Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 nm CMOS Technology

In this paper, a novel low-power and highly reliable radiation hardened memory cell (RHM-12T) using 12 transistors is proposed to provide enough immunity against single event upset in TSMC 65 nm CMOS technology. The obtained results show that the proposed cell can not only tolerate upset at its any...

Ausführliche Beschreibung