Built in Self-Test for 4 × 4 Signed and Unsigned Multipliers in FPGA

Built in self-test (BIST) is a technique or a method which allow the circuit to test itself. BIST increases the controllability and observability of integrated circuit therefore it is easier to apply inputs and then detect faults from it [11]. BIST also decreases the time of testing integrated circu...

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Veröffentlicht in:	International journal of computer applications 2014-01, Vol.95 (16), p.30-35
Hauptverfasser:	Vaishnav, Shrikant, Gaur, Puran, Soni, Braj Bihari
Format:	Artikel
Sprache:	eng
Schlagworte:	Arrays Booths Circuits Controllability Faults Field programmable gate arrays Integrated circuits Multipliers
Online-Zugang:	Volltext
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