Effects of conducted electromagnetic interference on analogue-to-digital converter
The effects of conducted electromagnetic interference on an analogue-to- digital converter (ADC) are presented by the measurement. The measurement results reveal that, the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a nov...
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Veröffentlicht in: | Electronics letters 2011-01, Vol.47 (1), p.1-1 |
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creator | Wan, F Duval, F Savatier, X Louis, A Mazari, B |
description | The effects of conducted electromagnetic interference on an analogue-to- digital converter (ADC) are presented by the measurement. The measurement results reveal that, the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC. |
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fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_1642213035</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1642213035</sourcerecordid><originalsourceid>FETCH-LOGICAL-p615-b7ebd9f0c5426a3a95df3a8230e397c2b84f0f9ac8649dd59231845e0cc135013</originalsourceid><addsrcrecordid>eNpdj01LAzEYhIMouFb_Q8CLl0A-d5OjlPoBhYL04K1kkzfLlm1Sk6y_3y168jTM8MzAXKGGCUWJYezzGjWUMkEUM_IW3ZVyXCw3pmvQxyYEcLXgFLBL0c-ugscwLVlOJztEqKPDY6yQA2SIDnCK2EY7pWEGUhPx4zBWO13a35AX7h7dBDsVePjTFdq_bPbrN7Ldvb6vn7fk3DJF-g56bwJ1SvLWCmuUD8JqLigI0zneaxloMNbpVhrvleGCaamAOnf5xcQKPf3OnnP6mqHUw2ksDqbJRkhzObBWcs4EFWpBH_-hxzTn5cOFYtpQzrUQP5lrWt4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1618902283</pqid></control><display><type>article</type><title>Effects of conducted electromagnetic interference on analogue-to-digital converter</title><source>Alma/SFX Local Collection</source><creator>Wan, F ; Duval, F ; Savatier, X ; Louis, A ; Mazari, B</creator><creatorcontrib>Wan, F ; Duval, F ; Savatier, X ; Louis, A ; Mazari, B</creatorcontrib><description>The effects of conducted electromagnetic interference on an analogue-to- digital converter (ADC) are presented by the measurement. The measurement results reveal that, the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC.</description><identifier>ISSN: 0013-5194</identifier><identifier>EISSN: 1350-911X</identifier><identifier>CODEN: ELLEAK</identifier><language>eng</language><publisher>Stevenage: John Wiley & Sons, Inc</publisher><subject>Analog to digital conversion ; Conversion ; Converters ; Criteria ; Digital ; Direct current ; Electromagnetic interference ; Immunity</subject><ispartof>Electronics letters, 2011-01, Vol.47 (1), p.1-1</ispartof><rights>Copyright The Institution of Engineering & Technology Jan 6, 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780</link.rule.ids></links><search><creatorcontrib>Wan, F</creatorcontrib><creatorcontrib>Duval, F</creatorcontrib><creatorcontrib>Savatier, X</creatorcontrib><creatorcontrib>Louis, A</creatorcontrib><creatorcontrib>Mazari, B</creatorcontrib><title>Effects of conducted electromagnetic interference on analogue-to-digital converter</title><title>Electronics letters</title><description>The effects of conducted electromagnetic interference on an analogue-to- digital converter (ADC) are presented by the measurement. The measurement results reveal that, the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC.</description><subject>Analog to digital conversion</subject><subject>Conversion</subject><subject>Converters</subject><subject>Criteria</subject><subject>Digital</subject><subject>Direct current</subject><subject>Electromagnetic interference</subject><subject>Immunity</subject><issn>0013-5194</issn><issn>1350-911X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNpdj01LAzEYhIMouFb_Q8CLl0A-d5OjlPoBhYL04K1kkzfLlm1Sk6y_3y168jTM8MzAXKGGCUWJYezzGjWUMkEUM_IW3ZVyXCw3pmvQxyYEcLXgFLBL0c-ugscwLVlOJztEqKPDY6yQA2SIDnCK2EY7pWEGUhPx4zBWO13a35AX7h7dBDsVePjTFdq_bPbrN7Ldvb6vn7fk3DJF-g56bwJ1SvLWCmuUD8JqLigI0zneaxloMNbpVhrvleGCaamAOnf5xcQKPf3OnnP6mqHUw2ksDqbJRkhzObBWcs4EFWpBH_-hxzTn5cOFYtpQzrUQP5lrWt4</recordid><startdate>20110106</startdate><enddate>20110106</enddate><creator>Wan, F</creator><creator>Duval, F</creator><creator>Savatier, X</creator><creator>Louis, A</creator><creator>Mazari, B</creator><general>John Wiley & Sons, Inc</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>L6V</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20110106</creationdate><title>Effects of conducted electromagnetic interference on analogue-to-digital converter</title><author>Wan, F ; Duval, F ; Savatier, X ; Louis, A ; Mazari, B</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p615-b7ebd9f0c5426a3a95df3a8230e397c2b84f0f9ac8649dd59231845e0cc135013</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Analog to digital conversion</topic><topic>Conversion</topic><topic>Converters</topic><topic>Criteria</topic><topic>Digital</topic><topic>Direct current</topic><topic>Electromagnetic interference</topic><topic>Immunity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wan, F</creatorcontrib><creatorcontrib>Duval, F</creatorcontrib><creatorcontrib>Savatier, X</creatorcontrib><creatorcontrib>Louis, A</creatorcontrib><creatorcontrib>Mazari, B</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electronics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wan, F</au><au>Duval, F</au><au>Savatier, X</au><au>Louis, A</au><au>Mazari, B</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of conducted electromagnetic interference on analogue-to-digital converter</atitle><jtitle>Electronics letters</jtitle><date>2011-01-06</date><risdate>2011</risdate><volume>47</volume><issue>1</issue><spage>1</spage><epage>1</epage><pages>1-1</pages><issn>0013-5194</issn><eissn>1350-911X</eissn><coden>ELLEAK</coden><abstract>The effects of conducted electromagnetic interference on an analogue-to- digital converter (ADC) are presented by the measurement. The measurement results reveal that, the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC.</abstract><cop>Stevenage</cop><pub>John Wiley & Sons, Inc</pub><tpages>1</tpages></addata></record> |
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subjects | Analog to digital conversion Conversion Converters Criteria Digital Direct current Electromagnetic interference Immunity |
title | Effects of conducted electromagnetic interference on analogue-to-digital converter |
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