Research on the Emission Uniformity of Explosive Emission Cathodes in Foilless Diodes
Some factors that influence the emission uniformity of explosive emission cathodes (EECs) in foilless diodes such as the guiding magnetic field strength and the rise rate of electric field have been researched in former literatures. This paper is concentrated on another factor that has been overlook...
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| Veröffentlicht in: | IEEE transactions on plasma science 2014-09, Vol.42 (9), p.2179-2185 |
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| container_title | IEEE transactions on plasma science |
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| creator | Sun, Jun Wu, Ping Huo, Shaofei Tan, Weibing Shao, Hao Chen, Changhua Liu, Guozhi |
| description | Some factors that influence the emission uniformity of explosive emission cathodes (EECs) in foilless diodes such as the guiding magnetic field strength and the rise rate of electric field have been researched in former literatures. This paper is concentrated on another factor that has been overlooked previously, i.e., the defects with dimensions of tens of micrometers on cathode surfaces, especially at blade edges. It is shown that these defects will significantly worsen the emission uniformity of EECs by introducing extraordinarily large microscopic field enhancement factors, and thus they should be eliminated. The micrometer-scale irregularities, however, should be maintained to provide effective emission micropoints. Meanwhile, the outer edge of an annular cathode blade should be rounded off to improve the emission uniformity. After being disposed like this, the emission uniformity of annular graphite cathodes in a foilless diode is obviously improved, which leads to an increase of energy efficiency by more than 20% by broadening the microwave pulse duration under a power level of 2.8 GW for an X-band relativistic backward wave oscillator. |
| doi_str_mv | 10.1109/TPS.2014.2338301 |
| format | Article |
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This paper is concentrated on another factor that has been overlooked previously, i.e., the defects with dimensions of tens of micrometers on cathode surfaces, especially at blade edges. It is shown that these defects will significantly worsen the emission uniformity of EECs by introducing extraordinarily large microscopic field enhancement factors, and thus they should be eliminated. The micrometer-scale irregularities, however, should be maintained to provide effective emission micropoints. Meanwhile, the outer edge of an annular cathode blade should be rounded off to improve the emission uniformity. After being disposed like this, the emission uniformity of annular graphite cathodes in a foilless diode is obviously improved, which leads to an increase of energy efficiency by more than 20% by broadening the microwave pulse duration under a power level of 2.8 GW for an X-band relativistic backward wave oscillator.</description><identifier>ISSN: 0093-3813</identifier><identifier>EISSN: 1939-9375</identifier><identifier>DOI: 10.1109/TPS.2014.2338301</identifier><identifier>CODEN: ITPSBD</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Annular ; Blades ; Cathode morphology ; Cathodes ; Defects ; Diodes ; EEC ; Electric fields ; Emission ; emission uniformity ; Energy efficiency ; Explosions ; explosive emission cathodes (EECs) ; Explosives ; foilless diodes ; high-power microwave (HPM) ; Microwave theory and techniques ; Microwaves ; Plasmas ; Surface morphology ; Surface treatment ; Variability</subject><ispartof>IEEE transactions on plasma science, 2014-09, Vol.42 (9), p.2179-2185</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Sep 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c441t-d6a4a5d76c111dd2fc6e4182498577107ed3127d9e33e8519507320ac16438313</citedby><cites>FETCH-LOGICAL-c441t-d6a4a5d76c111dd2fc6e4182498577107ed3127d9e33e8519507320ac16438313</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6867328$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6867328$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Sun, Jun</creatorcontrib><creatorcontrib>Wu, Ping</creatorcontrib><creatorcontrib>Huo, Shaofei</creatorcontrib><creatorcontrib>Tan, Weibing</creatorcontrib><creatorcontrib>Shao, Hao</creatorcontrib><creatorcontrib>Chen, Changhua</creatorcontrib><creatorcontrib>Liu, Guozhi</creatorcontrib><title>Research on the Emission Uniformity of