Accelerated life time testing and optical degradation of remote phosphor plates
•Degradation of remote phosphor under elevated temperature is studied.•Increasing the exposure time is associated with the increasing the yellowing index (YI).•By increasing temperature depreciation takes place at shorter time.•The decrease of CCT takes place with almost the same kinetics as the lum...
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Veröffentlicht in: | Microelectronics and reliability 2014-08, Vol.54 (8), p.1544-1548 |
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creator | Yazdan Mehr, M. van Driel, W.D. Zhang, G.Q. |
description | •Degradation of remote phosphor under elevated temperature is studied.•Increasing the exposure time is associated with the increasing the yellowing index (YI).•By increasing temperature depreciation takes place at shorter time.•The decrease of CCT takes place with almost the same kinetics as the lumen depreciation.
In this investigation the thermal stability and life time of remote phosphor encapsulant plates, made from bisphenol-A polycarbonate (BPA-PC), are studied. Remote phosphor plates, combined with a blue-light LED source, could be used to produce white light with a correlated colour temperature (CCT) of 4000K. Spectral power distribution (SPD) and photometric parameters of thermally-aged phosphor plates were measured by Integrated-Sphere. Results show that thermal ageing leads to a significant decrease in the luminous flux and chromatic properties of plates. The photometric properties of thermally-aged plates, monitored during the stress thermal ageing tests, showed a significant change both in the correlated colour temperature (CCT) and in the chromaticity coordinates (CIE x, y). It is also observed that there is a significant decay both in the phosphor yellow emission and in the blue peak intensity. The decrease in the luminous flux is strongly correlated to the deterioration of the chromatic properties of the phosphor plates. The results also show a significant decay of CCT, postulating that the degradation of the remote phosphor plates affects the efficiency of light and the colour of emitted light as well. The decrease of CCT takes place with almost the same kinetics as the lumen depreciation. |
doi_str_mv | 10.1016/j.microrel.2014.03.014 |
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In this investigation the thermal stability and life time of remote phosphor encapsulant plates, made from bisphenol-A polycarbonate (BPA-PC), are studied. Remote phosphor plates, combined with a blue-light LED source, could be used to produce white light with a correlated colour temperature (CCT) of 4000K. Spectral power distribution (SPD) and photometric parameters of thermally-aged phosphor plates were measured by Integrated-Sphere. Results show that thermal ageing leads to a significant decrease in the luminous flux and chromatic properties of plates. The photometric properties of thermally-aged plates, monitored during the stress thermal ageing tests, showed a significant change both in the correlated colour temperature (CCT) and in the chromaticity coordinates (CIE x, y). It is also observed that there is a significant decay both in the phosphor yellow emission and in the blue peak intensity. The decrease in the luminous flux is strongly correlated to the deterioration of the chromatic properties of the phosphor plates. The results also show a significant decay of CCT, postulating that the degradation of the remote phosphor plates affects the efficiency of light and the colour of emitted light as well. The decrease of CCT takes place with almost the same kinetics as the lumen depreciation.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2014.03.014</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Accelerated testing ; Applied sciences ; Colour ; Colour shifting ; Correlation ; Decay ; Degradation ; Electronics ; Exact sciences and technology ; Fundamental areas of phenomenology (including applications) ; Optical sources and standards ; Optics ; Optoelectronic devices ; Phosphors ; Photometry ; Physics ; Plates ; Remote phosphor ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Thermal degradation ; White light</subject><ispartof>Microelectronics and reliability, 2014-08, Vol.54 (8), p.1544-1548</ispartof><rights>2014 Elsevier Ltd</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c445t-40a74e72f3f153939ff56faee7cd5d0b41175cbf7b49b3fcdafbe0da3ce9eb953</citedby><cites>FETCH-LOGICAL-c445t-40a74e72f3f153939ff56faee7cd5d0b41175cbf7b49b3fcdafbe0da3ce9eb953</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.microrel.2014.03.014$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28725465$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Yazdan Mehr, M.</creatorcontrib><creatorcontrib>van Driel, W.D.</creatorcontrib><creatorcontrib>Zhang, G.Q.</creatorcontrib><title>Accelerated life time testing and optical degradation of remote phosphor plates</title><title>Microelectronics and reliability</title><description>•Degradation of remote phosphor under elevated temperature is studied.•Increasing the exposure time is associated with the increasing the yellowing index (YI).•By increasing temperature depreciation takes place at shorter time.•The decrease of CCT takes place with almost the same kinetics as the lumen depreciation.
