Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept

The surge-current ruggedness of free-wheeling diodes can be improved by implementing the self-adjusting p emitter efficiency diode concept (SPEED). Simulations indicate that the switching ruggedness is reduced because of the occurrence of cathode-side filaments during reverse-recovery. Experiments c...

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Veröffentlicht in:	IET circuits, devices & systems devices & systems, 2014-05, Vol.8 (3), p.205-212
Hauptverfasser:	Basler, Thomas, Pfaffenlehner, Manfred, Felsl, Hans Peter, Niedernostheide, Franz-Josef, Pfirsch, Frank, Schulze, Hans-Joachim, Baburske, Roman, Lutz, Josef
Format:	Artikel
Sprache:	eng
Schlagworte:	anode side filament pinning Anodes backside holes cathode side filaments Cathodes controlled injection diode surge current capability diode switching ruggedness Diodes Efficiency Electrons Emittance Emitters Field strength Filaments free wheeling diodes high electrical field strength p+p-junction power semiconductor switches reverse recovery Ruggedness self-adjusting p emitter efficiency diode concept semiconductor device models semiconductor device reliability semiconductor diodes Simulation Special Issue: Power Semiconductor Devices and Integrated Circuits SPEED Switching
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