The variation of the features of SnO sub(2) and SnO sub(2):F thin films as a function of V dopant
V doped SnO sub(2) and SnO sub(2):F thin films were successfully deposited on glass substrates at 500 degree C with spray pyrolysis. It was observed that all films had SnO sub(2) tetragonal rutile structure and the preferential orientation depended on spray solution chemistry (doping element and sol...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2014-06, Vol.25 (6), p.2808-2828 |
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creator | Turgut, Gueven Sonmez, Erdal Yilmaz, Mehmet Cogenli, MSelim Yilmaz, Muecahit Turgut, Uemit Dilber, Refik |
description | V doped SnO sub(2) and SnO sub(2):F thin films were successfully deposited on glass substrates at 500 degree C with spray pyrolysis. It was observed that all films had SnO sub(2) tetragonal rutile structure and the preferential orientation depended on spray solution chemistry (doping element and solvent type) by X-ray diffraction measurements. The lowest sheet resistance and the highest optical band gap, figure of merit, infrared (IR) reflectivity values of V doped SnO sub(2) for ethanol and propane-2-ol solvents and V doped SnO sub(2):F films were found to be 88.62 Naira-3.947 eV-1.02 1 0 super(-4) Naira super(-1)-65.49 %, 65.35 Naira-3.955 eV-8.54 1 0 super(-4) Naira super(-1)-72.58 %, 5.15 Naira-4.076 eV-6.15 1 0 super(-2) Naira super(-1)-97.32 %, respectively, with the electrical and optical measurements. Morphological properties of the films were investigated by atomic force microscope and scanning electron microscope measurements. From these analysis, the films consisted of nanoparticles and the film morphology depended on doping ratio/type and solvent type. It was observed pyramidal, polyhedron, needle-shaped and spherical grains on the films' surfaces. The films obtained in present study with these properties can be used as front contact for solar cells and it can be also one of appealing materials for other optoelectronic and IR coating applications. |
doi_str_mv | 10.1007/s10854-014-1946-7 |
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It was observed that all films had SnO sub(2) tetragonal rutile structure and the preferential orientation depended on spray solution chemistry (doping element and solvent type) by X-ray diffraction measurements. The lowest sheet resistance and the highest optical band gap, figure of merit, infrared (IR) reflectivity values of V doped SnO sub(2) for ethanol and propane-2-ol solvents and V doped SnO sub(2):F films were found to be 88.62 Naira-3.947 eV-1.02 1 0 super(-4) Naira super(-1)-65.49 %, 65.35 Naira-3.955 eV-8.54 1 0 super(-4) Naira super(-1)-72.58 %, 5.15 Naira-4.076 eV-6.15 1 0 super(-2) Naira super(-1)-97.32 %, respectively, with the electrical and optical measurements. Morphological properties of the films were investigated by atomic force microscope and scanning electron microscope measurements. From these analysis, the films consisted of nanoparticles and the film morphology depended on doping ratio/type and solvent type. It was observed pyramidal, polyhedron, needle-shaped and spherical grains on the films' surfaces. The films obtained in present study with these properties can be used as front contact for solar cells and it can be also one of appealing materials for other optoelectronic and IR coating applications.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-014-1946-7</identifier><language>eng</language><subject>Doping ; Ethyl alcohol ; Infrared radiation ; Scanning electron microscopy ; Solvents ; Thin films ; Tin dioxide ; Tin oxides</subject><ispartof>Journal of materials science. 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Materials in electronics</title><description>V doped SnO sub(2) and SnO sub(2):F thin films were successfully deposited on glass substrates at 500 degree C with spray pyrolysis. It was observed that all films had SnO sub(2) tetragonal rutile structure and the preferential orientation depended on spray solution chemistry (doping element and solvent type) by X-ray diffraction measurements. The lowest sheet resistance and the highest optical band gap, figure of merit, infrared (IR) reflectivity values of V doped SnO sub(2) for ethanol and propane-2-ol solvents and V doped SnO sub(2):F films were found to be 88.62 Naira-3.947 eV-1.02 1 0 super(-4) Naira super(-1)-65.49 %, 65.35 Naira-3.955 eV-8.54 1 0 super(-4) Naira super(-1)-72.58 %, 5.15 Naira-4.076 eV-6.15 1 0 super(-2) Naira super(-1)-97.32 %, respectively, with the electrical and optical measurements. Morphological properties of the films were investigated by atomic force microscope and scanning electron microscope measurements. From these analysis, the films consisted of nanoparticles and the film morphology depended on doping ratio/type and solvent type. It was observed pyramidal, polyhedron, needle-shaped and spherical grains on the films' surfaces. The films obtained in present study with these properties can be used as front contact for solar cells and it can be also one of appealing materials for other optoelectronic and IR coating applications.