Witness sample preparation for measuring antireflection coatings
Measurement of antireflection coating of witness samples from across the worldwide industry has been shown to have excess variability from a sampling taken for the OSA Topical Meeting on Optical Interference Coatings: Measurement Problem. Various sample preparation techniques have been discussed wit...
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| Veröffentlicht in: | Applied optics (2004) 2014-02, Vol.53 (4), p.A52-A55 |
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| container_end_page | A55 |
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| container_issue | 4 |
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| container_title | Applied optics (2004) |
| container_volume | 53 |
| creator | Willey, Ronald R |
| description | Measurement of antireflection coating of witness samples from across the worldwide industry has been shown to have excess variability from a sampling taken for the OSA Topical Meeting on Optical Interference Coatings: Measurement Problem. Various sample preparation techniques have been discussed with their limitations, and a preferred technique is recommended with its justification, calibration procedures, and limitations. The common practice of grinding the second side to reduce its reflection is less than satisfactory. One recommended practice is to paint the polished second side, which reduces its reflection to almost zero. A method to evaluate the suitability of given paints is also described. |
| doi_str_mv | 10.1364/AO.53.000A52 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1651397214</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1651397214</sourcerecordid><originalsourceid>FETCH-LOGICAL-c394t-b53887c4eb79a5ee33a5deaa00351e16efb9f39dad6d2506c3fcf3d77f52c7fb3</originalsourceid><addsrcrecordid>eNqFkD1PwzAQhi0EoqWwMaOMDCTYPjupN6KKL6lSFxBsluOcq6B8YScD_56UFlamO-kevbr3IeSS0YRBKm7zTSIhoZTmkh-ROWdSxsBSeUzm06pixpfvM3IWwgelIIXKTsmMC8kEF2pO7t6qocUQomCavsao99gbb4aqayPX-ahBE0ZftdvItEPl0dVof462m6B2G87JiTN1wIvDXJDXh_uX1VO83jw-r_J1bEGJIS4kLJeZFVhkykhEACNLNGb3E0OWoiuUA1WaMi25pKkFZx2UWeYkt5krYEGu97m97z5HDINuqmCxrk2L3Rj01JiByjgT_6NCKQY8pXxCb_ao9V0IUz3d-6ox_kszqnd6db7REvRe74RfHZLHosHyD_71Cd-jPHX9</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1499132602</pqid></control><display><type>article</type><title>Witness sample preparation for measuring antireflection coatings</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Willey, Ronald R</creator><creatorcontrib>Willey, Ronald R</creatorcontrib><description>Measurement of antireflection coating of witness samples from across the worldwide industry has been shown to have excess variability from a sampling taken for the OSA Topical Meeting on Optical Interference Coatings: Measurement Problem. Various sample preparation techniques have been discussed with their limitations, and a preferred technique is recommended with its justification, calibration procedures, and limitations. The common practice of grinding the second side to reduce its reflection is less than satisfactory. One recommended practice is to paint the polished second side, which reduces its reflection to almost zero. A method to evaluate the suitability of given paints is also described.</description><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 2155-3165</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/AO.53.000A52</identifier><identifier>PMID: 24514249</identifier><language>eng</language><publisher>United States</publisher><subject>Antireflection coatings ; Calibration ; Paints ; Polished ; Protective coatings ; Reflection ; Sampling</subject><ispartof>Applied optics (2004), 2014-02, Vol.53 (4), p.A52-A55</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c394t-b53887c4eb79a5ee33a5deaa00351e16efb9f39dad6d2506c3fcf3d77f52c7fb3</citedby><cites>FETCH-LOGICAL-c394t-b53887c4eb79a5ee33a5deaa00351e16efb9f39dad6d2506c3fcf3d77f52c7fb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,3244,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/24514249$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Willey, Ronald R</creatorcontrib><title>Witness sample preparation for measuring antireflection coatings</title><title>Applied optics (2004)</title><addtitle>Appl Opt</addtitle><description>Measurement of antireflection coating of witness samples from across the worldwide industry has been shown to have excess variability from a sampling taken for the OSA Topical Meeting on Optical Interference Coatings: Measurement Problem. Various sample preparation techniques have been discussed with their limitations, and a preferred technique is recommended with its justification, calibration procedures, and limitations. The common practice of grinding the second side to reduce its reflection is less than satisfactory. One recommended practice is to paint the polished second side, which reduces its reflection to almost zero. A method to evaluate the suitability of given paints is also described.