Accelerated life time testing and optical degradation of remote phosphor plates
•Degradation of remote phosphor under elevated temperature is studied.•Increasing the exposure time is associated with the increasing the yellowing index (YI).•By increasing temperature depreciation takes place at shorter time.•The decrease of CCT takes place with almost the same kinetics as the lum...
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Veröffentlicht in: | Microelectronics and reliability 2014-08, Vol.54 (8), p.1544-1548 |
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Format: | Artikel |
Sprache: | eng |
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