Microwave monitoring of silver nanoparticle sintering for surface-enhanced Raman scattering substrates
One of the most widely used methods for surface‐enhanced Raman scattering (SERS) employs silver or gold nanoparticles either in colloidal suspension or in the dry‐drop form. In such substrates the SERS amplification factors depend critically on the interparticle distances. Here, we report that micro...
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Veröffentlicht in: | Journal of Raman spectroscopy 2012-04, Vol.43 (4), p.588-591 |
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description | One of the most widely used methods for surface‐enhanced Raman scattering (SERS) employs silver or gold nanoparticles either in colloidal suspension or in the dry‐drop form. In such substrates the SERS amplification factors depend critically on the interparticle distances. Here, we report that microwave absorption as a function of temperature in dry‐drop substrates can be used as a probe to demarcate temperature regions for thermal annealing to produce SERS substrates with very high amplification factors. Copyright © 2011 John Wiley & Sons, Ltd.
The signal amplification observed in surface‐enhanced Raman scattering is highly influenced by the interparticle separation in metallic colloidal‐based substrates. Microwave absorption is shown to be a sensitive probe to monitor silver nanoparticle sintering as a function of temperature. Because the microwave losses occur predominantly at the weak electrical links between nanoparticles, microwave absorption monitoring can serve as a guide in determining thermal annealing treatments to optimize surface‐enhanced Raman scattering substrate performance. |
doi_str_mv | 10.1002/jrs.3073 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1541448192</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1541448192</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4303-2834e765a67bd95bb604c56861fe72f6022cfd941a9db90f768dab36880ae2bd3</originalsourceid><addsrcrecordid>eNp10N9rFDEQwPEgCp5V6J-w4IsvWyebX7uPUrRVexauSh_DbHaiOfeSM9lt7X_v1hZFoU8Dw4dh-DJ2yOGIAzSvt7kcCTDiEVtx6EwtlVKP2QqEMTXIVj9lz0rZAkDXab5ifh1cTtd4RdUuxTClHOLXKvmqhPGKchUxpj3mKbiRll2c6DfwKVdlzh4d1RS_YXQ0VBvcYayKw-lelbkvU8aJynP2xONY6MX9PGBf3r39fHxan52fvD9-c1Y7KUDUTSskGa1Qm37oVN9rkE7pVnNPpvEamsb5oZMcu6HvwBvdDtgL3baA1PSDOGCv7u7uc_oxU5nsLhRH44iR0lwsV5JL2fKuWejL_-g2zTku3y2KGwnQCvX34FKplEze7nPYYb6xHOxtcLsEt7fBF1rf0esw0s2Dzn7YXPzrQ5no5x-P-bvVRhhlLz-d2I8bKdZraeyF-AXbTZIK</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1517400835</pqid></control><display><type>article</type><title>Microwave monitoring of silver nanoparticle sintering for surface-enhanced Raman scattering substrates</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Figueroa, Manuel ; Pourrezaei, Kambiz ; Tyagi, Somdev</creator><creatorcontrib>Figueroa, Manuel ; Pourrezaei, Kambiz ; Tyagi, Somdev</creatorcontrib><description>One of the most widely used methods for surface‐enhanced Raman scattering (SERS) employs silver or gold nanoparticles either in colloidal suspension or in the dry‐drop form. In such substrates the SERS amplification factors depend critically on the interparticle distances. Here, we report that microwave absorption as a function of temperature in dry‐drop substrates can be used as a probe to demarcate temperature regions for thermal annealing to produce SERS substrates with very high amplification factors. Copyright © 2011 John Wiley & Sons, Ltd.
