Optical dispersion and dielectric properties of rubrene organic semiconductor thin film

Rubrene thin film has been fabricated on a glass substrate by spin-coating at 300 K. The optical dispersion and dielectric properties of the film have been determined from the analysis of transmittance and reflectance measurements at normal incident of light between 200 and 700 nm. The optical trans...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2014-08, Vol.25 (8), p.3586-3593
Hauptverfasser:	Barış, Behzad, Özdemir, Hatice Gürel, Tuğluoğlu, Nihat, Karadeniz, Serdar, Yüksel, Ömer Faruk, Kişnişci, Zeynep
Format:	Artikel
Sprache:	eng
Schlagworte:	Carrier density Characterization and Evaluation of Materials Chemistry and Materials Science Dielectric constant Dielectric properties Dispersions Materials Science Mathematical models Optical and Electronic Materials Optical properties Oscillators Thin films
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