</description><subject>Doping</subject><subject>Ethyl alcohol</subject><subject>Infrared radiation</subject><subject>Scanning electron microscopy</subject><subject>Solvents</subject><subject>Thin films</subject><subject>Tin dioxide</subject><subject>Tin oxides</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqVjE1LAzEURYMoOGp_gLu3rIvYl0wyH27F0p2LFnFXnm1CI9Okzkv8_Y6g4Fa4cDmXwxXiVuG9QmwXrLCzRqIyUvWmke2ZqJRta2k6_XouKuxtK43V-lJcMb8jYmPqrhK0OTj4pDFQDilC8pCnwTvKZXT8zev4DFze5voOKO7_4MNyckMEH4YjA00BX-Lu9-cF9ulEMd-IC08Du9lPX4v58mnzuJKnMX0Ux3l7DLxzw0DRpcJbZY0yteobXf9D_QLiL0zr</recordid><startdate>20140601</startdate><enddate>20140601</enddate><creator>Turgut, Gueven</creator><creator>Sonmez, Erdal</creator><creator>Yilmaz, Mehmet</creator><creator>Cogenli, MSelim</creator><creator>Yilmaz, Muecahit</creator><creator>Turgut, Uemit</creator><creator>Dilber, Refik</creator><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20140601</creationdate><title>The variation of the features of SnO sub(2) and SnO sub(2):F thin films as a function of V dopant</title><author>Turgut, Gueven ; Sonmez, Erdal ; Yilmaz, Mehmet ; Cogenli, MSelim ; Yilmaz, Muecahit ; Turgut, Uemit ; Dilber, Refik</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_15414319623</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Doping</topic><topic>Ethyl alcohol</topic><topic>Infrared radiation</topic><topic>Scanning electron microscopy</topic><topic>Solvents</topic><topic>Thin films</topic><topic>Tin dioxide</topic><topic>Tin oxides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Turgut, Gueven</creatorcontrib><creatorcontrib>Sonmez, Erdal</creatorcontrib><creatorcontrib>Yilmaz, Mehmet</creatorcontrib><creatorcontrib>Cogenli, MSelim</creatorcontrib><creatorcontrib>Yilmaz, Muecahit</creatorcontrib><creatorcontrib>Turgut, Uemit</creatorcontrib><creatorcontrib>Dilber, Refik</creatorcontrib><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Turgut, Gueven</au><au>Sonmez, Erdal</au><au>Yilmaz, Mehmet</au><au>Cogenli, MSelim</au><au>Yilmaz, Muecahit</au><au>Turgut, Uemit</au><au>Dilber, Refik</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The variation of the features of SnO sub(2) and SnO sub(2):F thin films as a function of V dopant</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><date>2014-06-01</date><risdate>2014</risdate><volume>25</volume><issue>6</issue><spage>2808</spage><epage>2828</epage><pages>2808-2828</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>V doped SnO sub(2) and SnO sub(2):F thin films were successfully deposited on glass substrates at 500 degree C with spray pyrolysis. It was observed that all films had SnO sub(2) tetragonal rutile structure and the preferential orientation depended on spray solution chemistry (doping element and solvent type) by X-ray diffraction measurements. The lowest sheet resistance and the highest optical band gap, figure of merit, infrared (IR) reflectivity values of V doped SnO sub(2) for ethanol and propane-2-ol solvents and V doped SnO sub(2):F films were found to be 88.62 Naira-3.947 eV-1.02 1 0 super(-4) Naira super(-1)-65.49 %, 65.35 Naira-3.955 eV-8.54 1 0 super(-4) Naira super(-1)-72.58 %, 5.15 Naira-4.076 eV-6.15 1 0 super(-2) Naira super(-1)-97.32 %, respectively, with the electrical and optical measurements. Morphological properties of the films were investigated by atomic force microscope and scanning electron microscope measurements. From these analysis, the films consisted of nanoparticles and the film morphology depended on doping ratio/type and solvent type. It was observed pyramidal, polyhedron, needle-shaped and spherical grains on the films' surfaces. The films obtained in present study with these properties can be used as front contact for solar cells and it can be also one of appealing materials for other optoelectronic and IR coating applications.</abstract><doi>10.1007/s10854-014-1946-7</doi></addata></record> |
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source | SpringerNature Journals |
subjects | Doping Ethyl alcohol Infrared radiation Scanning electron microscopy Solvents Thin films Tin dioxide Tin oxides |
title | The variation of the features of SnO sub(2) and SnO sub(2):F thin films as a function of V dopant |
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