The signal amplification observed in surface‐enhanced Raman scattering is highly influenced by the interparticle separation in metallic colloidal‐based substrates. Microwave absorption is shown to be a sensitive probe to monitor silver nanoparticle sintering as a function of temperature. Because the microwave losses occur predominantly at the weak electrical links between nanoparticles, microwave absorption monitoring can serve as a guide in determining thermal annealing treatments to optimize surface‐enhanced Raman scattering substrate performance.</description><identifier>ISSN: 0377-0486</identifier><identifier>EISSN: 1097-4555</identifier><identifier>DOI: 10.1002/jrs.3073</identifier><identifier>CODEN: JRSPAF</identifier><language>eng</language><publisher>Chichester, UK: John Wiley & Sons, Ltd</publisher><subject>Amplification ; Annealing ; Microwave absorption ; Microwaves ; Monitoring ; nanoparticle ink ; Nanoparticles ; Raman scattering ; SERS ; Silver ; surface plasmons ; thermal annealing</subject><ispartof>Journal of Raman spectroscopy, 2012-04, Vol.43 (4), p.588-591</ispartof><rights>Copyright © 2011 John Wiley & Sons, Ltd.</rights><rights>Copyright © 2012 John Wiley & Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4303-2834e765a67bd95bb604c56861fe72f6022cfd941a9db90f768dab36880ae2bd3</citedby><cites>FETCH-LOGICAL-c4303-2834e765a67bd95bb604c56861fe72f6022cfd941a9db90f768dab36880ae2bd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fjrs.3073$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fjrs.3073$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,27923,27924,45573,45574</link.rule.ids></links><search><creatorcontrib>Figueroa, Manuel</creatorcontrib><creatorcontrib>Pourrezaei, Kambiz</creatorcontrib><creatorcontrib>Tyagi, Somdev</creatorcontrib><title>Microwave monitoring of silver nanoparticle sintering for surface-enhanced Raman scattering substrates</title><title>Journal of Raman spectroscopy</title><addtitle>J. Raman Spectrosc</addtitle><description>One of the most widely used methods for surface‐enhanced Raman scattering (SERS) employs silver or gold nanoparticles either in colloidal suspension or in the dry‐drop form. In such substrates the SERS amplification factors depend critically on the interparticle distances. Here, we report that microwave absorption as a function of temperature in dry‐drop substrates can be used as a probe to demarcate temperature regions for thermal annealing to produce SERS substrates with very high amplification factors. Copyright © 2011 John Wiley & Sons, Ltd.
The signal amplification observed in surface‐enhanced Raman scattering is highly influenced by the interparticle separation in metallic colloidal‐based substrates. Microwave absorption is shown to be a sensitive probe to monitor silver nanoparticle sintering as a function of temperature. Because the microwave losses occur predominantly at the weak electrical links between nanoparticles, microwave absorption monitoring can serve as a guide in determining thermal annealing treatments to optimize surface‐enhanced Raman scattering substrate performance.</description><subject>Amplification</subject><subject>Annealing</subject><subject>Microwave absorption</subject><subject>Microwaves</subject><subject>Monitoring</subject><subject>nanoparticle ink</subject><subject>Nanoparticles</subject><subject>Raman scattering</subject><subject>SERS</subject><subject>Silver</subject><subject>surface plasmons</subject><subject>thermal annealing</subject><issn>0377-0486</issn><issn>1097-4555</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp10N9rFDEQwPEgCp5V6J-w4IsvWyebX7uPUrRVexauSh_DbHaiOfeSM9lt7X_v1hZFoU8Dw4dh-DJ2yOGIAzSvt7kcCTDiEVtx6EwtlVKP2QqEMTXIVj9lz0rZAkDXab5ifh1cTtd4RdUuxTClHOLXKvmqhPGKchUxpj3mKbiRll2c6DfwKVdlzh4d1RS_YXQ0VBvcYayKw-lelbkvU8aJynP2xONY6MX9PGBf3r39fHxan52fvD9-c1Y7KUDUTSskGa1Qm37oVN9rkE7pVnNPpvEamsb5oZMcu6HvwBvdDtgL3baA1PSDOGCv7u7uc_oxU5nsLhRH44iR0lwsV5JL2fKuWejL_-g2zTku3y2KGwnQCvX34FKplEze7nPYYb6xHOxtcLsEt7fBF1rf0esw0s2Dzn7YXPzrQ5no5x-P-bvVRhhlLz-d2I8bKdZraeyF-AXbTZIK</recordid><startdate>201204</startdate><enddate>201204</enddate><creator>Figueroa, Manuel</creator><creator>Pourrezaei, Kambiz</creator><creator>Tyagi, Somdev</creator><general>John