In this investigation the thermal stability and life time of remote phosphor encapsulant plates, made from bisphenol-A polycarbonate (BPA-PC), are studied. Remote phosphor plates, combined with a blue-light LED source, could be used to produce white light with a correlated colour temperature (CCT) of 4000K. Spectral power distribution (SPD) and photometric parameters of thermally-aged phosphor plates were measured by Integrated-Sphere. Results show that thermal ageing leads to a significant decrease in the luminous flux and chromatic properties of plates. The photometric properties of thermally-aged plates, monitored during the stress thermal ageing tests, showed a significant change both in the correlated colour temperature (CCT) and in the chromaticity coordinates (CIE x, y). It is also observed that there is a significant decay both in the phosphor yellow emission and in the blue peak intensity. The decrease in the luminous flux is strongly correlated to the deterioration of the chromatic properties of the phosphor plates. The results also show a significant decay of CCT, postulating that the degradation of the remote phosphor plates affects the efficiency of light and the colour of emitted light as well. The decrease of CCT takes place with almost the same kinetics as the lumen depreciation.</description><subject>Accelerated testing</subject><subject>Applied sciences</subject><subject>Colour</subject><subject>Colour shifting</subject><subject>Correlation</subject><subject>Decay</subject><subject>Degradation</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Optical sources and standards</subject><subject>Optics</subject><subject>Optoelectronic devices</subject><subject>Phosphors</subject><subject>Photometry</subject><subject>Physics</subject><subject>Plates</subject><subject>Remote phosphor</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Thermal degradation</subject><subject>White light</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqFkE9LxDAQxYMouK5-BclF8NKaNGljb8riP1jYi4K3kCaTNUvb1CQr-O3NsqtXDzPv8mbmzQ-hS0pKSmhzsykHp4MP0JcVobwkrMxyhGb0VlRFy-n7MZoRUjVFJSg_RWcxbgghglA6Q6t7raGHoBIY3DsLOLkhN4jJjWusRoP9lJxWPTawDsqo5PyIvcUBBp8ATx8-5gp46vOOeI5OrOojXBx0jt4eH14Xz8Vy9fSyuF8WmvM6FZwowUFUlllas5a11taNVQBCm9qQjlMqat1Z0fG2Y1YbZTsgRjENLXRtzeboer93Cv5zm9PKwcX8Sa9G8Nsoad0Iym4rwbO12VszpBgDWDkFN6jwLSmRO4JyI38Jyh1BSZjMkgevDjdUzABsUKN28W-6ynhr3uyy3O19kB_-chBk1A5GDcYF0Eka7_479QPty4x6</recordid><startdate>20140801</startdate><enddate>20140801</enddate><creator>Yazdan Mehr, M.</creator><creator>van Driel, W.D.</creator><creator>Zhang, G.Q.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>FR3</scope><scope>KR7</scope><scope>L7M</scope></search><sort><creationdate>20140801</creationdate><title>Accelerated life time testing and optical degradation of remote phosphor plates</title><author>Yazdan Mehr, M. ; van Driel, W.D. ; Zhang, G.Q.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c445t-40a74e72f3f153939ff56faee7cd5d0b41175cbf7b49b3fcdafbe0da3ce9eb953</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Accelerated testing</topic><topic>Applied sciences</topic><topic>Colour</topic><topic>Colour shifting</topic><topic>Correlation</topic><topic>Decay</topic><topic>Degradation</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Optical sources and standards</topic><topic>Optics</topic><topic>Optoelectronic devices</topic><topic>Phosphors</topic><topic>Photometry</topic><topic>Physics</topic><topic>Plates</topic><topic>Remote phosphor</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Thermal degradation</topic><topic>White light</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yazdan Mehr, M.</creatorcontrib><creatorcontrib>van Driel, W.D.</creatorcontrib><creatorcontrib>Zhang, G.Q.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yazdan Mehr, M.</au><au>van Driel, W.D.</au><au>Zhang, G.Q.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Accelerated life time testing and optical degradation of remote phosphor plates</atitle><jtitle>Microelectronics and reliability</jtitle><date>2014-08-01</date><risdate>2014</risdate><volume>54</volume><issue>8</issue><spage>1544</spage><epage>1548</epage><pages>1544-1548</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><coden>MCRLAS</coden><abstract>•Degradation of remote phosphor under elevated temperature is studied.•Increasing the exposure time is associated with the increasing the yellowing index (YI).•By increasing temperature depreciation takes place at shorter time.•The decrease of CCT takes place with almost the same kinetics as the lumen depreciation.
In this investigation the thermal stability and life time of remote phosphor encapsulant plates, made from bisphenol-A polycarbonate (BPA-PC), are studied. Remote phosphor plates, combined with a blue-light LED source, could be used to produce white light with a correlated colour temperature (CCT) of 4000K. Spectral power distribution (SPD) and photometric parameters of thermally-aged phosphor plates were measured by Integrated-Sphere. Results show that thermal ageing leads to a significant decrease in the luminous flux and chromatic properties of plates. The photometric properties of thermally-aged plates, monitored during the stress thermal ageing tests, showed a significant change both in the correlated colour temperature (CCT) and in the chromaticity coordinates (CIE x, y). It is also observed that there is a significant decay both in the phosphor yellow emission and in the blue peak intensity. The decrease in the luminous flux is strongly correlated to the deterioration of the chromatic properties of the phosphor plates. The results also show a significant decay of CCT, postulating that the degradation of the remote phosphor plates affects the efficiency of light and the colour of emitted light as well. The decrease of CCT takes place with almost the same kinetics as the lumen depreciation.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2014.03.014</doi><tpages>5</tpages></addata></record> |
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subjects | Accelerated testing Applied sciences Colour Colour shifting Correlation Decay Degradation Electronics Exact sciences and technology Fundamental areas of phenomenology (including applications) Optical sources and standards Optics Optoelectronic devices Phosphors Photometry Physics Plates Remote phosphor Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Thermal degradation White light |
title | Accelerated life time testing and optical degradation of remote phosphor plates |
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