Electric-induced oxide breakdown of a charge-coupled device under femtosecond laser irradiation

A femtosecond laser provides an ideal source to investigate the laser-induced damage of a charge-coupled device (CCD) owing to its thermal-free and localized damage properties. For conventional damage mechanisms in the nanosecond laser regime, a leakage current and degradation of a point spread func...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Applied optics (2004) 2013-11, Vol.52 (31), p.7524-7529
Hauptverfasser:	Gao, Liuzheng, Zhu, Zhiwu, Shao, Zhengzheng, Cheng, Xiang'ai, Chang, Shengli
Format:	Artikel
Sprache:	eng
Schlagworte:	Breakdown Charge coupled devices Damage Electrodes Femtosecond Lasers Leakage current Oxides
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!