</description><subject>Antireflection coatings</subject><subject>Calibration</subject><subject>Paints</subject><subject>Polished</subject><subject>Protective coatings</subject><subject>Reflection</subject><subject>Sampling</subject><issn>1559-128X</issn><issn>2155-3165</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqFkD1PwzAQhi0EoqWwMaOMDCTYPjupN6KKL6lSFxBsluOcq6B8YScD_56UFlamO-kevbr3IeSS0YRBKm7zTSIhoZTmkh-ROWdSxsBSeUzm06pixpfvM3IWwgelIIXKTsmMC8kEF2pO7t6qocUQomCavsao99gbb4aqayPX-ahBE0ZftdvItEPl0dVof462m6B2G87JiTN1wIvDXJDXh_uX1VO83jw-r_J1bEGJIS4kLJeZFVhkykhEACNLNGb3E0OWoiuUA1WaMi25pKkFZx2UWeYkt5krYEGu97m97z5HDINuqmCxrk2L3Rj01JiByjgT_6NCKQY8pXxCb_ao9V0IUz3d-6ox_kszqnd6db7REvRe74RfHZLHosHyD_71Cd-jPHX9</recordid><startdate>20140201</startdate><enddate>20140201</enddate><creator>Willey, Ronald R</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20140201</creationdate><title>Witness sample preparation for measuring antireflection coatings</title><author>Willey, Ronald R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c394t-b53887c4eb79a5ee33a5deaa00351e16efb9f39dad6d2506c3fcf3d77f52c7fb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Antireflection coatings</topic><topic>Calibration</topic><topic>Paints</topic><topic>Polished</topic><topic>Protective coatings</topic><topic>Reflection</topic><topic>Sampling</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Willey, Ronald R</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Willey, Ronald R</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Witness sample preparation for measuring antireflection coatings</atitle><jtitle>Applied optics (2004)</jtitle><addtitle>Appl Opt</addtitle><date>2014-02-01</date><risdate>2014</risdate><volume>53</volume><issue>4</issue><spage>A52</spage><epage>A55</epage><pages>A52-A55</pages><issn>1559-128X</issn><eissn>2155-3165</eissn><eissn>1539-4522</eissn><abstract>Measurement of antireflection coating of witness samples from across the worldwide industry has been shown to have excess variability from a sampling taken for the OSA Topical Meeting on Optical Interference Coatings: Measurement Problem. Various sample preparation techniques have been discussed with their limitations, and a preferred technique is recommended with its justification, calibration procedures, and limitations. The common practice of grinding the second side to reduce its reflection is less than satisfactory. One recommended practice is to paint the polished second side, which reduces its reflection to almost zero. A method to evaluate the suitability of given paints is also described.</abstract><cop>United States</cop><pmid>24514249</pmid><doi>10.1364/AO.53.000A52</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1559-128X |
| ispartof | Applied optics (2004), 2014-02, Vol.53 (4), p.A52-A55 |
| issn | 1559-128X 2155-3165 1539-4522 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_1651397214 |
| source | Alma/SFX Local Collection; Optica Publishing Group Journals |
| subjects | Antireflection coatings Calibration Paints Polished Protective coatings Reflection Sampling |
| title | Witness sample preparation for measuring antireflection coatings |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T09%3A16%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Witness%20sample%20preparation%20for%20measuring%20antireflection%20coatings&rft.jtitle=Applied%20optics%20(2004)&rft.au=Willey,%20Ronald%20R&rft.date=2014-02-01&rft.volume=53&rft.issue=4&rft.spage=A52&rft.epage=A55&rft.pages=A52-A55&rft.issn=1559-128X&rft.eissn=2155-3165&rft_id=info:doi/10.1364/AO.53.000A52&rft_dat=%3Cproquest_cross%3E1651397214%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1499132602&rft_id=info:pmid/24514249&rfr_iscdi=true |