Explosive Emission Cathodes in Foilless Diodes</title><title>IEEE transactions on plasma science</title><addtitle>TPS</addtitle><description>Some factors that influence the emission uniformity of explosive emission cathodes (EECs) in foilless diodes such as the guiding magnetic field strength and the rise rate of electric field have been researched in former literatures. This paper is concentrated on another factor that has been overlooked previously, i.e., the defects with dimensions of tens of micrometers on cathode surfaces, especially at blade edges. It is shown that these defects will significantly worsen the emission uniformity of EECs by introducing extraordinarily large microscopic field enhancement factors, and thus they should be eliminated. The micrometer-scale irregularities, however, should be maintained to provide effective emission micropoints. Meanwhile, the outer edge of an annular cathode blade should be rounded off to improve the emission uniformity. After being disposed like this, the emission uniformity of annular graphite cathodes in a foilless diode is obviously improved, which leads to an increase of energy efficiency by more than 20% by broadening the microwave pulse duration under a power level of 2.8 GW for an X-band relativistic backward wave oscillator.</description><subject>Annular</subject><subject>Blades</subject><subject>Cathode morphology</subject><subject>Cathodes</subject><subject>Defects</subject><subject>Diodes</subject><subject>EEC</subject><subject>Electric fields</subject><subject>Emission</subject><subject>emission uniformity</subject><subject>Energy efficiency</subject><subject>Explosions</subject><subject>explosive emission cathodes (EECs)</subject><subject>Explosives</subject><subject>foilless diodes</subject><subject>high-power microwave (HPM)</subject><subject>Microwave theory and techniques</subject><subject>Microwaves</subject><subject>Plasmas</subject><subject>Surface morphology</subject><subject>Surface treatment</subject><subject>Variability</subject><issn>0093-3813</issn><issn>1939-9375</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkEFLAzEQRoMoWKt3wUvAi5etmSSbbI5SWxUKirbnEHZnacp2Uzdbsf_elBYRT8MMb4ZvHiHXwEYAzNzP3z5GnIEccSEKweCEDMAIkxmh81MyYMyITBQgzslFjCuWyJzxAVm8Y0TXlUsaWtovkU7WPkafmkXr69Ctfb-joaaT700Tov_6A4xdvwwVRupbOg2-aTBG-uj3o0tyVrsm4tWxDsliOpmPn7PZ69PL-GGWlVJCn1XKSZdXWpUAUFW8LhVKKLg0Ra41MI2VAK4rg0JgkYPJmRacuRKUTE-CGJK7w91NFz63GHubwpXYNK7FsI0WFE-PJw979PYfugrbrk3pLORKSq6VkYliB6rsQowd1nbT-bXrdhaY3Xu2ybPde7ZHz2nl5rDiEfEXV4VKUQvxA1gzdxI</recordid><startdate>20140901</startdate><enddate>20140901</enddate><creator>Sun, Jun</creator><creator>Wu, Ping</creator><creator>Huo, Shaofei</creator><creator>Tan, Weibing</creator><creator>Shao, Hao</creator><creator>Chen, Changhua</creator><creator>Liu, Guozhi</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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This paper is concentrated on another factor that has been overlooked previously, i.e., the defects with dimensions of tens of micrometers on cathode surfaces, especially at blade edges. It is shown that these defects will significantly worsen the emission uniformity of EECs by introducing extraordinarily large microscopic field enhancement factors, and thus they should be eliminated. The micrometer-scale irregularities, however, should be maintained to provide effective emission micropoints. Meanwhile, the outer edge of an annular cathode blade should be rounded off to improve the emission uniformity. After being disposed like this, the emission uniformity of annular graphite cathodes in a foilless diode is obviously improved, which leads to an increase of energy efficiency by more than 20% by broadening the microwave pulse duration under a power level of 2.8 GW for an X-band relativistic backward wave oscillator.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TPS.2014.2338301</doi><tpages>7</tpages></addata></record> |
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| subjects | Annular Blades Cathode morphology Cathodes Defects Diodes EEC Electric fields Emission emission uniformity Energy efficiency Explosions explosive emission cathodes (EECs) Explosives foilless diodes high-power microwave (HPM) Microwave theory and techniques Microwaves Plasmas Surface morphology Surface treatment Variability |
| title | Research on the Emission Uniformity of Explosive Emission Cathodes in Foilless Diodes |
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