Real-Time Waveform Characterization by Using Frequency-Resolved Optical Gating Capable of Carrier-Envelope Phase Determination

We present real-time waveform characterization of ultrashort pulses by the use of a pulse-front tilt in frequency-resolved optical gating capable of carrier-envelope phase determination. Simultaneous measurement of cross-correlation frequency-resolved optical gating and electro-optic sampling signal...

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Veröffentlicht in:IEEE photonics journal 2014-06, Vol.6 (3), p.1-12
Hauptverfasser: Shirai, Hideto, Nomura, Yutaka, Fuji, Takao
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Nomura, Yutaka
Fuji, Takao
description We present real-time waveform characterization of ultrashort pulses by the use of a pulse-front tilt in frequency-resolved optical gating capable of carrier-envelope phase determination. Simultaneous measurement of cross-correlation frequency-resolved optical gating and electro-optic sampling signals has been realized without scanning any delays. Complete waveform characterization of single-cycle infrared pulses in real time has been demonstrated. The method has been also applied for characterization of more complex pulses, namely, a strongly chirped pulse after passing through a solid crystal or a distorted pulse due to the absorption of ambient air.
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subjects Carriers
Delay
Delays
Distortion
Earth Observing System
four wave mixing
Gating and risering
Imaging
Infrared
Optical distortion
Pulse measurements
Real time
Real-time systems
Sampling
Ultrashort pulse measurements
Ultraviolet sources
Waveforms
title Real-Time Waveform Characterization by Using Frequency-Resolved Optical Gating Capable of Carrier-Envelope Phase Determination
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