Wiley & Sons, Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>P64</scope><scope>RC3</scope></search><sort><creationdate>201204</creationdate><title>Microwave monitoring of silver nanoparticle sintering for surface-enhanced Raman scattering substrates</title><author>Figueroa, Manuel ; Pourrezaei, Kambiz ; Tyagi, Somdev</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4303-2834e765a67bd95bb604c56861fe72f6022cfd941a9db90f768dab36880ae2bd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Amplification</topic><topic>Annealing</topic><topic>Microwave absorption</topic><topic>Microwaves</topic><topic>Monitoring</topic><topic>nanoparticle ink</topic><topic>Nanoparticles</topic><topic>Raman scattering</topic><topic>SERS</topic><topic>Silver</topic><topic>surface plasmons</topic><topic>thermal annealing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Figueroa, Manuel</creatorcontrib><creatorcontrib>Pourrezaei, Kambiz</creatorcontrib><creatorcontrib>Tyagi, Somdev</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>Genetics Abstracts</collection><jtitle>Journal of Raman spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Figueroa, Manuel</au><au>Pourrezaei, Kambiz</au><au>Tyagi, Somdev</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microwave monitoring of silver nanoparticle sintering for surface-enhanced Raman scattering substrates</atitle><jtitle>Journal of Raman spectroscopy</jtitle><addtitle>J. Raman Spectrosc</addtitle><date>2012-04</date><risdate>2012</risdate><volume>43</volume><issue>4</issue><spage>588</spage><epage>591</epage><pages>588-591</pages><issn>0377-0486</issn><eissn>1097-4555</eissn><coden>JRSPAF</coden><abstract>One of the most widely used methods for surface‐enhanced Raman scattering (SERS) employs silver or gold nanoparticles either in colloidal suspension or in the dry‐drop form. In such substrates the SERS amplification factors depend critically on the interparticle distances. Here, we report that microwave absorption as a function of temperature in dry‐drop substrates can be used as a probe to demarcate temperature regions for thermal annealing to produce SERS substrates with very high amplification factors. Copyright © 2011 John Wiley & Sons, Ltd.
The signal amplification observed in surface‐enhanced Raman scattering is highly influenced by the interparticle separation in metallic colloidal‐based substrates. Microwave absorption is shown to be a sensitive probe to monitor silver nanoparticle sintering as a function of temperature. Because the microwave losses occur predominantly at the weak electrical links between nanoparticles, microwave absorption monitoring can serve as a guide in determining thermal annealing treatments to optimize surface‐enhanced Raman scattering substrate performance.</abstract><cop>Chichester, UK</cop><pub>John Wiley & Sons, Ltd</pub><doi>10.1002/jrs.3073</doi><tpages>4</tpages></addata></record> |
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subjects | Amplification Annealing Microwave absorption Microwaves Monitoring nanoparticle ink Nanoparticles Raman scattering SERS Silver surface plasmons thermal annealing |
title | Microwave monitoring of silver nanoparticle sintering for surface-enhanced Raman scattering substrates |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T23%3A51%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Microwave%20monitoring%20of%20silver%20nanoparticle%20sintering%20for%20surface-enhanced%20Raman%20scattering%20substrates&rft.jtitle=Journal%20of%20Raman%20spectroscopy&rft.au=Figueroa,%20Manuel&rft.date=2012-04&rft.volume=43&rft.issue=4&rft.spage=588&rft.epage=591&rft.pages=588-591&rft.issn=0377-0486&rft.eissn=1097-4555&rft.coden=JRSPAF&rft_id=info:doi/10.1002/jrs.3073&rft_dat=%3Cproquest_cross%3E1541448192%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1517400835&rft_id=info:pmid/&rfr_iscdi=true |