting</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>PEREZ-MARTINEZ, Carla</creatorcontrib><creatorcontrib>ROJAS-HERRERA, Jimmy</creatorcontrib><creatorcontrib>LOZANO, Paulo C</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronic engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>PEREZ-MARTINEZ, Carla</au><au>ROJAS-HERRERA, Jimmy</au><au>LOZANO, Paulo C</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Alternative emitter substrates for Ionic Liquid Ion Source implementation in focused ion beams</atitle><jtitle>Microelectronic engineering</jtitle><date>2014-07-01</date><risdate>2014</risdate><volume>123</volume><spage>13</spage><epage>17</epage><pages>13-17</pages><issn>0167-9317</issn><eissn>1873-5568</eissn><coden>MIENEF</coden><abstract>Ionic Liquid Ion Sources (ILIS) are high-brightness sources with properties adequate for implementation in Focused Ion Beam Applications. ILIS are capable of producing positively or negatively charged beams of heavy and reactive ions, which could be used advantageously in applications such as lithography and localized etching. For FIB use, stable operation over lifetimes in excess of hundreds of hours must be demonstrated. In this paper, we describe an oxidation treatment for ILIS emitters that allows better wetting by the ionic liquid. This emitter is implemented with a distal electrode contact to improve its electrochemical behavior. The current-voltage responses of this configuration are presented, and coarse retarding potential analysis measurements indicate that the alternative ILIS geometry produces a beam population similar to the traditional configuration. Current measurements over prolonged tests demonstrate that the sources can operate for several hundred hours and are capable of excellent short-term stability, but random variations in the emission over hour timescales indicate that factors such as backsputtering, tip geometry and liquid contamination should be controlled to guarantee prolonged stable operation.</abstract><cop>Amsterdam</cop><pub>Elsevier</pub><doi>10.1016/j.mee.2014.02.032</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0003-0256-0477</orcidid></addata></record> |
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subjects | Applied sciences Beams (radiation) Condensed matter: structure, mechanical and thermal properties Corrosion Corrosion mechanisms Cross-disciplinary physics: materials science rheology Electrodes Electronics Emittance Etching Exact sciences and technology Ion beams Ion sources Ionic liquids Lithography Materials science Metals. Metallurgy Methods of nanofabrication Microelectronic fabrication (materials and surfaces technology) Nanolithography Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Solid-fluid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Wetting |
title | Alternative emitter substrates for Ionic Liquid Ion Source implementation in focused ion beams |
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